LU92583B1 - Detektorvorrichtung - Google Patents

Detektorvorrichtung

Info

Publication number
LU92583B1
LU92583B1 LU92583A LU92583A LU92583B1 LU 92583 B1 LU92583 B1 LU 92583B1 LU 92583 A LU92583 A LU 92583A LU 92583 A LU92583 A LU 92583A LU 92583 B1 LU92583 B1 LU 92583B1
Authority
LU
Luxembourg
Prior art keywords
detector device
detector
Prior art date
Application number
LU92583A
Other languages
English (en)
Inventor
Patric Mrawek
Frank Schreiber
Roland Seifert
Original Assignee
Leica Microsystems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Microsystems filed Critical Leica Microsystems
Priority to LU92583A priority Critical patent/LU92583B1/de
Priority to PCT/EP2015/074454 priority patent/WO2016062798A1/de
Priority to US15/520,854 priority patent/US10649193B2/en
Priority to JP2017522033A priority patent/JP6714588B2/ja
Application granted granted Critical
Publication of LU92583B1 publication Critical patent/LU92583B1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/28—Base structure with cooling device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0448—Adjustable, e.g. focussing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0096—Microscopes with photometer devices
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Engineering & Computer Science (AREA)
  • Studio Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Microscoopes, Condenser (AREA)
  • Cameras Adapted For Combination With Other Photographic Or Optical Apparatuses (AREA)
  • Accessories Of Cameras (AREA)
LU92583A 2014-10-22 2014-10-22 Detektorvorrichtung LU92583B1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
LU92583A LU92583B1 (de) 2014-10-22 2014-10-22 Detektorvorrichtung
PCT/EP2015/074454 WO2016062798A1 (de) 2014-10-22 2015-10-22 Detektorvorrichtung
US15/520,854 US10649193B2 (en) 2014-10-22 2015-10-22 Detector device with improved signal-to-noise ratio comprising a detector in a housing moveable against a force of a spring device
JP2017522033A JP6714588B2 (ja) 2014-10-22 2015-10-22 検出器装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
LU92583A LU92583B1 (de) 2014-10-22 2014-10-22 Detektorvorrichtung

Publications (1)

Publication Number Publication Date
LU92583B1 true LU92583B1 (de) 2016-04-25

Family

ID=51982729

Family Applications (1)

Application Number Title Priority Date Filing Date
LU92583A LU92583B1 (de) 2014-10-22 2014-10-22 Detektorvorrichtung

Country Status (4)

Country Link
US (1) US10649193B2 (de)
JP (1) JP6714588B2 (de)
LU (1) LU92583B1 (de)
WO (1) WO2016062798A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1064023S1 (en) * 2021-10-05 2025-02-25 Leica Microsystems Cms Gmbh Accessory for a microscope
CN118089928B (zh) * 2024-04-18 2024-07-09 青岛利恩迪电子科技发展有限公司 一种led灯可见光强度检测装置及使用方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE365388C (de) * 1921-09-20 1922-12-14 Pfeiffer Arthur Hochvakuum-Spektrograph
US3999403A (en) * 1974-12-06 1976-12-28 Texas Instruments Incorporated Thermal interface for cryogen coolers
JPS56147024A (en) * 1980-04-16 1981-11-14 Mitsubishi Electric Corp Adjuster for mounting position of detector
EP0481381A1 (de) * 1990-10-15 1992-04-22 Lectron Products, Inc. Automatischer Dimmer für Scheinwerfer
DE202011109809U1 (de) * 2011-08-16 2012-03-16 Leica Microsystems Cms Gmbh Detektorvorrichtung
US20130135650A1 (en) * 2011-11-25 2013-05-30 Canon Kabushiki Kaisha Reading apparatus and printing apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3694565B2 (ja) * 1996-07-23 2005-09-14 浜松ホトニクス株式会社 光検出装置
US6707028B2 (en) * 2001-02-14 2004-03-16 Spacesaver Corporation Rotating light source system for detecting an obstruction in a space, for use in a mobile storage system
JP2004163272A (ja) * 2002-11-13 2004-06-10 Hamamatsu Photonics Kk 冷却式光検出装置
JP2004279067A (ja) * 2003-03-13 2004-10-07 Toshiba Lighting & Technology Corp センサユニットおよびセンサ装置
JP2006112870A (ja) * 2004-10-13 2006-04-27 Hamamatsu Photonics Kk 光検出装置
DE102007048089A1 (de) * 2007-10-05 2009-04-09 Leica Microsystems Cms Gmbh Anordnung zum Untersuchen von mikroskopischen und makroskopischen Präparaten
DE102009036066A1 (de) 2009-08-04 2011-02-10 Carl Zeiss Microimaging Gmbh Optoelektronischer Detektor und Betriebsverfahren für einen solchen
DE102011052738A1 (de) * 2011-08-16 2013-02-21 Leica Microsystems Cms Gmbh Detektorvorrichtung

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE365388C (de) * 1921-09-20 1922-12-14 Pfeiffer Arthur Hochvakuum-Spektrograph
US3999403A (en) * 1974-12-06 1976-12-28 Texas Instruments Incorporated Thermal interface for cryogen coolers
JPS56147024A (en) * 1980-04-16 1981-11-14 Mitsubishi Electric Corp Adjuster for mounting position of detector
EP0481381A1 (de) * 1990-10-15 1992-04-22 Lectron Products, Inc. Automatischer Dimmer für Scheinwerfer
DE202011109809U1 (de) * 2011-08-16 2012-03-16 Leica Microsystems Cms Gmbh Detektorvorrichtung
US20130135650A1 (en) * 2011-11-25 2013-05-30 Canon Kabushiki Kaisha Reading apparatus and printing apparatus

Also Published As

Publication number Publication date
WO2016062798A1 (de) 2016-04-28
JP6714588B2 (ja) 2020-06-24
JP2017538111A (ja) 2017-12-21
US20180039057A1 (en) 2018-02-08
US10649193B2 (en) 2020-05-12

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