KR960014960A - Circuit characteristic automatic inspection device - Google Patents
Circuit characteristic automatic inspection device Download PDFInfo
- Publication number
- KR960014960A KR960014960A KR1019940028433A KR19940028433A KR960014960A KR 960014960 A KR960014960 A KR 960014960A KR 1019940028433 A KR1019940028433 A KR 1019940028433A KR 19940028433 A KR19940028433 A KR 19940028433A KR 960014960 A KR960014960 A KR 960014960A
- Authority
- KR
- South Korea
- Prior art keywords
- waveform
- circuit
- generating means
- processing unit
- central processing
- Prior art date
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Abstract
본 발명은 증폭회로등과 같은 회로에 대한 신호 전달특성등을 자동으로 검사하는 장치에 관한 것이다.The present invention relates to an apparatus for automatically checking signal transmission characteristics for a circuit such as an amplification circuit.
본 발명의 기술적인 구성은 전체 통신을 제어하고, 기준치와 측정치를 비교하여 그 양호성을 판단하는 중앙처리장치(100); 상기 중앙처리장치(100)와 각각의 블록간에 신호를 인더페이싱히는 인터페이스(120); 상기 중앙처리장치(100)의 제어하에서 특정 파형을 발생시키고, 이 파형을 검사할 회로로 입력하는 파형 발생수단(120); 상기 파형발생수단의 출력파형을 입력으로 하는 피측정회로(130); 상기 검사할 회로로 부터 출력되는 파형중에 상기 파형발생수단(120)에서 발생된 주파수대의 파형을 제거하는 파형 제거용 필터(140); 및 상기 파형 제거용 필터로 출력되는 노이즈를 분석하는 분석기(150)를 구비하여 이루어진 것이다.Technical configuration of the present invention comprises a central processing unit (100) for controlling the overall communication, comparing the reference value and the measured value to determine the goodness; An interface 120 for interfacing a signal between the CPU 100 and each block; Waveform generating means (120) for generating a specific waveform under the control of the central processing unit (100) and inputting the waveform to a circuit to be inspected; A circuit under measurement 130 which takes an output waveform of the waveform generating means as an input; A waveform removing filter 140 for removing waveforms in the frequency band generated by the waveform generating means 120 among the waveforms output from the circuit to be examined; And an analyzer 150 for analyzing the noise output to the waveform removing filter.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제1도는 본 발명에 따른 회로 특성 자동검사 장치를 도시한 블록도이다.1 is a block diagram showing a circuit characteristic automatic inspection device according to the present invention.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940028433A KR960014960A (en) | 1994-10-31 | 1994-10-31 | Circuit characteristic automatic inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940028433A KR960014960A (en) | 1994-10-31 | 1994-10-31 | Circuit characteristic automatic inspection device |
Publications (1)
Publication Number | Publication Date |
---|---|
KR960014960A true KR960014960A (en) | 1996-05-22 |
Family
ID=66687438
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940028433A KR960014960A (en) | 1994-10-31 | 1994-10-31 | Circuit characteristic automatic inspection device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960014960A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100476677B1 (en) * | 1997-11-17 | 2005-07-07 | 삼성전자주식회사 | Electrostatic Chuck of Ion Implantation Device for Semiconductor Device Manufacturing |
-
1994
- 1994-10-31 KR KR1019940028433A patent/KR960014960A/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100476677B1 (en) * | 1997-11-17 | 2005-07-07 | 삼성전자주식회사 | Electrostatic Chuck of Ion Implantation Device for Semiconductor Device Manufacturing |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |