NL271119A - - Google Patents
Info
- Publication number
- NL271119A NL271119A NL271119DA NL271119A NL 271119 A NL271119 A NL 271119A NL 271119D A NL271119D A NL 271119DA NL 271119 A NL271119 A NL 271119A
- Authority
- NL
- Netherlands
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/04—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
- G11C13/048—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using other optical storage elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US123065A US3223837A (en) | 1961-07-10 | 1961-07-10 | Beam probe system and apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
NL271119A true NL271119A (de) |
Family
ID=22406519
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL271119D NL271119A (de) | 1961-07-10 |
Country Status (3)
Country | Link |
---|---|
US (1) | US3223837A (de) |
GB (1) | GB1009702A (de) |
NL (1) | NL271119A (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1128107A (en) * | 1965-06-23 | 1968-09-25 | Hitachi Ltd | Scanning electron microscope |
US3472997A (en) * | 1966-08-26 | 1969-10-14 | Us Navy | Secondary electron collection system |
FR2116931A5 (fr) * | 1970-12-11 | 1972-07-21 | Onera (Off Nat Aerospatiale) | Dispositif de protection d'appareillages d'etude d'echantillons a l'aide d'un pinceau d'electrons |
US3959651A (en) * | 1974-04-24 | 1976-05-25 | American Optical Corporation | Electron microscope |
US3927321A (en) * | 1974-04-24 | 1975-12-16 | American Optical Corp | Electron microscope beam tube |
US4331872A (en) * | 1979-06-29 | 1982-05-25 | Nippon Steel Corporation | Method for measurement of distribution of inclusions in a slab by electron beam irradiation |
DE3222511C2 (de) * | 1982-06-16 | 1985-08-29 | Feinfocus Röntgensysteme GmbH, 3050 Wunstorf | Feinfokus-Röntgenröhre |
DE3222515C2 (de) * | 1982-06-16 | 1986-05-28 | Feinfocus Röntgensysteme GmbH, 3050 Wunstorf | Feinfokus-Röntgenröhre und Verfahren zu ihrem Betrieb |
DE3426623A1 (de) * | 1984-07-19 | 1986-01-30 | Scanray A/S, Kopenhagen | Roentgenroehre |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE426347A (de) * | 1937-02-18 | |||
US2396624A (en) * | 1940-03-11 | 1946-03-12 | Borries Bodo Von | Electronic microscope |
US2418029A (en) * | 1943-10-08 | 1947-03-25 | Rca Corp | Electron probe analysis employing X-ray spectrography |
US2408487A (en) * | 1944-02-29 | 1946-10-01 | Rca Corp | Art of ascertaining the atomic structure of materials |
GB646019A (en) * | 1946-01-05 | 1950-11-15 | Philips Nv | Improvements in or relating to electron microscopes |
US2969478A (en) * | 1949-06-10 | 1961-01-24 | Sperry Rand Corp | Information storage system |
NL97470C (de) * | 1955-03-15 | |||
GB785110A (en) * | 1955-06-28 | 1957-10-23 | Standard Telephones Cables Ltd | Electron tube magnetic focusing device |
US2919377A (en) * | 1956-03-17 | 1959-12-29 | Electronique & Automatisme Sa | Information stores |
US2889479A (en) * | 1957-06-17 | 1959-06-02 | Gen Dynamics Corp | Adjustable mount assembly for a cathode ray tube |
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0
- NL NL271119D patent/NL271119A/xx unknown
-
1961
- 1961-07-10 US US123065A patent/US3223837A/en not_active Expired - Lifetime
- 1961-10-20 GB GB37779/61A patent/GB1009702A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US3223837A (en) | 1965-12-14 |
GB1009702A (en) | 1965-11-10 |