KR980005513U - 반도체장치의 허용범위 초과전압 검출회로 - Google Patents

반도체장치의 허용범위 초과전압 검출회로

Info

Publication number
KR980005513U
KR980005513U KR2019960019385U KR19960019385U KR980005513U KR 980005513 U KR980005513 U KR 980005513U KR 2019960019385 U KR2019960019385 U KR 2019960019385U KR 19960019385 U KR19960019385 U KR 19960019385U KR 980005513 U KR980005513 U KR 980005513U
Authority
KR
South Korea
Prior art keywords
detection circuit
semiconductor devices
voltage detection
allowable range
circuit exceeding
Prior art date
Application number
KR2019960019385U
Other languages
English (en)
Other versions
KR200158367Y1 (ko
Inventor
김진완
Original Assignee
현대전자산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업주식회사 filed Critical 현대전자산업주식회사
Priority to KR2019960019385U priority Critical patent/KR200158367Y1/ko
Publication of KR980005513U publication Critical patent/KR980005513U/ko
Application granted granted Critical
Publication of KR200158367Y1 publication Critical patent/KR200158367Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR2019960019385U 1996-06-29 1996-06-29 반도체장치의 허용범위 초과전압 검출회로 KR200158367Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019960019385U KR200158367Y1 (ko) 1996-06-29 1996-06-29 반도체장치의 허용범위 초과전압 검출회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019960019385U KR200158367Y1 (ko) 1996-06-29 1996-06-29 반도체장치의 허용범위 초과전압 검출회로

Publications (2)

Publication Number Publication Date
KR980005513U true KR980005513U (ko) 1998-03-30
KR200158367Y1 KR200158367Y1 (ko) 1999-10-15

Family

ID=19460537

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019960019385U KR200158367Y1 (ko) 1996-06-29 1996-06-29 반도체장치의 허용범위 초과전압 검출회로

Country Status (1)

Country Link
KR (1) KR200158367Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5057894B2 (ja) 2007-08-31 2012-10-24 セイコーインスツル株式会社 電圧検出回路及びそれを用いた発振器

Also Published As

Publication number Publication date
KR200158367Y1 (ko) 1999-10-15

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Legal Events

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E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
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Year of fee payment: 7

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