NL134392C - - Google Patents
Info
- Publication number
- NL134392C NL134392C NL134392DA NL134392C NL 134392 C NL134392 C NL 134392C NL 134392D A NL134392D A NL 134392DA NL 134392 C NL134392 C NL 134392C
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH1305365A CH440760A (de) | 1965-09-21 | 1965-09-21 | Verfahren zur Materialanalyse in einem Sekundär-Elektronen-Emissionsmikroskop und Sekundär-Elektronen-Emissionsmikroskop zur Durchführung des Verfahrens |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL134392C true NL134392C (en:Method) |
Family
ID=4388878
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL134392D NL134392C (en:Method) | 1965-09-21 | ||
| NL6515902A NL6515902A (en:Method) | 1965-09-21 | 1965-12-07 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6515902A NL6515902A (en:Method) | 1965-09-21 | 1965-12-07 |
Country Status (3)
| Country | Link |
|---|---|
| CH (1) | CH440760A (en:Method) |
| DE (1) | DE1598130C3 (en:Method) |
| NL (2) | NL6515902A (en:Method) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58501396A (ja) * | 1981-09-01 | 1983-08-18 | コモンウエルス サイエンテイフイツク アンド インダストリアル リサ−チ オ−ガニゼ−シヨン | 画像形成方法および装置 |
| US4843330A (en) * | 1986-10-30 | 1989-06-27 | International Business Machines Corporation | Electron beam contactless testing system with grid bias switching |
-
0
- NL NL134392D patent/NL134392C/xx active
-
1965
- 1965-09-21 CH CH1305365A patent/CH440760A/de unknown
- 1965-12-07 NL NL6515902A patent/NL6515902A/xx unknown
-
1966
- 1966-08-19 DE DE19661598130 patent/DE1598130C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE1598130A1 (de) | 1971-02-18 |
| DE1598130B2 (de) | 1973-07-26 |
| DE1598130C3 (de) | 1974-02-21 |
| NL6515902A (en:Method) | 1967-03-22 |
| CH440760A (de) | 1967-07-31 |