MX2021011409A - Metodos y sistemas para controlar el amperaje de salida. - Google Patents

Metodos y sistemas para controlar el amperaje de salida.

Info

Publication number
MX2021011409A
MX2021011409A MX2021011409A MX2021011409A MX2021011409A MX 2021011409 A MX2021011409 A MX 2021011409A MX 2021011409 A MX2021011409 A MX 2021011409A MX 2021011409 A MX2021011409 A MX 2021011409A MX 2021011409 A MX2021011409 A MX 2021011409A
Authority
MX
Mexico
Prior art keywords
amperage
output
current
signal
plc
Prior art date
Application number
MX2021011409A
Other languages
English (en)
Inventor
Justin J Stewart
Original Assignee
Illinois Tool Works
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Illinois Tool Works filed Critical Illinois Tool Works
Publication of MX2021011409A publication Critical patent/MX2021011409A/es

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
    • G05B19/058—Safety, monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G01N27/84—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields by applying magnetic powder or magnetic ink

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Automation & Control Theory (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Programmable Controllers (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

Se proporciona una descripción para un sistema de inspección de partículas magnéticas configurado para generar un campo magnético para la inspección de una pieza, que comprende un controlador lógico programable (PLC), una fuente de corriente y un dispositivo de detección de corriente. El PLC puede configurarse para comunicar una señal de amperaje, para el amperaje de una corriente de salida, a una fuente de corriente, y comunicar una primera señal a la fuente de corriente para dar salida a la corriente de salida. La fuente de corriente puede configurarse para ajustar el amperaje de la corriente de salida en función de la señal de amperaje y emitir la corriente de salida al recibir la primera señal. El dispositivo de detección de corriente puede configurarse para medir un amperaje de salida de la corriente de salida y comunicar información de amperaje con base en el amperaje de salida a un dispositivo de conversión de señal. El PLC puede, en respuesta a la retroalimentación del dispositivo de conversión de señal, actualizar la señal de amperaje.
MX2021011409A 2019-03-29 2020-03-27 Metodos y sistemas para controlar el amperaje de salida. MX2021011409A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962825902P 2019-03-29 2019-03-29
US16/830,358 US11300544B2 (en) 2019-03-29 2020-03-26 Methods and systems for controlling output amperage
PCT/US2020/025115 WO2020205466A1 (en) 2019-03-29 2020-03-27 Methods and systems for controlling output amperage

Publications (1)

Publication Number Publication Date
MX2021011409A true MX2021011409A (es) 2021-10-13

Family

ID=72605765

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2021011409A MX2021011409A (es) 2019-03-29 2020-03-27 Metodos y sistemas para controlar el amperaje de salida.

Country Status (8)

Country Link
US (1) US11300544B2 (es)
EP (2) EP4395177A3 (es)
JP (1) JP7514857B2 (es)
KR (1) KR20210146377A (es)
CN (1) CN114026512B (es)
CA (1) CA3134133A1 (es)
MX (1) MX2021011409A (es)
WO (1) WO2020205466A1 (es)

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4502004A (en) 1980-06-30 1985-02-26 Schindler John A Current pulse monitor
US4443759A (en) * 1981-05-07 1984-04-17 Magnaflux Corporation Magnetizing current supply for magnetic particle inspection with SCR's connected to three-phase secondary windings for rectification and control
US5534775A (en) * 1993-03-16 1996-07-09 Ico, Inc. Method and apparatus for noncontact magnetic particle stray magnetic flux testing of cylindrical members
JPH06281626A (ja) * 1993-03-26 1994-10-07 Nippon Steel Corp 磁粉探傷方法
JPH0854375A (ja) * 1994-08-11 1996-02-27 Kaisei Enjinia Kk 電磁誘導型検査装置
JP4046392B2 (ja) * 1997-12-02 2008-02-13 日本電磁測器株式会社 磁粉探傷用磁化装置
CN2826426Y (zh) 2005-10-13 2006-10-11 曾德文 磁粉探伤电流的控制装置
CN100424504C (zh) * 2005-10-13 2008-10-08 曾德文 磁粉探伤电流的控制方法及其装置
US8945946B2 (en) * 2006-03-31 2015-02-03 Canon Kabushiki Kaisha Sensor element and detection method of magnetic particles using this element, and detection method of target substance
US7821220B2 (en) * 2006-09-29 2010-10-26 Rockwell Automation Technologies, Inc. Motor having integral programmable logic controller
US8108168B2 (en) * 2009-03-12 2012-01-31 Etegent Technologies, Ltd. Managing non-destructive evaluation data
US9530008B2 (en) * 2013-05-29 2016-12-27 Infineon Technologies Ag System and method for a processing device with a priority interrupt
CN103323521B (zh) 2013-05-31 2016-09-21 中国一拖集团有限公司 一种具备交直流纵向闭路磁化功能的配置方法及探伤机
CN104931578B (zh) 2015-06-04 2018-07-31 上海平野磁气有限公司 多工位曲轴磁粉探伤机
CN105866242A (zh) 2016-06-22 2016-08-17 中国人民解放军海军航空工程学院青岛校区 智能磁粉探伤机

Also Published As

Publication number Publication date
CN114026512A (zh) 2022-02-08
WO2020205466A1 (en) 2020-10-08
CA3134133A1 (en) 2020-10-08
EP3948461A1 (en) 2022-02-09
US20200309736A1 (en) 2020-10-01
JP2022527106A (ja) 2022-05-30
JP7514857B2 (ja) 2024-07-11
CN114026512B (zh) 2024-09-27
EP4395177A2 (en) 2024-07-03
US11300544B2 (en) 2022-04-12
EP4395177A3 (en) 2024-10-02
KR20210146377A (ko) 2021-12-03

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