NL6608140A - - Google Patents

Info

Publication number
NL6608140A
NL6608140A NL6608140A NL6608140A NL6608140A NL 6608140 A NL6608140 A NL 6608140A NL 6608140 A NL6608140 A NL 6608140A NL 6608140 A NL6608140 A NL 6608140A NL 6608140 A NL6608140 A NL 6608140A
Authority
NL
Netherlands
Application number
NL6608140A
Other versions
NL151513B (nl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL6608140A publication Critical patent/NL6608140A/xx
Publication of NL151513B publication Critical patent/NL151513B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316Testing of analog circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07CTIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/005Registering or indicating the condition or the working of machines or other apparatus, other than vehicles during manufacturing process
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00Classifying, separating, and assorting solids
    • Y10S209/905Feeder conveyor holding item by suction

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
NL666608140A 1965-06-29 1966-06-13 Inrichting voor het testen van elektrische onderdelen. NL151513B (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US468395A US3392830A (en) 1965-06-29 1965-06-29 Electrical component tester with test multiplexing

Publications (2)

Publication Number Publication Date
NL6608140A true NL6608140A (US06559137-20030506-C00047.png) 1967-01-02
NL151513B NL151513B (nl) 1976-11-15

Family

ID=23859635

Family Applications (1)

Application Number Title Priority Date Filing Date
NL666608140A NL151513B (nl) 1965-06-29 1966-06-13 Inrichting voor het testen van elektrische onderdelen.

Country Status (8)

Country Link
US (1) US3392830A (US06559137-20030506-C00047.png)
JP (2) JPS447097B1 (US06559137-20030506-C00047.png)
CH (1) CH441503A (US06559137-20030506-C00047.png)
DE (1) DE1516941B2 (US06559137-20030506-C00047.png)
FR (1) FR1483576A (US06559137-20030506-C00047.png)
GB (1) GB1125229A (US06559137-20030506-C00047.png)
NL (1) NL151513B (US06559137-20030506-C00047.png)
SE (1) SE338103B (US06559137-20030506-C00047.png)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3576494A (en) * 1967-07-13 1971-04-27 Rca Corp Digital computer controlled test system
US3716134A (en) * 1971-03-08 1973-02-13 San Fernando Electic Mfg Co Apparatus for automatically testing and sorting electrical elements
US3759383A (en) * 1971-08-02 1973-09-18 K Inoue Apparatus for making abrasive articles
JPS5444691U (US06559137-20030506-C00047.png) * 1977-09-02 1979-03-27
ATE504844T1 (de) * 2005-12-21 2011-04-15 Rasco Gmbh Vorrichtung und verfahren zum positionieren von elektronischen mikrochips zum elektrischen testen
CN111777870B (zh) 2015-06-04 2022-06-07 太阳化学公司 氯化铜酞菁颜料
CN116899918B (zh) * 2023-07-19 2024-05-03 明光市永鸿木制品厂 一种元器连接件自检装置及自动插针机

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2567741A (en) * 1948-08-20 1951-09-11 Western Electric Co Article testing and sorting apparatus
US2885076A (en) * 1955-08-30 1959-05-05 Western Electric Co Handling apparatus for electrical articles
US2962655A (en) * 1955-11-04 1960-11-29 Sylvania Electric Prod Quality control apparatus
US2999587A (en) * 1957-08-12 1961-09-12 Pacific Semiconductors Inc Automatic diode sorter
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units
US3094212A (en) * 1961-12-14 1963-06-18 Gen Precision Inc Automatic component tester
US3209908A (en) * 1963-03-21 1965-10-05 Western Electric Co High speed apparatus for measuring and sorting electrical components

Also Published As

Publication number Publication date
NL151513B (nl) 1976-11-15
SE338103B (US06559137-20030506-C00047.png) 1971-08-30
JPS447097B1 (US06559137-20030506-C00047.png) 1969-03-28
FR1483576A (fr) 1967-06-02
CH441503A (de) 1967-07-31
US3392830A (en) 1968-07-16
DE1516941B2 (de) 1973-10-31
DE1516941A1 (de) 1969-06-26
JPS5124872B1 (US06559137-20030506-C00047.png) 1976-07-27
GB1125229A (US06559137-20030506-C00047.png) 1968-08-28

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Legal Events

Date Code Title Description
VJC Lapsed due to non-payment of the due maintenance fee for the patent or patent application
NL80 Information provided on patent owner name for an already discontinued patent

Owner name: I B M