KR980003616A - METHOD AND DEVICE FOR MEASURING IC - Google Patents

METHOD AND DEVICE FOR MEASURING IC Download PDF

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Publication number
KR980003616A
KR980003616A KR1019960025216A KR19960025216A KR980003616A KR 980003616 A KR980003616 A KR 980003616A KR 1019960025216 A KR1019960025216 A KR 1019960025216A KR 19960025216 A KR19960025216 A KR 19960025216A KR 980003616 A KR980003616 A KR 980003616A
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KR
South Korea
Prior art keywords
signal
level
analog
digital
measuring
Prior art date
Application number
KR1019960025216A
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Korean (ko)
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KR100200714B1 (en
Inventor
김영부
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019960025216A priority Critical patent/KR100200714B1/en
Publication of KR980003616A publication Critical patent/KR980003616A/en
Application granted granted Critical
Publication of KR100200714B1 publication Critical patent/KR100200714B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality

Abstract

본 발명은 집적회로(IC) 측정 방법 및 장치를 공개한다. ADC를 포함하는 시스템에서 수행되는 그 방법은, IC를 측정하기 위한 정보를 포함하는 아날로그 신호의 신호 레벨과 ADC의 최대 동작 레벨을 비교하는 단계와, 신호 레벨이 최대 동작 레벨보다 높거나 낮으면 신호레벨을 최대 동작 레벨과 일치하도록 조정하는 단계 및 최대 동작 레벨로 레벨이 조정된 아날로그 신호를 ADC로 출력하여 디지탈 신호로 변환하는 단계 및 디지탈 신호를 이용하여 IC를 측정하는 단계를 구비하는 것을 특징으로 하고, 신호 크기에 따라 몇배의 분해능을 가지고, 피검사물을 정밀하게 측정할 수 있으며, 낮은 분해능을 가진 ADC를 이용하여 정밀한 측정을 수행하도록하기 때문에 원가절감 및 IC의 품질을 향상시킬 수 있고, 측정 장치의 내부에 장착될 수도 있는 효과가 있다.The present invention discloses an integrated circuit (IC) measurement method and apparatus. The method, performed in a system including an ADC, comprises comparing the signal level of an analog signal comprising information for measuring an IC to a maximum operating level of the ADC and, if the signal level is higher or lower than the maximum operating level, Adjusting the level so as to match the maximum operation level, outputting the analog signal whose level is adjusted to the maximum operation level to the ADC and converting the analog signal into a digital signal, and measuring the IC using the digital signal. It is possible to precisely measure an object with several times resolution depending on the signal size, and to perform precise measurement using an ADC with a low resolution, so that cost reduction and IC quality can be improved, There is an effect that it may be mounted inside the apparatus.

Description

집적회로 측정 방법 및 이를 위한 장치METHOD AND DEVICE FOR MEASURING IC

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is a trivial issue, I did not include the contents of the text.

제2도는 본 발명에 의한 IC측정 방법을 설명하기 위한 플로우차트이다.FIG. 2 is a flowchart for explaining an IC measurement method according to the present invention.

제3도는 제2도에 도시된 방법을 수행하는 본 발명에 의한 IC측정장치를 설명하기 위한 블럭도.FIG. 3 is a block diagram for explaining an IC measuring apparatus according to the present invention for performing the method shown in FIG. 2; FIG.

Claims (2)

아날로그/디지탈 변환기를 포함하는 시스템에서 수행되는 집적회로 측정 방법에 있어서, 상기 집적회로를 측정하기 위한 정보를 포함하는 아날로그 신호의 신호 레벨과 상기 아날로그/디지탈 변환기의 최대 동작 레벨을 비교하는 단계; 상기 신호 레벨이 상기 최대 동작 레벨보다 높거나 낮으면 상기 신호레벨을 상기 최대 동작 레벨과 일치하도록 조정하는 단계; 상기 최대 동작 레벨로 레벨이 조정된 상기 아날로그 신호를 상기 아날로그/디지탈 변환기로 출력하여 디지탈 신호로 변환하는 단계; 및 상기 디지탈 신호를 이용하여 상기 집적회로를 측정하는 단계를 구비하는 것을 특징으로 하는 집적회로 측정 방법.A method for integrated circuit measurement in a system including an analog / digital converter, comprising: comparing a signal level of an analog signal including information for measuring the integrated circuit to a maximum operation level of the analog / digital converter; Adjusting the signal level to match the maximum operating level if the signal level is higher or lower than the maximum operating level; Outputting the analog signal whose level is adjusted to the maximum operation level to the analog / digital converter and converting the analog signal into a digital signal; And measuring the integrated circuit using the digital signal. 집적회로로부터 출력되며, 측정을 위한 정보를 포함하는 아날로그 신호의 레벨을 오차신호에 응답하여 조정하는 신호 레벨 조정수단; 상기 신호 레벨 조정수단으로부터 출력되는 신호의 레벨을 검출하는 신호 레벨검출수단; 및 입력한 상기 신호 레벨 조정수단의 출력을 디지탈 신호로 변환하여 상기 집적회로를 분석하는 데이타 신호 처리수단으로 출력하는 아날로그/디지탈 변환수단; 및 상기 신호 레벨 검출 수단에서 검출된 레벨과 상기 아날로그/디지탈 변환수단의 최대 동작 레벨과의 오차를 측정하고, 측정된 상기 오차신호를 출력하는 레벨 오차 측정 수단을 구비하는 것을 특징으로 하는 집적회로 측정장치.Signal level adjusting means for outputting an analog signal, which is output from the integrated circuit and includes information for measurement, in response to the error signal; Signal level detecting means for detecting a level of a signal output from said signal level adjusting means; And an analog / digital conversion means for converting the input signal level adjusting means output into a digital signal and outputting the digital signal to a data signal processing means for analyzing the integrated circuit; And a level error measuring means for measuring an error between the level detected by the signal level detecting means and the maximum operation level of the analog / digital converting means, and outputting the measured error signal. Device. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: It is disclosed by the contents of the first application.
KR1019960025216A 1996-06-28 1996-06-28 Test method and apparatus for integrated circuit KR100200714B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019960025216A KR100200714B1 (en) 1996-06-28 1996-06-28 Test method and apparatus for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960025216A KR100200714B1 (en) 1996-06-28 1996-06-28 Test method and apparatus for integrated circuit

Publications (2)

Publication Number Publication Date
KR980003616A true KR980003616A (en) 1998-03-30
KR100200714B1 KR100200714B1 (en) 1999-06-15

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Application Number Title Priority Date Filing Date
KR1019960025216A KR100200714B1 (en) 1996-06-28 1996-06-28 Test method and apparatus for integrated circuit

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