KR970071052A - Flicker automatic inspection adjustment device and method of TFT-LCD module - Google Patents

Flicker automatic inspection adjustment device and method of TFT-LCD module Download PDF

Info

Publication number
KR970071052A
KR970071052A KR1019960010988A KR19960010988A KR970071052A KR 970071052 A KR970071052 A KR 970071052A KR 1019960010988 A KR1019960010988 A KR 1019960010988A KR 19960010988 A KR19960010988 A KR 19960010988A KR 970071052 A KR970071052 A KR 970071052A
Authority
KR
South Korea
Prior art keywords
tft
lcd module
flicker
value
adjusting
Prior art date
Application number
KR1019960010988A
Other languages
Korean (ko)
Other versions
KR0178705B1 (en
Inventor
최진욱
Original Assignee
구자홍
Lg 전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 구자홍, Lg 전자주식회사 filed Critical 구자홍
Priority to KR1019960010988A priority Critical patent/KR0178705B1/en
Publication of KR970071052A publication Critical patent/KR970071052A/en
Application granted granted Critical
Publication of KR0178705B1 publication Critical patent/KR0178705B1/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0247—Flicker reduction other than flicker reduction circuits used for single beam cathode-ray tubes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Liquid Crystal (AREA)

Abstract

본 발명은 TFT-LCD(thin film transistor-liquid crystal display)모듈의 완제품을 출하하기 전 상기 TFT-LCD모듈의 화면 플리커(flicker)를 자동으로 검사 및 조정하는 TFT-LCD모듈의 플리커 자동 검사 조정장치 및 그 방법에 관한 것으로서, TFT-LCD모율의 플리커를 자동으로 검사하고 조정하기 때문에 플리커를 정확하고 일관되게 검사 및 조정할 수 있어 상기 TFT-LCD모듈 완제품의 출하시 불량 발생률이 현저히 감소되고, 검사원의 수를 줄일 수 있어 TFT-LCD모듈의 제조비용이 절감되며, 각 라인의 TFT-LCD모듈의 평가 데이터를 축적하여 전체 라인의 품질관리를 할 수 있는 잇점이 있다.The present invention relates to a flicker automatic inspection adjusting device of a TFT-LCD module for automatically inspecting and adjusting a screen flicker of the TFT-LCD module before shipping a finished product of a TFT-LCD (thin film transistor-liquid crystal display) And flicker of the TFT-LCD module is automatically inspected and adjusted. Therefore, the flicker can be accurately and consistently inspected and adjusted, and the incidence of defective products in the finished product of the TFT-LCD module is significantly reduced, It is possible to reduce the manufacturing cost of the TFT-LCD module and to accumulate the evaluation data of the TFT-LCD module of each line, thereby achieving the quality control of the entire line.

Description

TFT-LCD모듈의 플리커 자동 검사 조정장치 및 그 방법Flicker automatic inspection adjustment device and method of TFT-LCD module

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is a trivial issue, I did not include the contents of the text.

제2도는 본 발명에 의한 TFT-LCD모듈의 플리커 자동 검사 조정장치 간략화된 구성을 나타내는 블록도, 제3도는 본 발명에 의한 TFT-LCD모듈의 플리커 자동 검사 조정방법을 나타내는 흐름도.FIG. 2 is a block diagram showing a simplified configuration of a flicker automatic test adjusting device of a TFT-LCD module according to the present invention, FIG. 3 is a flowchart showing a flicker automatic test adjusting method of a TFT-LCD module according to the present invention.

Claims (4)

전체 시스템을 제어하는 마이컴과; 상기 마이컴의 제어를 받아 검사 대상인 TFT-LCD(thin film ransistor-liquid crystal display)모듈을 촬영하는 영상 촬영부와; 상기 마이컴의 제어를 받아 상기 TFT-LCD모듈에 영상신호를 공급하는 영상신호 공급부와; 상기 마이컴의 제어를 받아 상기 TFT-LCD모듈의 플리커(flicker)조정단자를 조정하는 조정단자 조정부와; 상기 마이컴의 제어를 받아 상기 TFT-LCD모듈을 검사 위치로 이송시킨 다음 상기 조정단자 조정부와의 결합이 용이하도록 상기 TFT-LCD모듈의 위치를 얼라인먼트(alignment)하는 모듈 이송부로 구성된 것을 특징으로 하는 TFT-LCD모듈의 플리커 자동 검사 조정장치.A microcomputer for controlling the entire system; An image capturing unit for capturing a TFT-LCD (thin film transistor-liquid crystal display) module under the control of the microcomputer; A video signal supply unit for supplying a video signal to the TFT-LCD module under the control of the microcomputer; An adjusting terminal adjusting unit for adjusting a flicker adjusting terminal of the TFT-LCD module under the control of the microcomputer; And a module transfer unit for transferring the TFT-LCD module to an inspection position under the control of the microcomputer and then aligning the position of the TFT-LCD module so as to facilitate connection with the adjustment terminal adjustment unit. - Flicker automatic inspection adjustment device of LCD module. 검사 대상인 TFT-LCD모듈을 검사위치로 이송시킨 다음 그 위치를 얼라인먼트하는 제1과정과; 상기 TFT-LCD모듈에 영상신호를 공급하는 제2과정과; 상기 TFT-LCD모듈을 촬영하여 사전 설정된 영역의 계조값 평균치를 계산하는 제3과정과; 상기 제3과정에서 계산된 계조값 평균치가 사전 설정된 기준치 이하이면 상기 TFT-LCD모듈을 정상으로 판단하는 제4과정과; 상기 제3과정에서 계산된 계조값 평균치가 상기 기준치를 초과하면 상기 TFT-LCD모듈의 플리커 조정단자를 돌리면서 화면 플리커를 조정하고, 상기 플리커 조정단자를 1사이클 들린후에도 상기 계조값 평균치가 기준치를 초과하면 상기 TFT-LCD모듈을 불량으로 판단하는 제5과정으로 이루어진 것을 특징으로 하는 TFT-LCD모듈의 플리커 자동 검사 조정방법.A first step of transferring a TFT-LCD module to be inspected to an inspection position and aligning the position; A second step of supplying a video signal to the TFT-LCD module; A third step of photographing the TFT-LCD module and calculating a tone value average value in a predetermined area; A fourth step of determining that the TFT-LCD module is normal if the average value of the tone values calculated in the third step is less than a predetermined reference value; Adjusting the screen flicker while rotating the flicker adjusting terminal of the TFT-LCD module if the average value of the gray-level values calculated in the third step exceeds the reference value, and when the average value of the gray- And determining that the TFT-LCD module is defective if it is determined that the TFT-LCD module is defective. 제2항에 있어서, 상기 제3과정은 상기 TFT-LCD모듈을 촬영하여 촬영된 영상의 좌표값 및 각 좌표값에 해당되는 계조값을 출력하는 제1단계와, 상기 제1단계에서 출력되는 계조값 중 사전 설정된 영역에 해당되는 계조값을 검출하여 그 계조값 평균치를 계산하는 제2단계로 이루어진 것을 특징으로 하는 TFT-LCD모듈의 플리커 자동 검사 조정방법.3. The method according to claim 2, wherein the third step comprises: a first step of photographing the TFT-LCD module and outputting a coordinate value of the photographed image and a gray level value corresponding to each coordinate value; And a second step of detecting a gray level value corresponding to a predetermined area of the gray level value and calculating an average gray level value of the gray level value. 제2항에 있어서, 상기 제5과정은 상기 플리커 조정단자를 지정된 간격만큼 조정하는 제1단계와; 상기 제1단계 후 TFT-LCD모듈을 촬영하여 사전 설정된 영역의 계조값 평균치를 계산하는 제2단계와; 상기 제2단계에서 계산된 계조값 평균치가 상기 기준치 이하이면 플리커 조정을 완료하는 제3단계와; 상기 제2단계에서 계산된 계조값 평균치가 상기 기준치를 초과하면 상기 플리커 조정단자의 1사이클 초과여부를 판단하는 제4단계와; 상기 제4단계에서 플리커 조정단자의 회전이 1사이클을 초과하지 않았으면 상기 제1단계부터 반복 수행하는 제5단계와; 상기 제4단계에서 플리커 조정단자의 회전이 1사이클을 초과하였으면 상기 TFT-LCD모듈을 불량으로 판단하는 제6단계로 이루어진 것을 특징으로 하는 TFT-LCD모듈의 플리커 자동 검사 조정방법.The method of claim 2, wherein the fifth step comprises: a first step of adjusting the flicker adjusting terminal by a predetermined interval; A second step of photographing the TFT-LCD module after the first step and calculating a tone value average value in a predetermined area; A third step of completing the flicker adjustment if the average gray level value calculated in the second step is less than the reference value; A fourth step of determining whether the flicker adjusting terminal exceeds one cycle if the average value of gray level values calculated in the second step exceeds the reference value; A fifth step of repeating the first step if the rotation of the flicker adjusting terminal does not exceed one cycle in the fourth step; And a sixth step of determining that the TFT-LCD module is defective if the rotation of the flicker adjusting terminal exceeds one cycle in the fourth step. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: It is disclosed by the contents of the first application.
KR1019960010988A 1996-04-12 1996-04-12 Fliker auto-monitoring instrument of tft-lcd module and monitoring method KR0178705B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019960010988A KR0178705B1 (en) 1996-04-12 1996-04-12 Fliker auto-monitoring instrument of tft-lcd module and monitoring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960010988A KR0178705B1 (en) 1996-04-12 1996-04-12 Fliker auto-monitoring instrument of tft-lcd module and monitoring method

Publications (2)

Publication Number Publication Date
KR970071052A true KR970071052A (en) 1997-11-07
KR0178705B1 KR0178705B1 (en) 1999-05-01

Family

ID=19455572

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960010988A KR0178705B1 (en) 1996-04-12 1996-04-12 Fliker auto-monitoring instrument of tft-lcd module and monitoring method

Country Status (1)

Country Link
KR (1) KR0178705B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000008598A (en) * 1998-07-14 2000-02-07 윤종용 Apparatus and method for testing flicker of lcd
KR100738325B1 (en) * 2005-10-27 2007-07-12 주식회사 이너텍 Testing Device for a plurality of Display Modules

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000008598A (en) * 1998-07-14 2000-02-07 윤종용 Apparatus and method for testing flicker of lcd
KR100738325B1 (en) * 2005-10-27 2007-07-12 주식회사 이너텍 Testing Device for a plurality of Display Modules

Also Published As

Publication number Publication date
KR0178705B1 (en) 1999-05-01

Similar Documents

Publication Publication Date Title
JP3297950B2 (en) Flat panel inspection system
US7733318B2 (en) Display device and method for adjusting a voltage for driving a display device
WO2003098242A3 (en) Testing liquid crystal microdisplays
JPH055709A (en) Screen inspection device
US11004419B1 (en) Mura compensation optimization method and system for liquid crystal display panel
CN105092473A (en) Polysilicon thin film quality detection method and system
JPH0865000A (en) Visual tester for printed-circuit board
KR970071052A (en) Flicker automatic inspection adjustment device and method of TFT-LCD module
CN111613157A (en) Mura repair test method of display panel, display panel and display device
JPH0461345B2 (en)
KR20110094043A (en) Treatment liquid ejection inspecting method, treatment liquid ejection inspecting apparatus and computer readable recording medium
EP1494014B1 (en) System with a ferro-electric liquid crystal for two-fold optical inspection of containers
KR100257742B1 (en) Apparatus for detecting defect of lcd device
JP2004294290A (en) Apparatus for inspecting display defect of display panel
JPH06242410A (en) Lcd display body inspecting device
JPH10282923A (en) Display device with automatic luminance adjusting function
JPH0798574A (en) Liquid crystal inspection instrument
JPH06130920A (en) Automatic adjusting device for liquid crystal display panel
JPH06236162A (en) Test method for defect of color liquid crystal panel and device for test
JP2006266786A (en) Display inspection device for electro-optical device, and display inspection method
KR0159681B1 (en) Flicker auto control and checking system for tft-lcd module
JPH0293871A (en) Uniformity checking method
JPH08122726A (en) Liquid crystal panel inspecting device
KR20070105027A (en) A testing apparatus and a method of a back light unit
JP3189966B2 (en) Liquid crystal display inspection equipment

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20030409

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee