MX163517B - Deteccion de la presencia de un revestimiento sobre un substrato - Google Patents
Deteccion de la presencia de un revestimiento sobre un substratoInfo
- Publication number
- MX163517B MX163517B MX195572A MX19557282A MX163517B MX 163517 B MX163517 B MX 163517B MX 195572 A MX195572 A MX 195572A MX 19557282 A MX19557282 A MX 19557282A MX 163517 B MX163517 B MX 163517B
- Authority
- MX
- Mexico
- Prior art keywords
- coating
- substrate
- detection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Geophysics And Detection Of Objects (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/329,793 US4456374A (en) | 1981-12-11 | 1981-12-11 | Detecting the presence or absence of a coating on a substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
MX163517B true MX163517B (es) | 1992-05-25 |
Family
ID=23287043
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX195572A MX163517B (es) | 1981-12-11 | 1982-10-10 | Deteccion de la presencia de un revestimiento sobre un substrato |
Country Status (7)
Country | Link |
---|---|
US (1) | US4456374A (es) |
JP (1) | JPS58105077A (es) |
CA (1) | CA1189164A (es) |
DE (1) | DE3245823A1 (es) |
FR (1) | FR2518264B1 (es) |
GB (1) | GB2111200B (es) |
MX (1) | MX163517B (es) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6291956A (ja) * | 1985-10-18 | 1987-04-27 | Fuji Photo Film Co Ltd | 写真フイルムの表裏判定方法 |
GB2186991A (en) * | 1986-02-20 | 1987-08-26 | Dow Chemical Co | Optical examination of a body surface |
US5017009A (en) * | 1986-06-26 | 1991-05-21 | Ortho Diagnostic Systems, Inc. | Scattered total internal reflectance immunoassay system |
US4837715A (en) * | 1987-01-27 | 1989-06-06 | Kimberly-Clark Corporation | Method and apparatus for detecting the placement of components on absorbent articles |
JP3013519B2 (ja) * | 1991-06-24 | 2000-02-28 | キヤノン株式会社 | 薄膜構造の検査方法及び検査装置 |
US5196901A (en) * | 1991-08-22 | 1993-03-23 | Eos Technologies, Inc. | Discriminating surface contamination monitor |
US5235515A (en) * | 1992-02-07 | 1993-08-10 | Kimberly-Clark Corporation | Method and apparatus for controlling the cutting and placement of components on a moving substrate |
JP3135389B2 (ja) * | 1992-10-23 | 2001-02-13 | 松下電器産業株式会社 | 情報再生方法、情報記録再生方法、情報再生装置、記録媒体及び光ヘッド |
CA2095555A1 (en) * | 1992-12-16 | 1994-06-17 | Robert L. Popp | Apparatus and methods for selectively controlling a spray of liquid to form a distinct pattern |
CA2115676C (en) * | 1993-02-16 | 2000-05-02 | Ronald W. Gould | Method and apparatus for preparing solid surfaces for inspection |
US5517301A (en) * | 1993-07-27 | 1996-05-14 | Hughes Aircraft Company | Apparatus for characterizing an optic |
US5506416A (en) * | 1994-05-25 | 1996-04-09 | Rizvi; Syed A. | Microscopic internal reflection infrared spectroscopy to examine the surface of a trace amount of material |
US5618347A (en) * | 1995-04-14 | 1997-04-08 | Kimberly-Clark Corporation | Apparatus for spraying adhesive |
US6037009A (en) * | 1995-04-14 | 2000-03-14 | Kimberly-Clark Worldwide, Inc. | Method for spraying adhesive |
US5790247A (en) * | 1995-10-06 | 1998-08-04 | Photon Dynamics, Inc. | Technique for determining defect positions in three dimensions in a transparent structure |
US5818046A (en) * | 1996-08-30 | 1998-10-06 | Rizvi; Syed A. | Mid-infrared analysis system |
US20030105443A1 (en) * | 2000-07-10 | 2003-06-05 | The Procter & Gamble Company | Absorbent article comprising mircroporous film with registration mark |
US6788803B2 (en) | 2001-12-14 | 2004-09-07 | Paragon Trade Brands, Inc. | Methods and systems for making disposable absorbent article having graphics |
DE102018111648A1 (de) * | 2018-05-15 | 2019-11-21 | Saurer Spinning Solutions Gmbh & Co. Kg | Garnsensor zum optischen Erfassen eines in seiner Längsrichtung bewegten Garns |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB898828A (en) * | 1959-06-26 | 1962-06-14 | Gen Electric Co Ltd | Improvements in or relating to the examination of transparent sheet material |
US3460893A (en) * | 1965-09-15 | 1969-08-12 | Wilks Scientific Corp | Apparatus for analyzing a continuously moving strip by means of attenuated total reflection |
US3604927A (en) * | 1966-11-16 | 1971-09-14 | Block Engineering | Total reflection fluorescence spectroscopy |
US3577039A (en) * | 1969-01-28 | 1971-05-04 | Bendix Corp | Optical apparatus for flaw detection |
FR2067820A5 (es) * | 1969-11-18 | 1971-08-20 | Tisseau Michel | |
CH593478A5 (es) * | 1976-01-20 | 1977-11-30 | Prolizenz Ag | |
JPS5585209A (en) * | 1978-12-22 | 1980-06-27 | Hitachi Ltd | Inspection device for mask |
US4297032A (en) * | 1980-02-14 | 1981-10-27 | The United States Of America As Represented By The Secretary Of The Navy | Dark field surface inspection illumination technique |
-
1981
- 1981-12-11 US US06/329,793 patent/US4456374A/en not_active Expired - Lifetime
-
1982
- 1982-10-10 MX MX195572A patent/MX163517B/es unknown
- 1982-12-09 FR FR8220639A patent/FR2518264B1/fr not_active Expired
- 1982-12-09 CA CA000417332A patent/CA1189164A/en not_active Expired
- 1982-12-09 JP JP57214760A patent/JPS58105077A/ja active Granted
- 1982-12-10 GB GB08235268A patent/GB2111200B/en not_active Expired
- 1982-12-10 DE DE19823245823 patent/DE3245823A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
CA1189164A (en) | 1985-06-18 |
FR2518264B1 (fr) | 1986-04-11 |
GB2111200A (en) | 1983-06-29 |
JPS58105077A (ja) | 1983-06-22 |
FR2518264A1 (fr) | 1983-06-17 |
US4456374A (en) | 1984-06-26 |
GB2111200B (en) | 1985-05-22 |
DE3245823A1 (de) | 1983-06-16 |
JPH0237982B2 (es) | 1990-08-28 |
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