MX2015009870A - Fuente de ionización de superficie. - Google Patents

Fuente de ionización de superficie.

Info

Publication number
MX2015009870A
MX2015009870A MX2015009870A MX2015009870A MX2015009870A MX 2015009870 A MX2015009870 A MX 2015009870A MX 2015009870 A MX2015009870 A MX 2015009870A MX 2015009870 A MX2015009870 A MX 2015009870A MX 2015009870 A MX2015009870 A MX 2015009870A
Authority
MX
Mexico
Prior art keywords
tube
flow
gas
analyte
ionization source
Prior art date
Application number
MX2015009870A
Other languages
English (en)
Inventor
Jan Hendrikse
Vladimir Romanov
Original Assignee
Smiths Detection Montreal Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Detection Montreal Inc filed Critical Smiths Detection Montreal Inc
Publication of MX2015009870A publication Critical patent/MX2015009870A/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/26Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/02Ionisation chambers
    • H01J47/026Gas flow ionisation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Toxicology (AREA)
  • Electrochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Combustion & Propulsion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Radiation-Therapy Devices (AREA)

Abstract

Se describe una fuente de ionización de superficie que comprende un tubo que tiene un primer extremo, un segundo extremo, y un orificio interior que se extiende a través del tubo del primer extremo al segundo extremo. El primer extremo del tubo se configura para recibir un flujo de gas y el segundo extremo del tubo se configura para dirigir el flujo de gas en una superficie configurada para sostener un analito. Una fuente radioactiva se coloca al menos sustancialmente en el orificio interior del tubo. La fuente radioactiva se configura para formar iones en el flujo de gas mientras el flujo de gas pasa a través del orificio interior. El flujo de gas que contiene los iones se dirige en el analito para al menos ionizar parcialmente el analito.
MX2015009870A 2013-01-31 2014-01-30 Fuente de ionización de superficie. MX2015009870A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361759030P 2013-01-31 2013-01-31
US201361788931P 2013-03-15 2013-03-15
PCT/CA2014/050058 WO2014117271A1 (en) 2013-01-31 2014-01-30 Surface ionization source

Publications (1)

Publication Number Publication Date
MX2015009870A true MX2015009870A (es) 2016-04-20

Family

ID=51261354

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015009870A MX2015009870A (es) 2013-01-31 2014-01-30 Fuente de ionización de superficie.

Country Status (9)

Country Link
US (1) US20150371807A1 (es)
EP (1) EP2951569A4 (es)
JP (1) JP2016511396A (es)
KR (1) KR20150116874A (es)
CN (1) CN105074448A (es)
CA (1) CA2900105A1 (es)
MX (1) MX2015009870A (es)
RU (1) RU2015131819A (es)
WO (1) WO2014117271A1 (es)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170213715A1 (en) * 2015-12-18 2017-07-27 Morpho Detection, Llc Detection of compounds through dopant-assisted photoionization
WO2019147748A2 (en) * 2018-01-24 2019-08-01 Rapiscan Systems, Inc. Surface layer disruption and ionization utilizing an extreme ultraviolet radiation source

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL99092C (es) * 1956-04-06
US5114677A (en) * 1989-04-03 1992-05-19 Brunswick Corporation Gas detection apparatus and related method
US5218203A (en) * 1991-03-22 1993-06-08 Georgia Tech Research Corporation Ion source and sample introduction method and apparatus using two stage ionization for producing sample gas ions
US5920072A (en) * 1997-09-30 1999-07-06 Hewlett-Packard Co. Ionization detector
US6037179A (en) * 1998-04-30 2000-03-14 Hewlett-Packard Company Method and apparatus for suppression of analyte diffusion in an ionization detector
CA2339552A1 (en) * 1998-08-05 2000-02-17 National Research Council Of Canada Apparatus and method for desolvating and focussing ions for introduction into a mass spectrometer
CA2386832C (en) * 1999-10-29 2009-09-29 Mds Inc. Atmospheric pressure photoionization (appi): a new ionization method for liquid chromatography-mass spectrometry
AU2002349241A1 (en) * 2001-12-14 2003-06-30 Mds Inc., D.B.A. Mds Sciex Method of chemical of ionization at reduced pressures
US7372043B2 (en) * 2002-02-22 2008-05-13 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
WO2005060696A2 (en) * 2003-12-18 2005-07-07 Sionex Corporation Methods and apparatus for enhanced ion based sample detection using selective pre-separation and amplification
US7335897B2 (en) * 2004-03-30 2008-02-26 Purdue Research Foundation Method and system for desorption electrospray ionization
US20080217526A1 (en) * 2005-05-06 2008-09-11 Colby Steven M Metastable CID
US7544933B2 (en) * 2006-01-17 2009-06-09 Purdue Research Foundation Method and system for desorption atmospheric pressure chemical ionization
WO2008054393A1 (en) * 2006-11-02 2008-05-08 Eai Corporation Method and device for non-contact sampling and detection
GB0625481D0 (en) * 2006-12-20 2007-01-31 Smiths Group Plc Detector apparatus and pre-concentrators
EP2126957A4 (en) * 2007-01-19 2012-05-30 Mds Analytical Tech Bu Mds Inc DEVICE AND METHOD FOR COOLING IONS
US8232521B2 (en) * 2007-02-02 2012-07-31 Waters Technologies Corporation Device and method for analyzing a sample
US8067730B2 (en) * 2007-07-20 2011-11-29 The George Washington University Laser ablation electrospray ionization (LAESI) for atmospheric pressure, In vivo, and imaging mass spectrometry
WO2009054913A1 (en) * 2007-10-19 2009-04-30 The Charles Stark Draper Laboratory, Inc. Rapid detection of volatile organic compounds for identification of bacteria in a sample
JP5425798B2 (ja) * 2007-11-06 2014-02-26 ジ アリゾナ ボード オブ リージェンツ オン ビハーフ オブ ザ ユニバーシティ オブ アリゾナ ガス中の蒸気としての化合物を分析するための高感度イオン検出装置及び方法
US8410431B2 (en) * 2008-10-13 2013-04-02 Purdue Research Foundation Systems and methods for transfer of ions for analysis
CA2790835A1 (en) * 2009-02-26 2010-09-02 The University Of British Columbia Ap-ecd methods and apparatus for mass spectrometric analysis of peptides and proteins
US8822949B2 (en) * 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems

Also Published As

Publication number Publication date
CA2900105A1 (en) 2014-08-07
RU2015131819A (ru) 2017-03-07
KR20150116874A (ko) 2015-10-16
WO2014117271A1 (en) 2014-08-07
US20150371807A1 (en) 2015-12-24
JP2016511396A (ja) 2016-04-14
EP2951569A4 (en) 2016-09-21
EP2951569A1 (en) 2015-12-09
CN105074448A (zh) 2015-11-18

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