MX361240B - Dispositivo óptico computacional que tiene un detector con estructura no plana de semiconductor. - Google Patents

Dispositivo óptico computacional que tiene un detector con estructura no plana de semiconductor.

Info

Publication number
MX361240B
MX361240B MX2016006381A MX2016006381A MX361240B MX 361240 B MX361240 B MX 361240B MX 2016006381 A MX2016006381 A MX 2016006381A MX 2016006381 A MX2016006381 A MX 2016006381A MX 361240 B MX361240 B MX 361240B
Authority
MX
Mexico
Prior art keywords
detector
computing device
semiconductor structure
optical computing
planar semiconductor
Prior art date
Application number
MX2016006381A
Other languages
English (en)
Other versions
MX2016006381A (es
Inventor
Gao Li
M Price James
l perkins David
Original Assignee
Halliburton Energy Services Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Halliburton Energy Services Inc filed Critical Halliburton Energy Services Inc
Publication of MX2016006381A publication Critical patent/MX2016006381A/es
Publication of MX361240B publication Critical patent/MX361240B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/26—Oils; viscous liquids; paints; inks
    • G01N33/28—Oils, i.e. hydrocarbon liquids
    • G01N33/2823—Oils, i.e. hydrocarbon liquids raw oil, drilling fluid or polyphasic mixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06E—OPTICAL COMPUTING DEVICES; COMPUTING DEVICES USING OTHER RADIATIONS WITH SIMILAR PROPERTIES
    • G06E3/00—Devices not provided for in group G06E1/00, e.g. for processing analogue or hybrid data
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1213—Filters in general, e.g. dichroic, band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1282—Spectrum tailoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters

Abstract

Se proporciona un dispositivo óptico computacional que incluye un detector que tiene una estructura no plana de semiconductor. El detector puede incluir una o más estructuras que tienen características de estructura que pueden optimizarse para responder a longitudes de onda predeterminadas, y para ponderarlas, de luz irradiada de una muestra, que están relacionadas con características de la muestra. El detector puede incluir una matriz de una o más estructuras, donde cada una de las unidades estructurales pueden dirigirse individualmente para programar o ajustar el detector para responder a espectros de luz y para ponderarlos, y para generar una señal de salida basada en los espectros ponderados de luz que es proporcional a las características de la muestra.
MX2016006381A 2013-12-18 2013-12-18 Dispositivo óptico computacional que tiene un detector con estructura no plana de semiconductor. MX361240B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2013/076249 WO2015094247A1 (en) 2013-12-18 2013-12-18 Optical computing device having detector with non-planar semiconductor structure

Publications (2)

Publication Number Publication Date
MX2016006381A MX2016006381A (es) 2016-08-01
MX361240B true MX361240B (es) 2018-11-30

Family

ID=53403352

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016006381A MX361240B (es) 2013-12-18 2013-12-18 Dispositivo óptico computacional que tiene un detector con estructura no plana de semiconductor.

Country Status (4)

Country Link
US (1) US9983186B2 (es)
EP (1) EP3058433A4 (es)
MX (1) MX361240B (es)
WO (1) WO2015094247A1 (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3055673A1 (en) * 2013-12-20 2016-08-17 Halliburton Energy Services, Inc. Parallel Optical Thin Film Measurement System for Analyzing Multianalytes
US11079318B2 (en) * 2016-03-10 2021-08-03 Todos Technologies Ltd. Gas sensing device and a method for sensing gas
FR3055703B1 (fr) * 2016-09-05 2020-12-18 Elichens Procede d’analyse d’un gaz
EP3472434A1 (en) * 2016-09-22 2019-04-24 Halliburton Energy Services, Inc. Dual integrated computational element device and method for fabricating the same
US11287368B2 (en) 2018-07-13 2022-03-29 Halliburton Energy Services, Inc. Thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems
WO2024064313A1 (en) * 2022-09-22 2024-03-28 Schlumberger Technology Corporation Carbonates characterization via diffuse reflection infrared measurement

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Publication number Priority date Publication date Assignee Title
US5784507A (en) 1991-04-05 1998-07-21 Holm-Kennedy; James W. Integrated optical wavelength discrimination devices and methods for fabricating same
US6383251B1 (en) * 1997-08-22 2002-05-07 William Lyon Sherwood Direct iron and steelmaking
US6388251B1 (en) * 1999-01-12 2002-05-14 Baker Hughes, Inc. Optical probe for analysis of formation fluids
TWI227799B (en) * 2000-12-29 2005-02-11 Honeywell Int Inc Resonant reflector for increased wavelength and polarization control
US7075954B2 (en) * 2001-05-29 2006-07-11 Nl Nanosemiconductor Gmbh Intelligent wavelength division multiplexing systems based on arrays of wavelength tunable lasers and wavelength tunable resonant photodetectors
US7015457B2 (en) * 2002-03-18 2006-03-21 Honeywell International Inc. Spectrally tunable detector
US7196790B2 (en) * 2002-03-18 2007-03-27 Honeywell International Inc. Multiple wavelength spectrometer
US7061618B2 (en) * 2003-10-17 2006-06-13 Axsun Technologies, Inc. Integrated spectroscopy system
US7408645B2 (en) * 2003-11-10 2008-08-05 Baker Hughes Incorporated Method and apparatus for a downhole spectrometer based on tunable optical filters
US7230710B2 (en) * 2004-12-21 2007-06-12 Axsun Technologies, Inc. Polarization controlling fiber probe for semiconductor source spectroscopy system
GB2447925B (en) * 2007-03-28 2010-04-07 Internat Moisture Analysers Ltd Fluid detector
US7759644B2 (en) * 2008-03-18 2010-07-20 Drs Rsta, Inc. Spectrally tunable infrared image sensor having multi-band stacked detectors
FR2983953B1 (fr) * 2011-12-09 2014-01-03 Commissariat Energie Atomique Detecteur bolometrique d'un rayonnement electromagnetique dans le domaine du terahertz et dispositif de detection matriciel comportant de tels detecteurs
US8912477B2 (en) * 2012-04-26 2014-12-16 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US8829633B2 (en) * 2012-05-03 2014-09-09 The Board Of Trustees Of The Leland Stanford Junior University Self-aligned semiconductor ridges in metallic slits as a platform for planar tunable nanoscale resonant photodetectors

Also Published As

Publication number Publication date
MX2016006381A (es) 2016-08-01
EP3058433A4 (en) 2017-08-02
EP3058433A1 (en) 2016-08-24
US20160274077A1 (en) 2016-09-22
US9983186B2 (en) 2018-05-29
WO2015094247A1 (en) 2015-06-25

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