MX2023006520A - Aparato de contacto individual para un dispositivo de prueba para verificar la continuidad de un conector, y dispositivo de prueba. - Google Patents

Aparato de contacto individual para un dispositivo de prueba para verificar la continuidad de un conector, y dispositivo de prueba.

Info

Publication number
MX2023006520A
MX2023006520A MX2023006520A MX2023006520A MX2023006520A MX 2023006520 A MX2023006520 A MX 2023006520A MX 2023006520 A MX2023006520 A MX 2023006520A MX 2023006520 A MX2023006520 A MX 2023006520A MX 2023006520 A MX2023006520 A MX 2023006520A
Authority
MX
Mexico
Prior art keywords
testing device
connector
contacting apparatus
individually contacting
contact pin
Prior art date
Application number
MX2023006520A
Other languages
English (en)
Inventor
Magdalena Reiter
Manuel Kagerhuber
Original Assignee
Draexlmaier Lisa Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Draexlmaier Lisa Gmbh filed Critical Draexlmaier Lisa Gmbh
Publication of MX2023006520A publication Critical patent/MX2023006520A/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

La presente invención se refiere a un aparato de contacto individual (100) para un dispositivo de prueba (500) para probar la continuidad de un conector (200), en el que el aparato de contacto individual (100) comprende una patilla de contacto (102) para colocar sobre un elemento de contacto (400) del conector (200) a contactarse y un aditamento de centrado principal (104) para la patilla de contacto (102), en el que la patilla de contacto (102) es eléctricamente conductora y montada sobre resortes en una dirección de colocación, y el aditamento de centrado (104) se monta móvilmente sobre resortes coaxialmente a la patilla de contacto (102).
MX2023006520A 2020-12-16 2021-11-08 Aparato de contacto individual para un dispositivo de prueba para verificar la continuidad de un conector, y dispositivo de prueba. MX2023006520A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102020133736.1A DE102020133736B3 (de) 2020-12-16 2020-12-16 Einzelkontaktierungseinrichtung für eine prüfvorrichtung zum durchgangsprüfen eines steckverbinders und prüfvorrichtung
PCT/EP2021/080857 WO2022128253A1 (de) 2020-12-16 2021-11-08 Einzelkontaktierungseinrichtung für eine prüfvorrichtung zum durchgangsprüfen eines steckverbinders und prüfvorrichtung

Publications (1)

Publication Number Publication Date
MX2023006520A true MX2023006520A (es) 2023-06-23

Family

ID=78649276

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2023006520A MX2023006520A (es) 2020-12-16 2021-11-08 Aparato de contacto individual para un dispositivo de prueba para verificar la continuidad de un conector, y dispositivo de prueba.

Country Status (5)

Country Link
EP (1) EP4264287A1 (es)
CN (1) CN116601510A (es)
DE (1) DE102020133736B3 (es)
MX (1) MX2023006520A (es)
WO (1) WO2022128253A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202022101235U1 (de) 2022-03-07 2023-06-19 PTR HARTMANN GmbH Federkontaktstift

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006025850B3 (de) * 2006-06-02 2007-09-20 TSK Prüfsysteme GmbH Prüfstift für eine Prüfvorrichtung zum Prüfen von Stecken und Verfahren zum Prüfen von Steckern
US10451672B2 (en) 2015-04-24 2019-10-22 Telefonaktiebolaget Lm Ericsson (Publ) Probing apparatus for tapping electric signals generated by a device-under-test
DE202015105358U1 (de) 2015-10-09 2016-01-08 Md Elektronik Gmbh Elektrischer Prüfstift
JP7243738B2 (ja) * 2018-11-29 2023-03-22 株式会社村田製作所 プローブ嵌合構造
DE102019108831B3 (de) 2019-04-04 2020-08-20 Lisa Dräxlmaier GmbH Kontaktstift und prüfadapter zum überprüfen eines elektrischen steckverbinders

Also Published As

Publication number Publication date
EP4264287A1 (de) 2023-10-25
WO2022128253A1 (de) 2022-06-23
DE102020133736B3 (de) 2022-04-28
CN116601510A (zh) 2023-08-15

Similar Documents

Publication Publication Date Title
TW200706880A (en) Microstructure probe card, and microstructure inspecting device, method, and computer program
TW200600795A (en) Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
MY192337A (en) Test socket assembly
WO2011082180A3 (en) Test systems and methods for testing electronic devices
ATE371196T1 (de) Vorrichtung für eine schnittstelle zwischen elektronischen gehäusen und testgeräten
TW200741210A (en) Electronic device test set and contact used therein
MX2023006520A (es) Aparato de contacto individual para un dispositivo de prueba para verificar la continuidad de un conector, y dispositivo de prueba.
DE50006191D1 (de) Vorrichtung zum testen von leiterplatten
MY200160A (en) Probe card for a testing apparatus of electronic devices
SG195107A1 (en) An electrical interconnect assembly
KR20070056147A (ko) 검사 방법 및 검사 장치
WO2018140148A3 (en) Verifying structural integrity of materials
CN109782035B (zh) 具有供电保护装置的检测治具
CN103149105B (zh) 一种测试弹性带材抗应力松驰的装置与方法
KR20150019283A (ko) 신호특성이 강화된 프로브핀
SG10201901455XA (en) Contactor socket and ic test apparatus
DE3682513D1 (de) Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten.
EP3715863A3 (de) Testvorrichtung zum testen elektrischer bauteile, verwendung der testvorrichtung zum testen eines elektrischen bauteils und verfahren zum testen elektrischer bauteile mittels der testvorrichtung
JPH0346462Y2 (es)
TW200716994A (en) Circuit board inspecting apparatus and circuit board inspecting method
TW200710404A (en) Testing device
CN204666778U (zh) 一种石英晶体谐振器精准测试装置
CN106707090A (zh) 一种终端壳体弹片导通测试装置
CN206757029U (zh) 接线端子
KR100765490B1 (ko) Pcb 전극판