FR2518264B1 - Procede et appareil pour detecter la presence ou l'absence d'un revetement sur un substrat - Google Patents

Procede et appareil pour detecter la presence ou l'absence d'un revetement sur un substrat

Info

Publication number
FR2518264B1
FR2518264B1 FR8220639A FR8220639A FR2518264B1 FR 2518264 B1 FR2518264 B1 FR 2518264B1 FR 8220639 A FR8220639 A FR 8220639A FR 8220639 A FR8220639 A FR 8220639A FR 2518264 B1 FR2518264 B1 FR 2518264B1
Authority
FR
France
Prior art keywords
absence
coating
detecting
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8220639A
Other languages
English (en)
Other versions
FR2518264A1 (fr
Inventor
Edwin Langberg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnson and Johnson KK
Johnson and Johnson
Original Assignee
Johnson and Johnson KK
Johnson and Johnson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnson and Johnson KK, Johnson and Johnson filed Critical Johnson and Johnson KK
Publication of FR2518264A1 publication Critical patent/FR2518264A1/fr
Application granted granted Critical
Publication of FR2518264B1 publication Critical patent/FR2518264B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)
FR8220639A 1981-12-11 1982-12-09 Procede et appareil pour detecter la presence ou l'absence d'un revetement sur un substrat Expired FR2518264B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/329,793 US4456374A (en) 1981-12-11 1981-12-11 Detecting the presence or absence of a coating on a substrate

Publications (2)

Publication Number Publication Date
FR2518264A1 FR2518264A1 (fr) 1983-06-17
FR2518264B1 true FR2518264B1 (fr) 1986-04-11

Family

ID=23287043

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8220639A Expired FR2518264B1 (fr) 1981-12-11 1982-12-09 Procede et appareil pour detecter la presence ou l'absence d'un revetement sur un substrat

Country Status (7)

Country Link
US (1) US4456374A (fr)
JP (1) JPS58105077A (fr)
CA (1) CA1189164A (fr)
DE (1) DE3245823A1 (fr)
FR (1) FR2518264B1 (fr)
GB (1) GB2111200B (fr)
MX (1) MX163517B (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6291956A (ja) * 1985-10-18 1987-04-27 Fuji Photo Film Co Ltd 写真フイルムの表裏判定方法
GB2186991A (en) * 1986-02-20 1987-08-26 Dow Chemical Co Optical examination of a body surface
US5017009A (en) * 1986-06-26 1991-05-21 Ortho Diagnostic Systems, Inc. Scattered total internal reflectance immunoassay system
US4837715A (en) * 1987-01-27 1989-06-06 Kimberly-Clark Corporation Method and apparatus for detecting the placement of components on absorbent articles
JP3013519B2 (ja) * 1991-06-24 2000-02-28 キヤノン株式会社 薄膜構造の検査方法及び検査装置
US5196901A (en) * 1991-08-22 1993-03-23 Eos Technologies, Inc. Discriminating surface contamination monitor
US5235515A (en) * 1992-02-07 1993-08-10 Kimberly-Clark Corporation Method and apparatus for controlling the cutting and placement of components on a moving substrate
JP3135389B2 (ja) * 1992-10-23 2001-02-13 松下電器産業株式会社 情報再生方法、情報記録再生方法、情報再生装置、記録媒体及び光ヘッド
CA2095555A1 (fr) * 1992-12-16 1994-06-17 Robert L. Popp Appareil et methodes de controle selectif de pulverisation d'un liquide
CA2115676C (fr) * 1993-02-16 2000-05-02 Ronald W. Gould Appareil servant a la preparation ded surfaces solides en vue d'une inspection optique et methode connexe
US5517301A (en) * 1993-07-27 1996-05-14 Hughes Aircraft Company Apparatus for characterizing an optic
US5506416A (en) * 1994-05-25 1996-04-09 Rizvi; Syed A. Microscopic internal reflection infrared spectroscopy to examine the surface of a trace amount of material
US5618347A (en) * 1995-04-14 1997-04-08 Kimberly-Clark Corporation Apparatus for spraying adhesive
US6037009A (en) * 1995-04-14 2000-03-14 Kimberly-Clark Worldwide, Inc. Method for spraying adhesive
US5790247A (en) * 1995-10-06 1998-08-04 Photon Dynamics, Inc. Technique for determining defect positions in three dimensions in a transparent structure
US5818046A (en) * 1996-08-30 1998-10-06 Rizvi; Syed A. Mid-infrared analysis system
US20030105443A1 (en) * 2000-07-10 2003-06-05 The Procter & Gamble Company Absorbent article comprising mircroporous film with registration mark
US6788803B2 (en) 2001-12-14 2004-09-07 Paragon Trade Brands, Inc. Methods and systems for making disposable absorbent article having graphics
DE102018111648A1 (de) * 2018-05-15 2019-11-21 Saurer Spinning Solutions Gmbh & Co. Kg Garnsensor zum optischen Erfassen eines in seiner Längsrichtung bewegten Garns

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB898828A (en) * 1959-06-26 1962-06-14 Gen Electric Co Ltd Improvements in or relating to the examination of transparent sheet material
US3460893A (en) * 1965-09-15 1969-08-12 Wilks Scientific Corp Apparatus for analyzing a continuously moving strip by means of attenuated total reflection
US3604927A (en) * 1966-11-16 1971-09-14 Block Engineering Total reflection fluorescence spectroscopy
US3577039A (en) * 1969-01-28 1971-05-04 Bendix Corp Optical apparatus for flaw detection
FR2067820A5 (fr) * 1969-11-18 1971-08-20 Tisseau Michel
CH593478A5 (fr) * 1976-01-20 1977-11-30 Prolizenz Ag
JPS5585209A (en) * 1978-12-22 1980-06-27 Hitachi Ltd Inspection device for mask
US4297032A (en) * 1980-02-14 1981-10-27 The United States Of America As Represented By The Secretary Of The Navy Dark field surface inspection illumination technique

Also Published As

Publication number Publication date
JPS58105077A (ja) 1983-06-22
FR2518264A1 (fr) 1983-06-17
GB2111200B (en) 1985-05-22
GB2111200A (en) 1983-06-29
MX163517B (es) 1992-05-25
DE3245823A1 (de) 1983-06-16
JPH0237982B2 (fr) 1990-08-28
CA1189164A (fr) 1985-06-18
US4456374A (en) 1984-06-26

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