MX163517B - Deteccion de la presencia de un revestimiento sobre un substrato - Google Patents

Deteccion de la presencia de un revestimiento sobre un substrato

Info

Publication number
MX163517B
MX163517B MX195572A MX19557282A MX163517B MX 163517 B MX163517 B MX 163517B MX 195572 A MX195572 A MX 195572A MX 19557282 A MX19557282 A MX 19557282A MX 163517 B MX163517 B MX 163517B
Authority
MX
Mexico
Prior art keywords
coating
substrate
detection
Prior art date
Application number
MX195572A
Other languages
English (en)
Inventor
Edwin Langberg
Original Assignee
Johnson & Johnson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnson & Johnson filed Critical Johnson & Johnson
Publication of MX163517B publication Critical patent/MX163517B/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/86Investigating moving sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)
MX195572A 1981-12-11 1982-10-10 Deteccion de la presencia de un revestimiento sobre un substrato MX163517B (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/329,793 US4456374A (en) 1981-12-11 1981-12-11 Detecting the presence or absence of a coating on a substrate

Publications (1)

Publication Number Publication Date
MX163517B true MX163517B (es) 1992-05-25

Family

ID=23287043

Family Applications (1)

Application Number Title Priority Date Filing Date
MX195572A MX163517B (es) 1981-12-11 1982-10-10 Deteccion de la presencia de un revestimiento sobre un substrato

Country Status (7)

Country Link
US (1) US4456374A (es)
JP (1) JPS58105077A (es)
CA (1) CA1189164A (es)
DE (1) DE3245823A1 (es)
FR (1) FR2518264B1 (es)
GB (1) GB2111200B (es)
MX (1) MX163517B (es)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6291956A (ja) * 1985-10-18 1987-04-27 Fuji Photo Film Co Ltd 写真フイルムの表裏判定方法
GB2186991A (en) * 1986-02-20 1987-08-26 Dow Chemical Co Optical examination of a body surface
US5017009A (en) * 1986-06-26 1991-05-21 Ortho Diagnostic Systems, Inc. Scattered total internal reflectance immunoassay system
US4837715A (en) * 1987-01-27 1989-06-06 Kimberly-Clark Corporation Method and apparatus for detecting the placement of components on absorbent articles
JP3013519B2 (ja) * 1991-06-24 2000-02-28 キヤノン株式会社 薄膜構造の検査方法及び検査装置
US5196901A (en) * 1991-08-22 1993-03-23 Eos Technologies, Inc. Discriminating surface contamination monitor
US5235515A (en) * 1992-02-07 1993-08-10 Kimberly-Clark Corporation Method and apparatus for controlling the cutting and placement of components on a moving substrate
JP3135389B2 (ja) * 1992-10-23 2001-02-13 松下電器産業株式会社 情報再生方法、情報記録再生方法、情報再生装置、記録媒体及び光ヘッド
CA2095555A1 (en) * 1992-12-16 1994-06-17 Robert L. Popp Apparatus and methods for selectively controlling a spray of liquid to form a distinct pattern
CA2115676C (en) * 1993-02-16 2000-05-02 Ronald W. Gould Method and apparatus for preparing solid surfaces for inspection
US5517301A (en) * 1993-07-27 1996-05-14 Hughes Aircraft Company Apparatus for characterizing an optic
US5506416A (en) * 1994-05-25 1996-04-09 Rizvi; Syed A. Microscopic internal reflection infrared spectroscopy to examine the surface of a trace amount of material
US5618347A (en) * 1995-04-14 1997-04-08 Kimberly-Clark Corporation Apparatus for spraying adhesive
US6037009A (en) * 1995-04-14 2000-03-14 Kimberly-Clark Worldwide, Inc. Method for spraying adhesive
US5790247A (en) * 1995-10-06 1998-08-04 Photon Dynamics, Inc. Technique for determining defect positions in three dimensions in a transparent structure
US5818046A (en) * 1996-08-30 1998-10-06 Rizvi; Syed A. Mid-infrared analysis system
US20030105443A1 (en) * 2000-07-10 2003-06-05 The Procter & Gamble Company Absorbent article comprising mircroporous film with registration mark
US6788803B2 (en) 2001-12-14 2004-09-07 Paragon Trade Brands, Inc. Methods and systems for making disposable absorbent article having graphics
DE102018111648A1 (de) * 2018-05-15 2019-11-21 Saurer Spinning Solutions Gmbh & Co. Kg Garnsensor zum optischen Erfassen eines in seiner Längsrichtung bewegten Garns

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB898828A (en) * 1959-06-26 1962-06-14 Gen Electric Co Ltd Improvements in or relating to the examination of transparent sheet material
US3460893A (en) * 1965-09-15 1969-08-12 Wilks Scientific Corp Apparatus for analyzing a continuously moving strip by means of attenuated total reflection
US3604927A (en) * 1966-11-16 1971-09-14 Block Engineering Total reflection fluorescence spectroscopy
US3577039A (en) * 1969-01-28 1971-05-04 Bendix Corp Optical apparatus for flaw detection
FR2067820A5 (es) * 1969-11-18 1971-08-20 Tisseau Michel
CH593478A5 (es) * 1976-01-20 1977-11-30 Prolizenz Ag
JPS5585209A (en) * 1978-12-22 1980-06-27 Hitachi Ltd Inspection device for mask
US4297032A (en) * 1980-02-14 1981-10-27 The United States Of America As Represented By The Secretary Of The Navy Dark field surface inspection illumination technique

Also Published As

Publication number Publication date
CA1189164A (en) 1985-06-18
FR2518264B1 (fr) 1986-04-11
GB2111200A (en) 1983-06-29
JPS58105077A (ja) 1983-06-22
FR2518264A1 (fr) 1983-06-17
US4456374A (en) 1984-06-26
GB2111200B (en) 1985-05-22
DE3245823A1 (de) 1983-06-16
JPH0237982B2 (es) 1990-08-28

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