MD689Z - Сверхпроводниковый болометр - Google Patents

Сверхпроводниковый болометр Download PDF

Info

Publication number
MD689Z
MD689Z MDS20130029A MDS20130029A MD689Z MD 689 Z MD689 Z MD 689Z MD S20130029 A MDS20130029 A MD S20130029A MD S20130029 A MDS20130029 A MD S20130029A MD 689 Z MD689 Z MD 689Z
Authority
MD
Moldova
Prior art keywords
superconducting
sensitive element
bolometer
semiconductor material
xgaxte
Prior art date
Application number
MDS20130029A
Other languages
English (en)
Romanian (ro)
Inventor
Ефим ЗАСАВИЦКИЙ
Original Assignee
ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ filed Critical ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ
Priority to MDS20130029A priority Critical patent/MD689Z/ru
Publication of MD689Y publication Critical patent/MD689Y/mo
Publication of MD689Z publication Critical patent/MD689Z/ru

Links

Landscapes

  • Measurement Of Radiation (AREA)

Abstract

Изобретение относится к охлаждаемым приемникам излучения для измерения слабых потоков излучения из диапазона миллиметровых и субмиллиметровых длин волн.Сверхпроводниковый болометр содержит гелиевый криостат, в котором расположен регулятор температуры и чувствительный элемент, выполненный из сверхпроводящего полупроводника, к которому подключено регистрирующее устройство. Чувствительный элемент выполнен в виде монокристаллической пленки из теллурида олова, легированного галлием Sn1-xGaxTe, где x=0,01...0,0225, полученной осаждением сверхпроводящего полупроводникового материала на подложку из фторида бария BaF2.
MDS20130029A 2013-02-22 2013-02-22 Сверхпроводниковый болометр MD689Z (ru)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDS20130029A MD689Z (ru) 2013-02-22 2013-02-22 Сверхпроводниковый болометр

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDS20130029A MD689Z (ru) 2013-02-22 2013-02-22 Сверхпроводниковый болометр

Publications (2)

Publication Number Publication Date
MD689Y MD689Y (en) 2013-10-31
MD689Z true MD689Z (ru) 2014-05-31

Family

ID=49549979

Family Applications (1)

Application Number Title Priority Date Filing Date
MDS20130029A MD689Z (ru) 2013-02-22 2013-02-22 Сверхпроводниковый болометр

Country Status (1)

Country Link
MD (1) MD689Z (ru)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD3436B2 (en) * 2005-04-25 2007-11-30 Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei Bolometer
MD340Z (ru) * 2010-04-23 2011-09-30 Институт Электронной Инженерии И Промышленных Технологий Болометр
MD471Z (ru) * 2011-05-17 2012-08-31 ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ Болометр на переходе металл-изолятор
  • 2013

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD3436B2 (en) * 2005-04-25 2007-11-30 Institutul De Inginerie Electronica Si Tehnologiiindustriale Al Academiei De Stiinte A Moldovei Bolometer
MD340Z (ru) * 2010-04-23 2011-09-30 Институт Электронной Инженерии И Промышленных Технологий Болометр
MD471Z (ru) * 2011-05-17 2012-08-31 ИНСТИТУТ ЭЛЕКТРОННОЙ ИНЖЕНЕРИИ И НАНОТЕХНОЛОГИЙ "D. Ghitu" АНМ Болометр на переходе металл-изолятор

Also Published As

Publication number Publication date
MD689Y (en) 2013-10-31

Similar Documents

Publication Publication Date Title
Nakagomi et al. β‐Ga2O3/p‐type 4H‐SiC heterojunction diodes and applications to deep‐UV photodiodes
EP0177918A2 (en) UV detector and method for fabricating it
Yu et al. MgZnO avalanche photodetectors realized in Schottky structures
Ding et al. Ultraviolet photodetector based on heterojunction of n-ZnO microwire/p-GaN film
von Wenckstern et al. pn‐Heterojunction diodes with n‐type In2O3
Zhang et al. Gas source MBE grown wavelength extended 2.2 and 2.5 μm InGaAs PIN photodetectors
Bhardwaj et al. Sb-doped $ p $-MgZnO/$ n $-Si heterojunction UV photodetector fabricated by dual ion beam sputtering
Roul et al. Highly responsive ZnO/AlN/Si heterostructure-based infrared-and visible-blind ultraviolet photodetectors with high rejection ratio
Rakhshani et al. Deep energy levels and photoelectrical properties of thin cuprous oxide films
Cherroun et al. Study of a solar-blind photodetector based on an IZTO/β-Ga2O3/ITO Schottky diode
Placzek-Popko et al. Deep traps and photo-electric properties of p-Si/MgO/n-Zn1− xMgxO heterojunction
Pan et al. A ZnO-based programmable UV detection integrated circuit unit
Sharmin et al. Optical and Transport Properties of p-type GaAs
Hernandez-Como et al. Low-temperature processed ZnO and CdS photodetectors deposited by pulsed laser deposition
MD689Z (ru) Сверхпроводниковый болометр
Sorianello et al. Spin‐on‐dopant phosphorus diffusion in germanium thin films for near‐infrared detectors
Dalapati et al. Influence of temperature on tunneling-enhanced recombination in Si based p—i—n photodiodes
Averin et al. Selectively‐sensitive metal‐semiconductor‐metal photodetectors based on AlGaN/AlN and ZnCdS/GaP heterostructures
Voitsekhovskii et al. Special Features of Admittance in Mis Structures Based on Graded-Gap MBE n-Hg1–x Cd x Te (x= 0.31–0.32) in a Temperature Range OF 8–300 K
Zebbar et al. Properties of ZnO thin films grown on Si substrates by ultrasonic spray and ZnO/Si heterojunctions
Matthus et al. Implementation of 4H-SiC PiN-diodes as nearly linear temperature sensors up to 800 K towards SiC multi-sensor integration
Mazzillo et al. Impact of the epilayer doping on the performanceof thin metal film Ni2Si/4H-SiC Schottky photodiodes
Bertram et al. Electrical Characterization of Defects in Cu-Rich Grown CuInSe $ _ {\text {2}} $ Solar Cells
Zhang et al. Characterization of CdMnTe crystal grown with vertical Bridgman method under Te‐rich conditions
Sweyllam et al. Growth and current–voltage characterization of ZnTe/CdTe heterojunctions

Legal Events

Date Code Title Description
FG9Y Short term patent issued
KA4Y Short-term patent lapsed due to non-payment of fees (with right of restoration)