NL1016471A1 - Werkwijze en inrichting voor de bepaling van een materiaal van een gedetecteerd voorwerp. - Google Patents

Werkwijze en inrichting voor de bepaling van een materiaal van een gedetecteerd voorwerp.

Info

Publication number
NL1016471A1
NL1016471A1 NL1016471A NL1016471A NL1016471A1 NL 1016471 A1 NL1016471 A1 NL 1016471A1 NL 1016471 A NL1016471 A NL 1016471A NL 1016471 A NL1016471 A NL 1016471A NL 1016471 A1 NL1016471 A1 NL 1016471A1
Authority
NL
Netherlands
Prior art keywords
determining
detected object
detected
Prior art date
Application number
NL1016471A
Other languages
English (en)
Other versions
NL1016471C2 (nl
Inventor
Martin Hartick
Frank Cordes
Original Assignee
Heimann Systems Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heimann Systems Gmbh & Co filed Critical Heimann Systems Gmbh & Co
Publication of NL1016471A1 publication Critical patent/NL1016471A1/nl
Application granted granted Critical
Publication of NL1016471C2 publication Critical patent/NL1016471C2/nl

Links

Classifications

    • G01V5/22—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01V5/222—
    • G01V5/224—
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/04—Irradiation devices with beam-forming means
NL1016471A 1999-11-13 2000-10-24 Werkwijze en inrichting voor de bepaling van een materiaal van een gedetecteerd voorwerp. NL1016471C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19954663A DE19954663B4 (de) 1999-11-13 1999-11-13 Verfahren und Vorrichtung zur Bestimmung eines Materials eines detektierten Gegenstandes
DE19954663 1999-11-13

Publications (2)

Publication Number Publication Date
NL1016471A1 true NL1016471A1 (nl) 2001-05-15
NL1016471C2 NL1016471C2 (nl) 2004-08-03

Family

ID=7928938

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1016471A NL1016471C2 (nl) 1999-11-13 2000-10-24 Werkwijze en inrichting voor de bepaling van een materiaal van een gedetecteerd voorwerp.

Country Status (5)

Country Link
US (3) US20010033636A1 (nl)
DE (1) DE19954663B4 (nl)
FR (1) FR2801103B1 (nl)
GB (1) GB2359719B (nl)
NL (1) NL1016471C2 (nl)

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Also Published As

Publication number Publication date
NL1016471C2 (nl) 2004-08-03
GB0027195D0 (en) 2000-12-27
US6483894B2 (en) 2002-11-19
FR2801103A1 (fr) 2001-05-18
DE19954663B4 (de) 2006-06-08
GB2359719A (en) 2001-08-29
US20010033636A1 (en) 2001-10-25
GB2359719B (en) 2003-12-31
US6532276B1 (en) 2003-03-11
DE19954663A1 (de) 2001-06-07
FR2801103B1 (fr) 2005-08-12
US20010036250A1 (en) 2001-11-01

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AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20040324

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MK Patent expired because of reaching the maximum lifetime of a patent

Effective date: 20201023