MX2016006381A - Dispositivo optico computacional que tiene un detector con estructura no plana de semiconductor. - Google Patents
Dispositivo optico computacional que tiene un detector con estructura no plana de semiconductor.Info
- Publication number
- MX2016006381A MX2016006381A MX2016006381A MX2016006381A MX2016006381A MX 2016006381 A MX2016006381 A MX 2016006381A MX 2016006381 A MX2016006381 A MX 2016006381A MX 2016006381 A MX2016006381 A MX 2016006381A MX 2016006381 A MX2016006381 A MX 2016006381A
- Authority
- MX
- Mexico
- Prior art keywords
- detector
- computing device
- semiconductor structure
- optical computing
- planar semiconductor
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000001228 spectrum Methods 0.000 abstract 2
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/26—Oils; Viscous liquids; Paints; Inks
- G01N33/28—Oils, i.e. hydrocarbon liquids
- G01N33/2823—Raw oil, drilling fluid or polyphasic mixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06E—OPTICAL COMPUTING DEVICES; COMPUTING DEVICES USING OTHER RADIATIONS WITH SIMILAR PROPERTIES
- G06E3/00—Devices not provided for in group G06E1/00, e.g. for processing analogue or hybrid data
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1213—Filters in general, e.g. dichroic, band
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1282—Spectrum tailoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Theoretical Computer Science (AREA)
- Food Science & Technology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Medicinal Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Se proporciona un dispositivo óptico computacional que incluye un detector que tiene una estructura no plana de semiconductor. El detector puede incluir una o más estructuras que tienen características de estructura que pueden optimizarse para responder a longitudes de onda predeterminadas, y para ponderarlas, de luz irradiada de una muestra, que están relacionadas con características de la muestra. El detector puede incluir una matriz de una o más estructuras, donde cada una de las unidades estructurales pueden dirigirse individualmente para programar o ajustar el detector para responder a espectros de luz y para ponderarlos, y para generar una señal de salida basada en los espectros ponderados de luz que es proporcional a las características de la muestra.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2013/076249 WO2015094247A1 (en) | 2013-12-18 | 2013-12-18 | Optical computing device having detector with non-planar semiconductor structure |
Publications (2)
Publication Number | Publication Date |
---|---|
MX2016006381A true MX2016006381A (es) | 2016-08-01 |
MX361240B MX361240B (es) | 2018-11-30 |
Family
ID=53403352
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2016006381A MX361240B (es) | 2013-12-18 | 2013-12-18 | Dispositivo óptico computacional que tiene un detector con estructura no plana de semiconductor. |
Country Status (4)
Country | Link |
---|---|
US (1) | US9983186B2 (es) |
EP (1) | EP3058433A4 (es) |
MX (1) | MX361240B (es) |
WO (1) | WO2015094247A1 (es) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9784671B2 (en) * | 2013-12-20 | 2017-10-10 | Halliburton Energy Services, Inc. | Parallel optical thin film measurement system for analyzing multianalytes |
CN110036277B (zh) * | 2016-03-10 | 2022-01-28 | 技术研究和发展基金有限公司 | 一种气体传感装置及一种气体感测方法 |
FR3055703B1 (fr) * | 2016-09-05 | 2020-12-18 | Elichens | Procede d’analyse d’un gaz |
EP3472434A1 (en) * | 2016-09-22 | 2019-04-24 | Halliburton Energy Services, Inc. | Dual integrated computational element device and method for fabricating the same |
WO2020013865A1 (en) * | 2018-07-13 | 2020-01-16 | Halliburton Energy Services, Inc. | Thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems |
WO2024064313A1 (en) * | 2022-09-22 | 2024-03-28 | Schlumberger Technology Corporation | Carbonates characterization via diffuse reflection infrared measurement |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5784507A (en) | 1991-04-05 | 1998-07-21 | Holm-Kennedy; James W. | Integrated optical wavelength discrimination devices and methods for fabricating same |
US6383251B1 (en) * | 1997-08-22 | 2002-05-07 | William Lyon Sherwood | Direct iron and steelmaking |
US6388251B1 (en) * | 1999-01-12 | 2002-05-14 | Baker Hughes, Inc. | Optical probe for analysis of formation fluids |
TWI227799B (en) * | 2000-12-29 | 2005-02-11 | Honeywell Int Inc | Resonant reflector for increased wavelength and polarization control |
US7075954B2 (en) * | 2001-05-29 | 2006-07-11 | Nl Nanosemiconductor Gmbh | Intelligent wavelength division multiplexing systems based on arrays of wavelength tunable lasers and wavelength tunable resonant photodetectors |
US7015457B2 (en) * | 2002-03-18 | 2006-03-21 | Honeywell International Inc. | Spectrally tunable detector |
US7196790B2 (en) * | 2002-03-18 | 2007-03-27 | Honeywell International Inc. | Multiple wavelength spectrometer |
US7061618B2 (en) * | 2003-10-17 | 2006-06-13 | Axsun Technologies, Inc. | Integrated spectroscopy system |
US7408645B2 (en) * | 2003-11-10 | 2008-08-05 | Baker Hughes Incorporated | Method and apparatus for a downhole spectrometer based on tunable optical filters |
US7230710B2 (en) * | 2004-12-21 | 2007-06-12 | Axsun Technologies, Inc. | Polarization controlling fiber probe for semiconductor source spectroscopy system |
GB2447925B (en) * | 2007-03-28 | 2010-04-07 | Internat Moisture Analysers Ltd | Fluid detector |
US7759644B2 (en) * | 2008-03-18 | 2010-07-20 | Drs Rsta, Inc. | Spectrally tunable infrared image sensor having multi-band stacked detectors |
FR2983953B1 (fr) * | 2011-12-09 | 2014-01-03 | Commissariat Energie Atomique | Detecteur bolometrique d'un rayonnement electromagnetique dans le domaine du terahertz et dispositif de detection matriciel comportant de tels detecteurs |
US8912477B2 (en) * | 2012-04-26 | 2014-12-16 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US8829633B2 (en) * | 2012-05-03 | 2014-09-09 | The Board Of Trustees Of The Leland Stanford Junior University | Self-aligned semiconductor ridges in metallic slits as a platform for planar tunable nanoscale resonant photodetectors |
-
2013
- 2013-12-18 EP EP13899927.1A patent/EP3058433A4/en not_active Withdrawn
- 2013-12-18 WO PCT/US2013/076249 patent/WO2015094247A1/en active Application Filing
- 2013-12-18 US US15/031,201 patent/US9983186B2/en active Active
- 2013-12-18 MX MX2016006381A patent/MX361240B/es active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP3058433A4 (en) | 2017-08-02 |
WO2015094247A1 (en) | 2015-06-25 |
US20160274077A1 (en) | 2016-09-22 |
US9983186B2 (en) | 2018-05-29 |
MX361240B (es) | 2018-11-30 |
EP3058433A1 (en) | 2016-08-24 |
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