MY177803A - Apparatus and method for inspecting appearance of workpiece - Google Patents

Apparatus and method for inspecting appearance of workpiece

Info

Publication number
MY177803A
MY177803A MYPI2016702775A MYPI2016702775A MY177803A MY 177803 A MY177803 A MY 177803A MY PI2016702775 A MYPI2016702775 A MY PI2016702775A MY PI2016702775 A MYPI2016702775 A MY PI2016702775A MY 177803 A MY177803 A MY 177803A
Authority
MY
Malaysia
Prior art keywords
workpieces
workpiece
transport table
linear feeder
junction
Prior art date
Application number
MYPI2016702775A
Inventor
Kodera Katsuyoshi
Mizukami Hirofumi
Okamoto Yasuo
Original Assignee
Tokyo Weld Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Weld Co Ltd filed Critical Tokyo Weld Co Ltd
Publication of MY177803A publication Critical patent/MY177803A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/02—Devices for feeding articles or materials to conveyors
    • B65G47/04—Devices for feeding articles or materials to conveyors for feeding articles
    • B65G47/12—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles
    • B65G47/14—Devices for feeding articles or materials to conveyors for feeding articles from disorderly-arranged article piles or from loose assemblages of articles arranging or orientating the articles by mechanical or pneumatic means during feeding
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
    • B65G47/80—Turntables carrying articles or materials to be transferred, e.g. combined with ploughs or scrapers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G01N2021/8455—Objects on a conveyor and using position detectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Textile Engineering (AREA)
  • Specific Conveyance Elements (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Attitude Control For Articles On Conveyors (AREA)

Abstract

There is provided a workpiece appearance inspection apparatus which can accurately perform positioning of a workpiece on a transport table and which does not cause electrostatic breakdown or characteristic degradation of the workpiece. The workpiece appearance inspection apparatus (30) includes: a linear feeder (1) for transporting hexahedral workpieces (W); a transport table (2) to which the workpieces (W) are transferred from the linear feeder (1) and which transports the workpieces (W); a transfer alignment means (21) for transferring the workpieces (W) from the linear feeder (1) onto the transport table (2) and aligning the workpieces (W); a holding means comprised of a conductive plate (15) disposed below the transport table (2); and an imaging means (20) for imaging the surfaces of each of the workpieces (W). The conductive plate (15) of the holding means is disposed along a line section connecting a transfer point (4X) and a junction (7X) and along a workpiece transport arc lying downstream of the junction (7X).
MYPI2016702775A 2015-08-26 2016-07-29 Apparatus and method for inspecting appearance of workpiece MY177803A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015167188A JP6529170B2 (en) 2015-08-26 2015-08-26 Work appearance inspection apparatus and work appearance inspection method

Publications (1)

Publication Number Publication Date
MY177803A true MY177803A (en) 2020-09-23

Family

ID=58209698

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2016702775A MY177803A (en) 2015-08-26 2016-07-29 Apparatus and method for inspecting appearance of workpiece

Country Status (5)

Country Link
JP (1) JP6529170B2 (en)
KR (1) KR101851975B1 (en)
CN (1) CN106483141B (en)
MY (1) MY177803A (en)
TW (1) TWI610073B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6879822B2 (en) * 2017-05-18 2021-06-02 株式会社 東京ウエルズ Work appearance inspection device and work appearance inspection method
JP6795479B2 (en) 2017-09-25 2020-12-02 株式会社Ｓｃｒｅｅｎホールディングス Inspection equipment and inspection method
JP7205846B2 (en) * 2017-11-07 2023-01-17 株式会社 東京ウエルズ CONVEYING DEVICE, CONVEYING METHOD, AND APPEARANCE INSPECTION DEVICE
JP6970432B2 (en) * 2017-11-30 2021-11-24 三星ダイヤモンド工業株式会社 Board alignment device
JP6987400B2 (en) * 2019-09-26 2022-01-05 株式会社 東京ウエルズ Work transfer device and work transfer method
KR102421136B1 (en) * 2021-04-02 2022-07-14 주식회사 다인이엔지 The multi layer ceramic condenser aligner using magnet
CN113720856B (en) * 2021-08-25 2022-07-01 东莞市华石晶电技术有限公司 Detection equipment and detection method thereof
CN118139800A (en) * 2021-12-27 2024-06-04 株式会社村田制作所 Component handling device
TWI814542B (en) * 2022-08-17 2023-09-01 產台股份有限公司 Alignment device for workpiece appearance inspection machine

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002179232A (en) * 2000-12-20 2002-06-26 Matsushita Electric Ind Co Ltd Conveying and supplying device
JP3855733B2 (en) * 2001-10-30 2006-12-13 株式会社村田製作所 Electronic component visual inspection apparatus and visual inspection method
US7190446B2 (en) * 2003-12-19 2007-03-13 Asm Assembly Automation Ltd. System for processing electronic devices
JP2008260594A (en) * 2007-04-10 2008-10-30 Okano Denki Kk Part conveying device
JP5598912B2 (en) * 2009-11-27 2014-10-01 株式会社 東京ウエルズ Work appearance inspection apparatus and work appearance inspection method
CN102079448B (en) * 2009-11-27 2013-09-04 东京威尔斯股份有限公司 Inspection apparatus for appearance of workpiece and inspection method thereof
JP6009167B2 (en) * 2012-01-17 2016-10-19 株式会社 東京ウエルズ Work appearance inspection apparatus and work appearance inspection method
CN203714822U (en) * 2014-01-29 2014-07-16 洛阳久德轴承模具技术有限公司 Conveying and end face detection mechanism for bearing rollers
CN103801518B (en) * 2014-01-29 2016-05-04 洛阳久德轴承模具技术有限公司 A kind of detection system for bearing roller
CN105372245A (en) * 2015-10-14 2016-03-02 上海为寻视自动化科技有限公司 Keyboard thin film detecting equipment

Also Published As

Publication number Publication date
KR101851975B1 (en) 2018-04-25
TWI610073B (en) 2018-01-01
TW201713935A (en) 2017-04-16
JP2017044579A (en) 2017-03-02
KR20170026099A (en) 2017-03-08
CN106483141B (en) 2020-09-22
CN106483141A (en) 2017-03-08
JP6529170B2 (en) 2019-06-12

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