MXPA05010244A - Metodo y sistema para detectar fugas en dispositivos electronicos. - Google Patents

Metodo y sistema para detectar fugas en dispositivos electronicos.

Info

Publication number
MXPA05010244A
MXPA05010244A MXPA05010244A MXPA05010244A MXPA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A
Authority
MX
Mexico
Prior art keywords
sealed package
test gas
electronic devices
leak
detecting
Prior art date
Application number
MXPA05010244A
Other languages
English (en)
Inventor
William J Cummings
Original Assignee
Idc Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Idc Llc filed Critical Idc Llc
Publication of MXPA05010244A publication Critical patent/MXPA05010244A/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/02Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G01M3/226Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators
    • G01M3/229Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators removably mounted in a test cell
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

Se describen metodos y sistemas para probar dispositivos electronicos para deteccion de fugas, en donde la prueba no destruye los dispositivos electronicos. En un metodo para detectar una fuga en un paquete sellado, un paquete sellado se coloca en un ambiente de gas de prueba, permitiendo con esto que el gas de prueba se difunda en un espacio interno del paquete sellado a traves de una fuga formada en el paquete sellado. Despues de esto, el paquete sellado se coloca en un ambiente sustancialmente libre del gas de prueba y permite que el gas de prueba se difunda fuera del espacio interno. La cantidad de gas de prueba en el ambiente libre de gas de prueba se detecta. Basandose en la informacion obtenida de la deteccion, se determina si el paquete sellado tiene una o mas fugas no pretendidas basandose en la informacion obtenida de la deteccion.
MXPA05010244A 2004-09-27 2005-09-23 Metodo y sistema para detectar fugas en dispositivos electronicos. MXPA05010244A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61338504P 2004-09-27 2004-09-27
US11/090,775 US7299681B2 (en) 2004-09-27 2005-03-25 Method and system for detecting leak in electronic devices

Publications (1)

Publication Number Publication Date
MXPA05010244A true MXPA05010244A (es) 2006-03-29

Family

ID=35094553

Family Applications (1)

Application Number Title Priority Date Filing Date
MXPA05010244A MXPA05010244A (es) 2004-09-27 2005-09-23 Metodo y sistema para detectar fugas en dispositivos electronicos.

Country Status (12)

Country Link
US (2) US7299681B2 (es)
EP (1) EP1640698A3 (es)
JP (1) JP2006091004A (es)
KR (1) KR20060092866A (es)
AU (1) AU2005203231A1 (es)
BR (1) BRPI0503886A (es)
CA (1) CA2512922A1 (es)
MX (1) MXPA05010244A (es)
MY (1) MY141411A (es)
RU (1) RU2379642C2 (es)
SG (1) SG121040A1 (es)
TW (1) TW200628775A (es)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6997043B2 (en) * 2002-08-15 2006-02-14 The Boeing Company Integration of atmospheric intrusion sensors in electronic component packages
US20070157457A1 (en) * 2004-09-10 2007-07-12 Lance Fried Assembly Method and Machinery for Waterproof Testing of Electronic Devices
DE102004045803A1 (de) * 2004-09-22 2006-04-06 Inficon Gmbh Leckprüfverfahren und Leckprüfvorrichtung
US7343080B2 (en) * 2004-09-27 2008-03-11 Idc, Llc System and method of testing humidity in a sealed MEMS device
WO2006127814A2 (en) * 2005-05-25 2006-11-30 Northrop Grumman Corporation Method for optimizing direct wafer bond line width for reduction of parasitic capacitance in mems accelerometers
DE102006016747A1 (de) * 2006-04-10 2007-10-18 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur Leckprüfung
US20080194963A1 (en) * 2007-02-08 2008-08-14 Randall Kevin S Probes for ultrasound imaging systems
US7891230B2 (en) * 2007-02-08 2011-02-22 Penrith Corporation Methods for verifying the integrity of probes for ultrasound imaging systems
DE102007060392A1 (de) 2007-12-14 2009-06-18 Krones Ag Drehverteiler mit Leckageerkennung
US8177302B2 (en) * 2008-03-05 2012-05-15 Tamarack Habilitation Technologies Seat cushion
AU2009349190B2 (en) * 2009-07-01 2013-03-14 Wilco Ag Method for leak testing closed, at least partially gas filled containers
US20110048111A1 (en) * 2009-08-31 2011-03-03 United Technologies Corporation Method of leak testing aerospace components
CA2796519A1 (en) 2010-04-16 2011-10-20 Flex Lighting Ii, Llc Illumination device comprising a film-based lightguide
JP6132762B2 (ja) 2010-04-16 2017-05-24 フレックス ライティング 2,エルエルシー フィルムベースのライトガイドを備える前面照射デバイス
US9010175B2 (en) * 2012-01-06 2015-04-21 GM Global Technology Operations LLC Die coolant system with an integral and automatic leak test
KR101302005B1 (ko) * 2012-04-04 2013-08-30 한국기계전기전자시험연구원 엘이디 박리 검사를 위한 헬륨 가스 디텍팅 장치
TW201411108A (zh) * 2012-09-14 2014-03-16 Askey Computer Corp 測試治具與測試方法
CN103674441A (zh) * 2012-09-14 2014-03-26 亚旭电脑股份有限公司 测试治具与测试方法
US9429494B1 (en) 2012-11-21 2016-08-30 Western Digital Technologies, Inc. Leakage test method for a hermetically sealed disk drive enclosure
US8921128B2 (en) * 2013-05-29 2014-12-30 Analog Devices, Inc. Method of manufacturing MEMS devices with reliable hermetic seal
US9884197B2 (en) * 2013-07-01 2018-02-06 Newsouth Innovations Pty Ltd Encapsulated electronic circuit
JP6243762B2 (ja) * 2014-03-14 2017-12-06 サーパス工業株式会社 圧力センサ
US9733148B2 (en) 2014-12-03 2017-08-15 International Business Machines Corporation Measuring moisture leakage through liquid-carrying hardware
US10001426B2 (en) 2016-09-13 2018-06-19 Dong Un Kim Apparatus for testing water resistance of mobile terminal using reference chamber unit
FR3068781A1 (fr) * 2017-07-06 2019-01-11 Ateq Procede de detection de fuite d'une piece creuse et installation pour la mise en œuvre d'un tel procede
CN111033252A (zh) * 2017-08-25 2020-04-17 周锦富 用于校准气体检测装置的系统和方法
JP6708191B2 (ja) * 2017-09-21 2020-06-10 株式会社デンソー 漏れ検査装置及び漏れ検査方法
WO2020061455A1 (en) * 2018-09-20 2020-03-26 Ignite, Inc. A mems display device with auto-inspection mechanism
CN110940463B (zh) * 2018-09-25 2022-05-17 宁波方太厨具有限公司 一种漏水检测方法及漏水检测装置
US11847311B2 (en) * 2019-05-22 2023-12-19 Apple Inc. Characterization of a venting state or other system parameter that affects the characterization of a force applied to a device
CN111678659A (zh) * 2020-06-09 2020-09-18 江苏省如高高压电器有限公司 一种瓷柱式断路器检漏方法
CN112484925A (zh) * 2020-11-06 2021-03-12 江苏创励安科技有限公司 一种游泳模拟机构及游泳模拟设备
CN113328346B (zh) * 2021-07-04 2022-01-18 兴化市永安电力工具有限公司 一种户外用配电柜
CN114623391B (zh) * 2022-04-11 2023-11-21 广州燃气集团有限公司 一种燃气管道泄漏位置的定位方法

Family Cites Families (191)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6347009B1 (en) * 1997-08-06 2002-02-12 Nikon Corporation Illuminating light selection device for a microscope
US2534846A (en) 1946-06-20 1950-12-19 Emi Ltd Color filter
US2836058A (en) * 1953-01-06 1958-05-27 Sr Lewis M Oden Spark plug bomb and leak tester
DE1288651B (de) 1963-06-28 1969-02-06 Siemens Ag Anordnung elektrischer Dipole fuer Wellenlaengen unterhalb 1 mm und Verfahren zur Herstellung einer derartigen Anordnung
US3416359A (en) 1966-07-01 1968-12-17 Texas Instruments Inc Method and apparatus for testing hermetically sealed transistor devices
US3487677A (en) * 1968-01-08 1970-01-06 Victor D Molitor Method for leak detection
FR1603131A (es) * 1968-07-05 1971-03-22
US3578758A (en) * 1969-05-07 1971-05-18 Nasa Orifice gross leak tester
US3653741A (en) * 1970-02-16 1972-04-04 Alvin M Marks Electro-optical dipolar material
US3813265A (en) 1970-02-16 1974-05-28 A Marks Electro-optical dipolar material
US3672207A (en) * 1971-01-04 1972-06-27 North American Rockwell Apparatus for verifying hermeticity of small electronic assemblies
DE2336930A1 (de) 1973-07-20 1975-02-06 Battelle Institut E V Infrarot-modulator (ii.)
US3899295A (en) 1973-11-23 1975-08-12 Bio Medical Sciences Inc Integrity indicator
NL7403213A (nl) * 1974-03-11 1975-09-15 Neratoom Werkwijze voor het detecteren van zeer kleine gaslekken door een vloeistofafdichting om een doorvoering.
JPS5110798A (es) * 1974-07-17 1976-01-28 Citizen Watch Co Ltd
US3956923A (en) 1975-01-17 1976-05-18 The Procter & Gamble Company Method of detecting small gas leaks in filled aerosol containers
US4099854A (en) 1976-10-12 1978-07-11 The Unites States Of America As Represented By The Secretary Of The Navy Optical notch filter utilizing electric dipole resonance absorption
US4389096A (en) 1977-12-27 1983-06-21 Matsushita Electric Industrial Co., Ltd. Image display apparatus of liquid crystal valve projection type
US4158960A (en) 1978-05-04 1979-06-26 The United States Of America As Represented By The Secretary Of The Army Microcircuit fine leak test apparatus
US4663083A (en) 1978-05-26 1987-05-05 Marks Alvin M Electro-optical dipole suspension with reflective-absorptive-transmissive characteristics
US4445050A (en) * 1981-12-15 1984-04-24 Marks Alvin M Device for conversion of light power to electric power
US4224565A (en) 1978-06-05 1980-09-23 Bell Telephone Laboratories, Incorporated Moisture level determination in sealed packages
US4228437A (en) 1979-06-26 1980-10-14 The United States Of America As Represented By The Secretary Of The Navy Wideband polarization-transforming electromagnetic mirror
US4282744A (en) * 1979-11-02 1981-08-11 Western Electric Co., Inc. Leak testing hermetically sealed electronic articles
NL8001281A (nl) 1980-03-04 1981-10-01 Philips Nv Weergeefinrichting.
US4377324A (en) * 1980-08-04 1983-03-22 Honeywell Inc. Graded index Fabry-Perot optical filter device
US4441791A (en) * 1980-09-02 1984-04-10 Texas Instruments Incorporated Deformable mirror light modulator
FR2506026A1 (fr) 1981-05-18 1982-11-19 Radant Etudes Procede et dispositif pour l'analyse d'un faisceau de rayonnement d'ondes electromagnetiques hyperfrequence
US4398413A (en) * 1981-05-18 1983-08-16 Medtronic, Inc. Leak detection for hermetic enclosures
NL8103377A (nl) 1981-07-16 1983-02-16 Philips Nv Weergeefinrichting.
US4565093A (en) * 1981-10-05 1986-01-21 Medtronic, Inc. Method for facilitating hermeticity leakage testing of an electrical feedthrough
US4571603A (en) * 1981-11-03 1986-02-18 Texas Instruments Incorporated Deformable mirror electrostatic printer
NL8200354A (nl) 1982-02-01 1983-09-01 Philips Nv Passieve weergeefinrichting.
US4500171A (en) * 1982-06-02 1985-02-19 Texas Instruments Incorporated Process for plastic LCD fill hole sealing
US4459844A (en) * 1982-06-17 1984-07-17 Smith & Denison Gas separation chamber and portable leak detection system
US4482213A (en) 1982-11-23 1984-11-13 Texas Instruments Incorporated Perimeter seal reinforcement holes for plastic LCDs
US4553435A (en) * 1983-07-19 1985-11-19 The United States Of America As Represented By The Secretary Of The Air Force Elevated transient temperature leak test for unstable microelectronic packages
US4920785A (en) * 1984-06-21 1990-05-01 Web Technology, Inc. Hermeticity testing method and system
US4710732A (en) 1984-07-31 1987-12-01 Texas Instruments Incorporated Spatial light modulator and method
US4566935A (en) * 1984-07-31 1986-01-28 Texas Instruments Incorporated Spatial light modulator and method
US4662746A (en) 1985-10-30 1987-05-05 Texas Instruments Incorporated Spatial light modulator and method
US5061049A (en) 1984-08-31 1991-10-29 Texas Instruments Incorporated Spatial light modulator and method
US5096279A (en) * 1984-08-31 1992-03-17 Texas Instruments Incorporated Spatial light modulator and method
US4596992A (en) 1984-08-31 1986-06-24 Texas Instruments Incorporated Linear spatial light modulator and printer
US4615595A (en) 1984-10-10 1986-10-07 Texas Instruments Incorporated Frame addressed spatial light modulator
US4608866A (en) * 1985-03-13 1986-09-02 Martin Marietta Corporation Small component helium leak detector
US5172262A (en) 1985-10-30 1992-12-15 Texas Instruments Incorporated Spatial light modulator and method
GB8610129D0 (en) 1986-04-25 1986-05-29 Secr Defence Electro-optical device
US4748366A (en) 1986-09-02 1988-05-31 Taylor George W Novel uses of piezoelectric materials for creating optical effects
US4786128A (en) 1986-12-02 1988-11-22 Quantum Diagnostics, Ltd. Device for modulating and reflecting electromagnetic radiation employing electro-optic layer having a variable index of refraction
US4785666A (en) * 1986-12-19 1988-11-22 Martin Marietta Corporation Method of increasing the sensitivity of a leak detector in the probe mode
US4897360A (en) * 1987-12-09 1990-01-30 Wisconsin Alumni Research Foundation Polysilicon thin film process
US4956619A (en) 1988-02-19 1990-09-11 Texas Instruments Incorporated Spatial light modulator
US4856863A (en) 1988-06-22 1989-08-15 Texas Instruments Incorporated Optical fiber interconnection network including spatial light modulator
US5028939A (en) 1988-08-23 1991-07-02 Texas Instruments Incorporated Spatial light modulator system
US4893499A (en) * 1988-12-05 1990-01-16 Unisys Corporation Method and apparatus for detecting leaks in IC packages by sensing package deflections
US4982184A (en) * 1989-01-03 1991-01-01 General Electric Company Electrocrystallochromic display and element
US5214419A (en) 1989-02-27 1993-05-25 Texas Instruments Incorporated Planarized true three dimensional display
US5446479A (en) 1989-02-27 1995-08-29 Texas Instruments Incorporated Multi-dimensional array video processor system
US5272473A (en) 1989-02-27 1993-12-21 Texas Instruments Incorporated Reduced-speckle display system
US5162787A (en) 1989-02-27 1992-11-10 Texas Instruments Incorporated Apparatus and method for digitized video system utilizing a moving display surface
US5079544A (en) * 1989-02-27 1992-01-07 Texas Instruments Incorporated Standard independent digitized video system
US5170156A (en) 1989-02-27 1992-12-08 Texas Instruments Incorporated Multi-frequency two dimensional display system
US5214420A (en) 1989-02-27 1993-05-25 Texas Instruments Incorporated Spatial light modulator projection system with random polarity light
US5206629A (en) * 1989-02-27 1993-04-27 Texas Instruments Incorporated Spatial light modulator and memory for digitized video display
US5192946A (en) * 1989-02-27 1993-03-09 Texas Instruments Incorporated Digitized color video display system
KR100202246B1 (ko) * 1989-02-27 1999-06-15 윌리엄 비. 켐플러 디지탈화 비디오 시스템을 위한 장치 및 방법
US5287096A (en) * 1989-02-27 1994-02-15 Texas Instruments Incorporated Variable luminosity display system
US5022745A (en) 1989-09-07 1991-06-11 Massachusetts Institute Of Technology Electrostatically deformable single crystal dielectrically coated mirror
US4954789A (en) 1989-09-28 1990-09-04 Texas Instruments Incorporated Spatial light modulator
US5381253A (en) * 1991-11-14 1995-01-10 Board Of Regents Of University Of Colorado Chiral smectic liquid crystal optical modulators having variable retardation
US5124834A (en) 1989-11-16 1992-06-23 General Electric Company Transferrable, self-supporting pellicle for elastomer light valve displays and method for making the same
US5037173A (en) 1989-11-22 1991-08-06 Texas Instruments Incorporated Optical interconnection network
US5500635A (en) * 1990-02-20 1996-03-19 Mott; Jonathan C. Products incorporating piezoelectric material
CH682523A5 (fr) * 1990-04-20 1993-09-30 Suisse Electronique Microtech Dispositif de modulation de lumière à adressage matriciel.
GB9012099D0 (en) 1990-05-31 1990-07-18 Kodak Ltd Optical article for multicolour imaging
US5083857A (en) * 1990-06-29 1992-01-28 Texas Instruments Incorporated Multi-level deformable mirror device
DE69113150T2 (de) * 1990-06-29 1996-04-04 Texas Instruments Inc Deformierbare Spiegelvorrichtung mit aktualisiertem Raster.
US5099353A (en) * 1990-06-29 1992-03-24 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5018256A (en) 1990-06-29 1991-05-28 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5216537A (en) 1990-06-29 1993-06-01 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5142405A (en) 1990-06-29 1992-08-25 Texas Instruments Incorporated Bistable dmd addressing circuit and method
US5153771A (en) 1990-07-18 1992-10-06 Northrop Corporation Coherent light modulation and detector
US5082366A (en) * 1990-08-30 1992-01-21 Laser Technology, Inc. Apparatus and method for detecting leaks in packages
US5192395A (en) * 1990-10-12 1993-03-09 Texas Instruments Incorporated Method of making a digital flexure beam accelerometer
US5044736A (en) 1990-11-06 1991-09-03 Motorola, Inc. Configurable optical filter or display
US5602671A (en) * 1990-11-13 1997-02-11 Texas Instruments Incorporated Low surface energy passivation layer for micromechanical devices
US5331454A (en) 1990-11-13 1994-07-19 Texas Instruments Incorporated Low reset voltage process for DMD
US5175772A (en) 1991-01-02 1992-12-29 Motorola, Inc. Automated test for displays using display patterns
JP2500488B2 (ja) * 1991-02-08 1996-05-29 ヤマハ株式会社 漏洩試験方法及び漏洩試験装置
US5233459A (en) 1991-03-06 1993-08-03 Massachusetts Institute Of Technology Electric display device
CA2063744C (en) * 1991-04-01 2002-10-08 Paul M. Urbanus Digital micromirror device architecture and timing for use in a pulse-width modulated display system
US5226099A (en) 1991-04-26 1993-07-06 Texas Instruments Incorporated Digital micromirror shutter device
US5179274A (en) * 1991-07-12 1993-01-12 Texas Instruments Incorporated Method for controlling operation of optical systems and devices
US5168406A (en) 1991-07-31 1992-12-01 Texas Instruments Incorporated Color deformable mirror device and method for manufacture
US5254980A (en) 1991-09-06 1993-10-19 Texas Instruments Incorporated DMD display system controller
US5459409A (en) 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
CA2081753C (en) 1991-11-22 2002-08-06 Jeffrey B. Sampsell Dmd scanner
US5233385A (en) 1991-12-18 1993-08-03 Texas Instruments Incorporated White light enhanced color field sequential projection
US5233456A (en) 1991-12-20 1993-08-03 Texas Instruments Incorporated Resonant mirror and method of manufacture
US5296950A (en) * 1992-01-31 1994-03-22 Texas Instruments Incorporated Optical signal free-space conversion board
US5231532A (en) 1992-02-05 1993-07-27 Texas Instruments Incorporated Switchable resonant filter for optical radiation
DE69310974T2 (de) 1992-03-25 1997-11-06 Texas Instruments Inc Eingebautes optisches Eichsystem
US5312513A (en) 1992-04-03 1994-05-17 Texas Instruments Incorporated Methods of forming multiple phase light modulators
US5401983A (en) * 1992-04-08 1995-03-28 Georgia Tech Research Corporation Processes for lift-off of thin film materials or devices for fabricating three dimensional integrated circuits, optical detectors, and micromechanical devices
US5369983A (en) * 1992-04-17 1994-12-06 Minnesota Mining And Manufacturing Company Detection medium and method for use in hermetic seal testing
US5311360A (en) 1992-04-28 1994-05-10 The Board Of Trustees Of The Leland Stanford, Junior University Method and apparatus for modulating a light beam
JPH0651250A (ja) * 1992-05-20 1994-02-25 Texas Instr Inc <Ti> モノリシックな空間的光変調器およびメモリのパッケージ
JPH06214169A (ja) * 1992-06-08 1994-08-05 Texas Instr Inc <Ti> 制御可能な光学的周期的表面フィルタ
US5818095A (en) * 1992-08-11 1998-10-06 Texas Instruments Incorporated High-yield spatial light modulator with light blocking layer
US5327286A (en) 1992-08-31 1994-07-05 Texas Instruments Incorporated Real time optical correlation system
US5325116A (en) 1992-09-18 1994-06-28 Texas Instruments Incorporated Device for writing to and reading from optical storage media
US6674562B1 (en) * 1994-05-05 2004-01-06 Iridigm Display Corporation Interferometric modulation of radiation
US5489952A (en) * 1993-07-14 1996-02-06 Texas Instruments Incorporated Method and device for multi-format television
US5365283A (en) 1993-07-19 1994-11-15 Texas Instruments Incorporated Color phase control for projection display using spatial light modulator
US5457493A (en) 1993-09-15 1995-10-10 Texas Instruments Incorporated Digital micro-mirror based image simulation system
US5497197A (en) * 1993-11-04 1996-03-05 Texas Instruments Incorporated System and method for packaging data into video processor
US5452024A (en) 1993-11-01 1995-09-19 Texas Instruments Incorporated DMD display system
US5448314A (en) 1994-01-07 1995-09-05 Texas Instruments Method and apparatus for sequential color imaging
US5500761A (en) * 1994-01-27 1996-03-19 At&T Corp. Micromechanical modulator
US5444566A (en) 1994-03-07 1995-08-22 Texas Instruments Incorporated Optimized electronic operation of digital micromirror devices
US5729245A (en) * 1994-03-21 1998-03-17 Texas Instruments Incorporated Alignment for display having multiple spatial light modulators
US7460291B2 (en) * 1994-05-05 2008-12-02 Idc, Llc Separable modulator
US6040937A (en) * 1994-05-05 2000-03-21 Etalon, Inc. Interferometric modulation
US7550794B2 (en) * 2002-09-20 2009-06-23 Idc, Llc Micromechanical systems device comprising a displaceable electrode and a charge-trapping layer
US6680792B2 (en) * 1994-05-05 2004-01-20 Iridigm Display Corporation Interferometric modulation of radiation
US6710908B2 (en) * 1994-05-05 2004-03-23 Iridigm Display Corporation Controlling micro-electro-mechanical cavities
US5497172A (en) * 1994-06-13 1996-03-05 Texas Instruments Incorporated Pulse width modulation for spatial light modulator with split reset addressing
US5454906A (en) 1994-06-21 1995-10-03 Texas Instruments Inc. Method of providing sacrificial spacer for micro-mechanical devices
US5499062A (en) * 1994-06-23 1996-03-12 Texas Instruments Incorporated Multiplexed memory timing with block reset and secondary memory
JPH0815497A (ja) * 1994-06-29 1996-01-19 Hitachi Ltd 使用済燃料の貯蔵監視方法およびその貯蔵設備
US5619059A (en) * 1994-09-28 1997-04-08 National Research Council Of Canada Color deformable mirror device having optical thin film interference color coatings
US5610624A (en) * 1994-11-30 1997-03-11 Texas Instruments Incorporated Spatial light modulator with reduced possibility of an on state defect
US5610438A (en) * 1995-03-08 1997-03-11 Texas Instruments Incorporated Micro-mechanical device with non-evaporable getter
US5739945A (en) * 1995-09-29 1998-04-14 Tayebati; Parviz Electrically tunable optical filter utilizing a deformable multi-layer mirror
JP3799092B2 (ja) * 1995-12-29 2006-07-19 アジレント・テクノロジーズ・インク 光変調装置及びディスプレイ装置
US5710656A (en) * 1996-07-30 1998-01-20 Lucent Technologies Inc. Micromechanical optical modulator having a reduced-mass composite membrane
EP0877272B1 (en) * 1997-05-08 2002-07-31 Texas Instruments Incorporated Improvements in or relating to spatial light modulators
JP3897860B2 (ja) * 1997-07-11 2007-03-28 株式会社アルバック 密閉品のリークテスト方法
US6028690A (en) * 1997-11-26 2000-02-22 Texas Instruments Incorporated Reduced micromirror mirror gaps for improved contrast ratio
US6180428B1 (en) * 1997-12-12 2001-01-30 Xerox Corporation Monolithic scanning light emitting devices using micromachining
US6170319B1 (en) * 1998-03-31 2001-01-09 Betzdearborn Inc. Methods and apparatus for monitoring water process equipment
US6223586B1 (en) * 1998-12-23 2001-05-01 Visteon Global Technologies, Inc. Micro-electromechanical device inspection
US6233908B1 (en) * 1998-12-24 2001-05-22 Autoliv Asp, Inc. Method of introducing a leak trace material into an airbag inflator
US6286362B1 (en) * 1999-03-31 2001-09-11 Applied Materials, Inc. Dual mode leak detector
US6201633B1 (en) * 1999-06-07 2001-03-13 Xerox Corporation Micro-electromechanical based bistable color display sheets
US6862029B1 (en) * 1999-07-27 2005-03-01 Hewlett-Packard Development Company, L.P. Color display system
WO2003007049A1 (en) * 1999-10-05 2003-01-23 Iridigm Display Corporation Photonic mems and structures
US6674090B1 (en) * 1999-12-27 2004-01-06 Xerox Corporation Structure and method for planar lateral oxidation in active
US6853129B1 (en) * 2000-07-28 2005-02-08 Candescent Technologies Corporation Protected substrate structure for a field emission display device
US6859218B1 (en) * 2000-11-07 2005-02-22 Hewlett-Packard Development Company, L.P. Electronic display devices and methods
US6530264B1 (en) * 2000-11-16 2003-03-11 Autoliv Asp, Inc. Detection systems and methods
JP4409098B2 (ja) * 2001-01-09 2010-02-03 株式会社フクダ リークテストシステム及びリークテスト方法
SE518522C2 (sv) * 2001-03-21 2002-10-22 Sensistor Ab Metod och anordning vid täthetsprovning och läcksökning
JP3904933B2 (ja) * 2001-03-30 2007-04-11 日本碍子株式会社 欠陥を検出する検査方法及び検査装置
US6626027B1 (en) * 2001-06-12 2003-09-30 Intertech Development Company Method and apparatus for detecting a gas leak using nuclear magnetic resonance
EP1402277A2 (en) * 2001-06-19 2004-03-31 Koninklijke Philips Electronics N.V. Method and apparatus for leak-testing an electroluminescent device
US6862022B2 (en) * 2001-07-20 2005-03-01 Hewlett-Packard Development Company, L.P. Method and system for automatically selecting a vertical refresh rate for a video display monitor
US6870581B2 (en) * 2001-10-30 2005-03-22 Sharp Laboratories Of America, Inc. Single panel color video projection display using reflective banded color falling-raster illumination
US6553809B1 (en) * 2001-11-01 2003-04-29 Plastic Technologies, Inc. Method and apparatus for detecting holes in plastic containers
JP3698108B2 (ja) * 2002-02-20 2005-09-21 株式会社デンソー 気密漏れ検査方法及び装置
JP2004029553A (ja) * 2002-06-27 2004-01-29 Pioneer Electronic Corp 表示パネルの駆動装置
US6741377B2 (en) * 2002-07-02 2004-05-25 Iridigm Display Corporation Device having a light-absorbing mask and a method for fabricating same
US6742384B2 (en) * 2002-07-02 2004-06-01 Carrier Corporation Trace gas management system for leak detection operations
EP1540317A4 (en) * 2002-08-29 2010-06-30 Norcom Systems Inc SYSTEM AND PROCESS FOR DETECTING LEAKS IN SEALED ARTICLES
TW544787B (en) * 2002-09-18 2003-08-01 Promos Technologies Inc Method of forming self-aligned contact structure with locally etched gate conductive layer
JP2004184207A (ja) * 2002-12-03 2004-07-02 Toyota Motor Corp 漏洩ガス測定装置および漏洩ガス測定方法
US6763702B2 (en) * 2002-12-19 2004-07-20 Agilent Technologies, Inc. Method and apparatus for hermeticity determination and leak detection in semiconductor packaging
TWI289708B (en) * 2002-12-25 2007-11-11 Qualcomm Mems Technologies Inc Optical interference type color display
US6851316B2 (en) * 2003-01-27 2005-02-08 The Boc Group, Inc. Apparatus and method for recovery and recycle of tracer gas from leak testing process with randomly varying demand
US6829132B2 (en) * 2003-04-30 2004-12-07 Hewlett-Packard Development Company, L.P. Charge control of micro-electromechanical device
TW570896B (en) * 2003-05-26 2004-01-11 Prime View Int Co Ltd A method for fabricating an interference display cell
TW591716B (en) * 2003-05-26 2004-06-11 Prime View Int Co Ltd A structure of a structure release and manufacturing the same
JP4511543B2 (ja) * 2003-06-11 2010-07-28 バリアン・インコーポレイテッド 蓄積法による漏れ検出装置および方法
DE602004032333D1 (de) * 2003-06-11 2011-06-01 Agilent Technologies Inc Vorrichtung und verfahren zur detektion von grossen leckagen in abgedichteten gegenständen
US7190380B2 (en) * 2003-09-26 2007-03-13 Hewlett-Packard Development Company, L.P. Generating and displaying spatially offset sub-frames
US7173314B2 (en) * 2003-08-13 2007-02-06 Hewlett-Packard Development Company, L.P. Storage device having a probe and a storage cell with moveable parts
TWI305599B (en) * 2003-08-15 2009-01-21 Qualcomm Mems Technologies Inc Interference display panel and method thereof
TW200506479A (en) * 2003-08-15 2005-02-16 Prime View Int Co Ltd Color changeable pixel for an interference display
TWI251712B (en) * 2003-08-15 2006-03-21 Prime View Int Corp Ltd Interference display plate
TW593127B (en) * 2003-08-18 2004-06-21 Prime View Int Co Ltd Interference display plate and manufacturing method thereof
TWI231865B (en) * 2003-08-26 2005-05-01 Prime View Int Co Ltd An interference display cell and fabrication method thereof
US20050057442A1 (en) * 2003-08-28 2005-03-17 Olan Way Adjacent display of sequential sub-images
TWI232333B (en) * 2003-09-03 2005-05-11 Prime View Int Co Ltd Display unit using interferometric modulation and manufacturing method thereof
US6982820B2 (en) * 2003-09-26 2006-01-03 Prime View International Co., Ltd. Color changeable pixel
US20050068583A1 (en) * 2003-09-30 2005-03-31 Gutkowski Lawrence J. Organizing a digital image
US6861277B1 (en) * 2003-10-02 2005-03-01 Hewlett-Packard Development Company, L.P. Method of forming MEMS device
US7051577B2 (en) * 2003-12-12 2006-05-30 Radiaulics, Inc. Multi-functional leak detection instrument along with sensor mounting assembly and methodology utilizing the same
US6822742B1 (en) * 2003-12-19 2004-11-23 Eastman Kodak Company System and method for remote quantitative detection of fluid leaks from a natural gas or oil pipeline
US7327510B2 (en) * 2004-09-27 2008-02-05 Idc, Llc Process for modifying offset voltage characteristics of an interferometric modulator
US20070080695A1 (en) * 2005-10-11 2007-04-12 Morrell Gary A Testing system and method for a MEMS sensor

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CA2512922A1 (en) 2006-03-27
TW200628775A (en) 2006-08-16
EP1640698A2 (en) 2006-03-29
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AU2005203231A1 (en) 2006-04-13
US7299681B2 (en) 2007-11-27
EP1640698A3 (en) 2006-10-04
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US20080066524A1 (en) 2008-03-20
JP2006091004A (ja) 2006-04-06

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