MX2019009399A - Procedimiento, un probador todo en uno y producto de programa informatico. - Google Patents

Procedimiento, un probador todo en uno y producto de programa informatico.

Info

Publication number
MX2019009399A
MX2019009399A MX2019009399A MX2019009399A MX2019009399A MX 2019009399 A MX2019009399 A MX 2019009399A MX 2019009399 A MX2019009399 A MX 2019009399A MX 2019009399 A MX2019009399 A MX 2019009399A MX 2019009399 A MX2019009399 A MX 2019009399A
Authority
MX
Mexico
Prior art keywords
computer program
tester
program product
frame
testing apparatus
Prior art date
Application number
MX2019009399A
Other languages
English (en)
Inventor
LEINONEN Natalia
Mantere Petri
Ryynänen Kalle
Piililä Joni
Toivakka Mika
Original Assignee
Optofidelity Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optofidelity Oy filed Critical Optofidelity Oy
Publication of MX2019009399A publication Critical patent/MX2019009399A/es

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00Subject matter not provided for in other groups of this subclass
    • G01M99/005Testing of complete machines, e.g. washing-machines or mobile phones
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268Logging of test results
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • G06F11/2733Test interface between tester and unit under test
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/3089Monitoring arrangements determined by the means or processing involved in sensing the monitored data, e.g. interfaces, connectors, sensors, probes, agents
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/34Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3466Performance evaluation by tracing or monitoring
    • G06F11/3495Performance evaluation by tracing or monitoring for systems
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M1/00Substation equipment, e.g. for use by subscribers
    • H04M1/24Arrangements for testing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management

Abstract

Se divulgan varios procedimientos, aparatos y productos de programas informáticos para un aparato de pruebas. De acuerdo con una realización, el aparato de pruebas comprende un bastidor; un cabezal de sujeción para sujetar un dispositivo para ser probado; un primer elemento de movimiento para mover el cabezal de sujeción con respecto al bastidor; un detector de movimiento para detectar al menos una de una ubicación y una posición del dispositivo; un elemento de contacto para tocar el dispositivo; un dispositivo de formación de imágenes para capturar imágenes del dispositivo; una pantalla para generar información visual para capturar mediante el dispositivo; un conjunto de sensores para examinar las operaciones del dispositivo; un conjunto de actuadores para proporcionar señales para la recepción mediante el dispositivo; y un conjunto de enchufes adaptados para ser insertados en un zócalo del dispositivo.
MX2019009399A 2017-02-10 2017-12-18 Procedimiento, un probador todo en uno y producto de programa informatico. MX2019009399A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762457243P 2017-02-10 2017-02-10
PCT/FI2017/050905 WO2018146374A1 (en) 2017-02-10 2017-12-18 Method, an all-in-one tester and computer program product

Publications (1)

Publication Number Publication Date
MX2019009399A true MX2019009399A (es) 2019-11-05

Family

ID=63107280

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2019009399A MX2019009399A (es) 2017-02-10 2017-12-18 Procedimiento, un probador todo en uno y producto de programa informatico.

Country Status (5)

Country Link
US (2) US11481295B2 (es)
EP (1) EP3580658A4 (es)
CN (1) CN110383253A (es)
MX (1) MX2019009399A (es)
WO (1) WO2018146374A1 (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7438181B2 (ja) 2019-02-12 2024-02-26 エコエーティーエム, エルエルシー 使用済み電子デバイスを評価および購入するためのキオスク
AU2020222971A1 (en) 2019-02-12 2021-09-23 Ecoatm, Llc Connector carrier for electronic device kiosk
EP3928254A1 (en) 2019-02-18 2021-12-29 ecoATM, LLC Neural network based physical condition evaluation of electronic devices, and associated systems and methods
WO2022022757A1 (en) 2020-07-27 2022-02-03 Y Soft Corporation, A.S. A method for testing an embedded system of a device, a method for identifying a state of the device and a system for these methods
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
CN113204205A (zh) * 2021-04-08 2021-08-03 北京首钢自动化信息技术有限公司 一种智能夹钳调试装置及系统

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2013403A (en) * 1932-10-20 1935-09-03 Cameron Can Machinery Co Can testing apparatus
WO1997005496A1 (fr) * 1995-07-28 1997-02-13 Advantest Corporation Testeur de dispositif a semiconducteur et systeme de test de dispositif a semiconducteur comportant plusieurs testeurs
US5654631A (en) * 1995-11-15 1997-08-05 Xilinx, Inc. Vacuum lock handler and tester interface for semiconductor devices
JP3417528B2 (ja) * 1996-04-05 2003-06-16 株式会社アドバンテスト Ic試験装置
US6255124B1 (en) * 1999-02-08 2001-07-03 Advanced Micro Devices Test arrangement and method for thinned flip chip IC
US6812718B1 (en) * 1999-05-27 2004-11-02 Nanonexus, Inc. Massively parallel interface for electronic circuits
US6515750B1 (en) * 1999-08-25 2003-02-04 Zygo Corporation Interferometric system for and method of testing and characterizing micro-optic components
US6500699B1 (en) * 2000-07-11 2002-12-31 Advanced Micro Devices, Inc. Test fixture for future integration
US7272752B2 (en) * 2001-09-05 2007-09-18 International Business Machines Corporation Method and system for integrating test coverage measurements with model based test generation
US7299451B2 (en) * 2002-01-24 2007-11-20 International Business Machines Corporation Remotely driven system for multi-product and multi-platform testing
ITRE20020070A1 (it) 2002-09-19 2004-03-20 Gianbon Srl Dispositivo di presa per prodotti da affettare automaticamente.
WO2004106953A1 (ja) * 2003-05-30 2004-12-09 Advantest Corporation 電子部品試験装置
US7278056B2 (en) * 2004-06-09 2007-10-02 International Business Machines Corporation Methods, systems, and media for management of functional verification
EP1913506A4 (en) * 2005-07-11 2008-08-13 Brooks Automation Inc INTELLIGENT STATUS MONITORING AND TROUBLESHOOTING SYSTEM FOR PREDICTIVE MAINTENANCE
US9104650B2 (en) * 2005-07-11 2015-08-11 Brooks Automation, Inc. Intelligent condition monitoring and fault diagnostic system for preventative maintenance
US20070168734A1 (en) * 2005-11-17 2007-07-19 Phil Vasile Apparatus, system, and method for persistent testing with progressive environment sterilzation
US8473913B2 (en) * 2006-01-11 2013-06-25 Hitachi Data Systems Corporation Method of and system for dynamic automated test case generation and execution
TW200729374A (en) * 2006-01-26 2007-08-01 Horng Terng Automation Co Ltd Method of testing semiconductor device under stable pressure and apparatus for test the same under stable pressure
ITBO20070386A1 (it) * 2007-05-31 2008-12-01 Sacmi Unita' per la presa di manufatti ceramici od assimilabili.
US7725772B2 (en) * 2007-07-18 2010-05-25 Novell, Inc. Generic template to autogenerate reports for software target testing
US20090307763A1 (en) * 2008-06-05 2009-12-10 Fiberlink Communications Corporation Automated Test Management System and Method
US8774793B2 (en) * 2008-06-13 2014-07-08 Jot Automation, Ltd. Systems and methods of providing intelligent handset testing
US8719776B2 (en) * 2009-12-30 2014-05-06 Foneclay, Inc. System for creation and distribution of software applications usable on multiple mobile device platforms
CN102237842A (zh) * 2010-04-23 2011-11-09 鸿富锦精密工业(深圳)有限公司 磁场产生及控制电路
US8635092B2 (en) * 2010-06-02 2014-01-21 Asurion, Llc Method for offering a protection policy for a mobile device
US20120053805A1 (en) * 2010-08-30 2012-03-01 The University Of North Texas Methods for detection of driving conditions and habits
CN102905034B (zh) * 2011-07-29 2017-04-12 富泰华工业(深圳)有限公司 电子设备测试系统及其测试方法
AU2011374152B2 (en) * 2011-08-04 2016-07-21 Google Llc Moving direction determination with noisy signals from inertial navigation systems on mobile devices
CA2853349A1 (en) * 2011-10-25 2013-05-02 ecoATM, Inc. Method and apparatus for recycling electronic devices
TW201338571A (zh) * 2012-03-06 2013-09-16 Askey Technology Jiangsu Ltd 聲音品質檢測裝置
US9201763B1 (en) * 2013-05-31 2015-12-01 The Mathworks, Inc. Efficient sharing of test fixtures and ordering of test suites
WO2015059508A1 (en) * 2013-10-24 2015-04-30 Teleplan Technology B.V. Method and apparatus for testing cell phones
KR20170078594A (ko) * 2014-11-05 2017-07-07 라스코 게엠베하 복수의 발광장치들의 전기적 및 광학적 파라미터를 테스트하기 위한 방법 및 어셈블리
US9948411B2 (en) * 2014-12-05 2018-04-17 W2Bi, Inc. Smart box for automatic feature testing of smart phones and other devices
US9283672B1 (en) * 2014-12-11 2016-03-15 Apkudo, Llc Robotic testing device and method for more closely emulating human movements during robotic testing of mobile devices
US11004042B2 (en) * 2015-05-10 2021-05-11 Ramzi Khalil Maalouf Device for mechanized automation of diagnostics and upgrades for portable multifunction devices
CN204741458U (zh) 2015-07-06 2015-11-04 深圳市德富莱自动化设备有限公司 手机天线测试装置
US9798314B2 (en) * 2015-08-19 2017-10-24 Fmr Llc Intelligent mobile device test fixture
US10852321B2 (en) * 2016-08-19 2020-12-01 Delta Design, Inc. Test handler head having reverse funnel design
US10140539B2 (en) * 2016-09-23 2018-11-27 Optofidelity Oy Calibration device for camera-finger—offset

Also Published As

Publication number Publication date
US11481295B2 (en) 2022-10-25
EP3580658A4 (en) 2020-12-30
CN110383253A (zh) 2019-10-25
EP3580658A1 (en) 2019-12-18
US20220342785A1 (en) 2022-10-27
US20200065205A1 (en) 2020-02-27
WO2018146374A1 (en) 2018-08-16

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