MX2016009200A - Diseños mejorados para elementos informaticos integrados. - Google Patents
Diseños mejorados para elementos informaticos integrados.Info
- Publication number
- MX2016009200A MX2016009200A MX2016009200A MX2016009200A MX2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A MX 2016009200 A MX2016009200 A MX 2016009200A
- Authority
- MX
- Mexico
- Prior art keywords
- thin film
- optical
- refractive index
- integrated computational
- film layer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/129—Using chemometrical methods
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Laminated Bodies (AREA)
- Optical Integrated Circuits (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Se describen mejores elementos informáticos integrados para uso en dispositivos informático ópticos. Un elemento informático integrado incluye un sustrato óptico, una primera y segunda pluralidad de capas de película óptica fina depositadas de forma alternativa en el sustrato óptico para formar una pila de películas finas, donde cada capa de película óptica fina de la primera pluralidad presenta un primer índice refractario y cada capa de película óptica fina de la segunda pluralidad presenta un segundo índice refractario diferente al primer índice refractario, y al menos una capa de película óptica fina adicional colocada en o sobre la pila de películas finas y en comunicación óptica con al menos una de las capas de película óptica fina de la primera y la segunda pluralidad, donde al menos una capa de película óptica fina adicional presenta un tercer índice refractario diferente al primer y el segundo índice refractario.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2014/017309 WO2015126396A1 (en) | 2014-02-20 | 2014-02-20 | Improved designs for integrated computational elements |
Publications (2)
Publication Number | Publication Date |
---|---|
MX2016009200A true MX2016009200A (es) | 2016-10-03 |
MX359910B MX359910B (es) | 2018-10-16 |
Family
ID=53878722
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2016009200A MX359910B (es) | 2014-02-20 | 2014-02-20 | Diseños mejorados para elementos informaticos integrados. |
Country Status (5)
Country | Link |
---|---|
US (1) | US9733183B2 (es) |
EP (1) | EP3069121A1 (es) |
BR (1) | BR112016012481B1 (es) |
MX (1) | MX359910B (es) |
WO (1) | WO2015126396A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BR112016012481B1 (pt) | 2014-02-20 | 2022-05-10 | Halliburton Energy Services, Inc | Elemento computacional integrado, dispositivo de computação óptica e método de fabricar um elemento computacional integrado |
US11579013B2 (en) | 2018-03-06 | 2023-02-14 | Halliburton Energy Services, Inc. | Flexible integrated computational elements for optical analysis |
US20230281537A1 (en) * | 2022-03-01 | 2023-09-07 | Saudi Arabian Oil Company | Well completion operations intelligent advisory based on dimension embedding |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0215372A3 (de) * | 1985-09-17 | 1989-01-04 | Siemens Aktiengesellschaft | Kanten-Interferenzfilter für die optische Nachrichtenübertragung im Wellenlängenmultiplex |
US5549953A (en) * | 1993-04-29 | 1996-08-27 | National Research Council Of Canada | Optical recording media having optically-variable security properties |
US6198531B1 (en) * | 1997-07-11 | 2001-03-06 | University Of South Carolina | Optical computational system |
DE19732619C2 (de) * | 1997-07-29 | 1999-08-19 | Fraunhofer Ges Forschung | Optische Detektoreinrichtung |
US7138156B1 (en) | 2000-09-26 | 2006-11-21 | Myrick Michael L | Filter design algorithm for multi-variate optical computing |
US6609795B2 (en) | 2001-06-11 | 2003-08-26 | 3M Innovative Properties Company | Polarizing beam splitter |
US7019905B2 (en) * | 2003-12-30 | 2006-03-28 | 3M Innovative Properties Company | Multilayer reflector with suppression of high order reflections |
US7901870B1 (en) * | 2004-05-12 | 2011-03-08 | Cirrex Systems Llc | Adjusting optical properties of optical thin films |
US20070201136A1 (en) * | 2004-09-13 | 2007-08-30 | University Of South Carolina | Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control |
US20060055308A1 (en) * | 2004-09-16 | 2006-03-16 | Lairson Bruce M | Plasma display filter with a dielectric/metallic layer stack of at least eleven layers |
US7697141B2 (en) * | 2004-12-09 | 2010-04-13 | Halliburton Energy Services, Inc. | In situ optical computation fluid analysis system and method |
JP5135753B2 (ja) | 2006-02-01 | 2013-02-06 | セイコーエプソン株式会社 | 光学物品 |
US8645082B2 (en) * | 2010-09-13 | 2014-02-04 | Mks Instruments, Inc. | Monitoring, detecting and quantifying chemical compounds in a sample |
US9206386B2 (en) * | 2011-08-05 | 2015-12-08 | Halliburton Energy Services, Inc. | Systems and methods for analyzing microbiological substances |
US8780352B2 (en) | 2012-04-26 | 2014-07-15 | Halliburton Energy Services, Inc. | Methods and devices for optically determining a characteristic of a substance |
US9013702B2 (en) * | 2012-04-26 | 2015-04-21 | Halliburton Energy Services, Inc. | Imaging systems for optical computing devices |
BR112016012481B1 (pt) | 2014-02-20 | 2022-05-10 | Halliburton Energy Services, Inc | Elemento computacional integrado, dispositivo de computação óptica e método de fabricar um elemento computacional integrado |
-
2014
- 2014-02-20 BR BR112016012481-2A patent/BR112016012481B1/pt active IP Right Grant
- 2014-02-20 MX MX2016009200A patent/MX359910B/es active IP Right Grant
- 2014-02-20 EP EP14882834.6A patent/EP3069121A1/en not_active Withdrawn
- 2014-02-20 WO PCT/US2014/017309 patent/WO2015126396A1/en active Application Filing
- 2014-02-20 US US14/413,376 patent/US9733183B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
MX359910B (es) | 2018-10-16 |
US20160274027A1 (en) | 2016-09-22 |
EP3069121A1 (en) | 2016-09-21 |
WO2015126396A1 (en) | 2015-08-27 |
US9733183B2 (en) | 2017-08-15 |
BR112016012481A2 (es) | 2017-08-08 |
BR112016012481B1 (pt) | 2022-05-10 |
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Legal Events
Date | Code | Title | Description |
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FG | Grant or registration |