MY119984A - Lithography process. - Google Patents

Lithography process.

Info

Publication number
MY119984A
MY119984A MYPI93000202A MYPI9300202A MY119984A MY 119984 A MY119984 A MY 119984A MY PI93000202 A MYPI93000202 A MY PI93000202A MY PI9300202 A MYPI9300202 A MY PI9300202A MY 119984 A MY119984 A MY 119984A
Authority
MY
Malaysia
Prior art keywords
pattern
ch2ch2o
surfactant
resist
molecular weight
Prior art date
Application number
MYPI93000202A
Other languages
English (en)
Inventor
Tadahiro Ohmi
Hisayuki Shimada
Shigeki Shimomura
Akiyoshi Suzuki
Mamoru Miyawaki
Miyoko Noguchi
Original Assignee
Tadahiro Ohmi
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tadahiro Ohmi, Canon Kk filed Critical Tadahiro Ohmi
Publication of MY119984A publication Critical patent/MY119984A/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70091Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/701Off-axis setting using an aperture
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/322Aqueous alkaline compositions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
MYPI93000202A 1992-02-10 1993-02-09 Lithography process. MY119984A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP5752692 1992-02-10
JP4233083A JPH05303209A (ja) 1992-02-10 1992-08-07 リソグラフィ工程
JP4233081A JPH05308048A (ja) 1992-02-10 1992-08-07 リソグラフィ工程

Publications (1)

Publication Number Publication Date
MY119984A true MY119984A (en) 2005-08-30

Family

ID=13058195

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI93000202A MY119984A (en) 1992-02-10 1993-02-09 Lithography process.

Country Status (4)

Country Link
JP (2) JPH05308048A (ja)
KR (1) KR0123931B1 (ja)
MY (1) MY119984A (ja)
TW (1) TW233378B (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4564186B2 (ja) * 2001-02-16 2010-10-20 株式会社東芝 パターン形成方法
KR100680401B1 (ko) * 2004-07-02 2007-02-08 주식회사 하이닉스반도체 이머젼 리소그래피용 액체 조성물 및 이를 이용한리소그래피 방법
JP2007150102A (ja) * 2005-11-29 2007-06-14 Fujitsu Ltd 露光装置及び光学素子の洗浄方法
WO2009150913A1 (ja) * 2008-06-12 2009-12-17 株式会社ニコン 照明装置、露光装置及びデバイス製造方法

Also Published As

Publication number Publication date
JPH05303209A (ja) 1993-11-16
TW233378B (ja) 1994-11-01
JPH05308048A (ja) 1993-11-19
KR0123931B1 (ko) 1997-11-20
KR930018679A (ko) 1993-09-22

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