NL6604270A - - Google Patents

Info

Publication number
NL6604270A
NL6604270A NL6604270A NL6604270A NL6604270A NL 6604270 A NL6604270 A NL 6604270A NL 6604270 A NL6604270 A NL 6604270A NL 6604270 A NL6604270 A NL 6604270A NL 6604270 A NL6604270 A NL 6604270A
Authority
NL
Netherlands
Application number
NL6604270A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL6604270A publication Critical patent/NL6604270A/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02164Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02205Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
    • H01L21/02208Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
    • H01L21/02211Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02263Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
    • H01L21/02271Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76297Dielectric isolation using EPIC techniques, i.e. epitaxial passivated integrated circuit
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/291Oxides or nitrides or carbides, e.g. ceramics, glass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/085Isolated-integrated
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/928Front and rear surface processing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/977Thinning or removal of substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Ceramic Engineering (AREA)
  • Element Separation (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
NL6604270A 1965-03-31 1966-03-31 NL6604270A (forum.php)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US44420865A 1965-03-31 1965-03-31

Publications (1)

Publication Number Publication Date
NL6604270A true NL6604270A (forum.php) 1966-10-03

Family

ID=23763944

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6604270A NL6604270A (forum.php) 1965-03-31 1966-03-31

Country Status (3)

Country Link
US (1) US3423255A (forum.php)
GB (1) GB1083273A (forum.php)
NL (1) NL6604270A (forum.php)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
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US3535772A (en) * 1968-03-25 1970-10-27 Bell Telephone Labor Inc Semiconductor device fabrication processes
US3654000A (en) * 1969-04-18 1972-04-04 Hughes Aircraft Co Separating and maintaining original dice position in a wafer
US3660732A (en) * 1971-02-08 1972-05-02 Signetics Corp Semiconductor structure with dielectric and air isolation and method
US3944447A (en) * 1973-03-12 1976-03-16 Ibm Corporation Method for fabrication of integrated circuit structure with full dielectric isolation utilizing selective oxidation
US4146905A (en) * 1974-06-18 1979-03-27 U.S. Philips Corporation Semiconductor device having complementary transistor structures and method of manufacturing same
JPS5718341B2 (forum.php) * 1974-12-11 1982-04-16
US4056414A (en) * 1976-11-01 1977-11-01 Fairchild Camera And Instrument Corporation Process for producing an improved dielectrically-isolated silicon crystal utilizing adjacent areas of different insulators
US4309716A (en) * 1979-10-22 1982-01-05 International Business Machines Corporation Bipolar dynamic memory cell
US4851366A (en) * 1987-11-13 1989-07-25 Siliconix Incorporated Method for providing dielectrically isolated circuit
US5416354A (en) * 1989-01-06 1995-05-16 Unitrode Corporation Inverted epitaxial process semiconductor devices
US7101623B2 (en) * 2004-03-19 2006-09-05 Dow Global Technologies Inc. Extensible and elastic conjugate fibers and webs having a nontacky feel
US7101622B2 (en) * 2004-03-19 2006-09-05 Dow Global Technologies Inc. Propylene-based copolymers, a method of making the fibers and articles made from the fibers
US20090156079A1 (en) 2007-12-14 2009-06-18 Kimberly-Clark Worldwide, Inc. Antistatic breathable nonwoven laminate having improved barrier properties
US8194138B2 (en) * 2008-12-17 2012-06-05 Getac Technology Corporation Portable electronic device and camera module thereof
US8936740B2 (en) 2010-08-13 2015-01-20 Kimberly-Clark Worldwide, Inc. Modified polylactic acid fibers
US10753023B2 (en) 2010-08-13 2020-08-25 Kimberly-Clark Worldwide, Inc. Toughened polylactic acid fibers
US11965083B2 (en) 2013-06-12 2024-04-23 Kimberly-Clark Worldwide, Inc. Polyolefin material having a low density
AU2014279702B2 (en) 2013-06-12 2017-06-22 Kimberly-Clark Worldwide, Inc. Pore initiation technique
BR112015028913B1 (pt) 2013-06-12 2020-11-10 Kimberly-Clark Worldwide, Inc. material poliolefínico, artigo absorvente, e, método para formar um material poliolefínico
CN105246955B (zh) 2013-06-12 2018-10-26 金伯利-克拉克环球有限公司 用于隔热的聚合材料
JP2016529939A (ja) 2013-06-12 2016-09-29 キンバリー クラーク ワールドワイド インコーポレイテッド 多孔質ポリオレフィン繊維から形成された不織布ウェブを含む吸収性物品
RU2631796C2 (ru) 2013-06-12 2017-09-26 Кимберли-Кларк Ворлдвайд, Инк. Полимерный материал с мультимодальным распределением пор по размеру
US9957366B2 (en) 2013-08-09 2018-05-01 Kimberly-Clark Worldwide, Inc. Technique for selectively controlling the porosity of a polymeric material
US10889696B2 (en) 2013-08-09 2021-01-12 Kimberly-Clark Worldwide, Inc. Microparticles having a multimodal pore distribution
KR101749007B1 (ko) 2013-08-09 2017-06-19 킴벌리-클라크 월드와이드, 인크. 활성제 전달 시스템
AU2014304181B2 (en) 2013-08-09 2017-08-17 Kimberly-Clark Worldwide, Inc. Flexible polymeric material with shape retention properties
SG11201601708QA (en) 2013-08-09 2016-04-28 Kimberly Clark Co Anisotropic polymeric material
JP2016532579A (ja) 2013-08-09 2016-10-20 キンバリー クラーク ワールドワイド インコーポレイテッド 三次元印刷用高分子材料
EP3152348B1 (en) 2014-06-06 2020-08-05 Kimberly-Clark Worldwide, Inc. Hollow porous fibers
EP3152038B1 (en) 2014-06-06 2020-05-06 Kimberly-Clark Worldwide, Inc. Thermoformed article formed from a porous polymeric sheet
US10640898B2 (en) 2014-11-26 2020-05-05 Kimberly-Clark Worldwide, Inc. Annealed porous polyolefin material
BR112017015225B1 (pt) 2015-01-30 2022-07-12 Kimberly-Clark Worldwide, Inc. Embalagem para artigo absorvente com redução de ruídos
WO2016122621A1 (en) 2015-01-30 2016-08-04 Kimberly-Clark Worldwide, Inc. Film with reduced noise for use in an absorbent article
BR112018010467B1 (pt) 2015-12-11 2022-11-16 Kimberly-Clark Worldwide, Inc Método para formação de fibras porosas, e, manta não tecida
US11155935B2 (en) 2015-12-11 2021-10-26 Kimberly-Clark Worldwide, Inc. Method for forming porous fibers
GB2573246B (en) 2017-01-31 2022-03-09 Kimberly Clark Co Porous polyester material
MX2019008214A (es) 2017-01-31 2019-09-04 Kimberly Clark Co Material polimerico.
DE112018000359T5 (de) 2017-02-28 2019-10-02 Kimberly-Clark Worldwide, Inc. Technik zum ausbilden poröser fasern

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3158788A (en) * 1960-08-15 1964-11-24 Fairchild Camera Instr Co Solid-state circuitry having discrete regions of semi-conductor material isolated by an insulating material
NL276298A (forum.php) * 1961-04-03 1900-01-01
US3296040A (en) * 1962-08-17 1967-01-03 Fairchild Camera Instr Co Epitaxially growing layers of semiconductor through openings in oxide mask
US3300832A (en) * 1963-06-28 1967-01-31 Rca Corp Method of making composite insulatorsemiconductor wafer
US3290753A (en) * 1963-08-19 1966-12-13 Bell Telephone Labor Inc Method of making semiconductor integrated circuit elements
US3332137A (en) * 1964-09-28 1967-07-25 Rca Corp Method of isolating chips of a wafer of semiconductor material
US3332143A (en) * 1964-12-28 1967-07-25 Gen Electric Semiconductor devices with epitaxial contour

Also Published As

Publication number Publication date
DE1539117A1 (de) 1969-09-11
US3423255A (en) 1969-01-21
DE1539117B2 (de) 1975-01-09
GB1083273A (en) 1967-09-13

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