KR960014960A - Circuit characteristic automatic inspection device - Google Patents

Circuit characteristic automatic inspection device Download PDF

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Publication number
KR960014960A
KR960014960A KR1019940028433A KR19940028433A KR960014960A KR 960014960 A KR960014960 A KR 960014960A KR 1019940028433 A KR1019940028433 A KR 1019940028433A KR 19940028433 A KR19940028433 A KR 19940028433A KR 960014960 A KR960014960 A KR 960014960A
Authority
KR
South Korea
Prior art keywords
waveform
circuit
generating means
processing unit
central processing
Prior art date
Application number
KR1019940028433A
Other languages
Korean (ko)
Inventor
김봉석
Original Assignee
배순훈
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 배순훈, 대우전자 주식회사 filed Critical 배순훈
Priority to KR1019940028433A priority Critical patent/KR960014960A/en
Publication of KR960014960A publication Critical patent/KR960014960A/en

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Abstract

본 발명은 증폭회로등과 같은 회로에 대한 신호 전달특성등을 자동으로 검사하는 장치에 관한 것이다.The present invention relates to an apparatus for automatically checking signal transmission characteristics for a circuit such as an amplification circuit.

본 발명의 기술적인 구성은 전체 통신을 제어하고, 기준치와 측정치를 비교하여 그 양호성을 판단하는 중앙처리장치(100); 상기 중앙처리장치(100)와 각각의 블록간에 신호를 인더페이싱히는 인터페이스(120); 상기 중앙처리장치(100)의 제어하에서 특정 파형을 발생시키고, 이 파형을 검사할 회로로 입력하는 파형 발생수단(120); 상기 파형발생수단의 출력파형을 입력으로 하는 피측정회로(130); 상기 검사할 회로로 부터 출력되는 파형중에 상기 파형발생수단(120)에서 발생된 주파수대의 파형을 제거하는 파형 제거용 필터(140); 및 상기 파형 제거용 필터로 출력되는 노이즈를 분석하는 분석기(150)를 구비하여 이루어진 것이다.Technical configuration of the present invention comprises a central processing unit (100) for controlling the overall communication, comparing the reference value and the measured value to determine the goodness; An interface 120 for interfacing a signal between the CPU 100 and each block; Waveform generating means (120) for generating a specific waveform under the control of the central processing unit (100) and inputting the waveform to a circuit to be inspected; A circuit under measurement 130 which takes an output waveform of the waveform generating means as an input; A waveform removing filter 140 for removing waveforms in the frequency band generated by the waveform generating means 120 among the waveforms output from the circuit to be examined; And an analyzer 150 for analyzing the noise output to the waveform removing filter.

Description

회로 특성 자동검사 장치Circuit characteristic automatic inspection device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 따른 회로 특성 자동검사 장치를 도시한 블록도이다.1 is a block diagram showing a circuit characteristic automatic inspection device according to the present invention.

Claims (1)

전체 통신을 제어하고, 기준치와 측정치를 비교하여 그 양호성을 판단하는 중앙처리장치(100); 상기 중앙처리장치(100)와 각각의 블록간에 신호를 인터페이싱히는 인터페이스(120); 상기 중앙처리장치(100)의 제어하에서 특정 파형을 발생시키고, 이 파형을 검사할 회로로 입력하도록 하는 파형 발생수단(120); 상기 파형발생수단의 출력파형을 입력으로 하는 피측정회로(130); 상기 검사할 회로로 부터 출력되는 파형중에 상기 파형발생수단(120)에서 발생된 주파수대의 파형을 제거하도록 하는 파형 제거용 필터(140); 및 상기 파형 제거용 필터로 출력되는 노이즈를 분석하는 분석기(150)를 구비하여 이루어진 것을 특징으로 하는 회로 특성 자동검사 장치.A central processing unit (100) for controlling the whole communication and comparing the reference value with the measured value to determine the goodness; An interface 120 for interfacing a signal between the central processing unit 100 and each block; Waveform generating means (120) for generating a specific waveform under the control of the central processing unit (100) and inputting the waveform into a circuit to be inspected; A circuit under measurement 130 which takes an output waveform of the waveform generating means as an input; A waveform removing filter 140 for removing waveforms in the frequency band generated by the waveform generating means 120 among the waveforms output from the circuit to be examined; And an analyzer (150) for analyzing the noise output to the filter for removing the waveform. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940028433A 1994-10-31 1994-10-31 Circuit characteristic automatic inspection device KR960014960A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019940028433A KR960014960A (en) 1994-10-31 1994-10-31 Circuit characteristic automatic inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940028433A KR960014960A (en) 1994-10-31 1994-10-31 Circuit characteristic automatic inspection device

Publications (1)

Publication Number Publication Date
KR960014960A true KR960014960A (en) 1996-05-22

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940028433A KR960014960A (en) 1994-10-31 1994-10-31 Circuit characteristic automatic inspection device

Country Status (1)

Country Link
KR (1) KR960014960A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100476677B1 (en) * 1997-11-17 2005-07-07 삼성전자주식회사 Electrostatic Chuck of Ion Implantation Device for Semiconductor Device Manufacturing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100476677B1 (en) * 1997-11-17 2005-07-07 삼성전자주식회사 Electrostatic Chuck of Ion Implantation Device for Semiconductor Device Manufacturing

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E902 Notification of reason for refusal
E601 Decision to refuse application