CN111613157A - Mura repair test method of display panel, display panel and display device - Google Patents
Mura repair test method of display panel, display panel and display device Download PDFInfo
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- CN111613157A CN111613157A CN201910134233.3A CN201910134233A CN111613157A CN 111613157 A CN111613157 A CN 111613157A CN 201910134233 A CN201910134233 A CN 201910134233A CN 111613157 A CN111613157 A CN 111613157A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The invention relates to a Mura repair test method of a display panel, which comprises the following steps: acquiring Mura compensation data of a panel to be tested; bringing the Mura compensation data into the panel to be tested; and judging whether the Mura compensation data is brought into the panel to be tested. The method provided by the invention utilizes an automatic detection circuit to judge whether Mura compensation data is led in by TCON or not when a lighting machine tests the display panel in advance, and outputs a judgment result that the lighting is normal when the Mura compensation data is brought into the panel; when the Mura compensation data is not brought into the panel, the judgment result of abnormal light-out is output, the probability of judgment errors during the lighting test is reduced, the delivery efficiency is improved, unnecessary follow-up work and unnecessary cost are avoided, and the loss is reduced.
Description
Technical Field
The invention belongs to the technical field of display, and particularly relates to a Mura repair test method of a display panel, the display panel and a display device.
Background
With the development of stereoscopic display technology, people are more and more pursuing high-definition realistic experience effects of stereoscopic display for televisions, movies and the like, and liquid crystal panels are main components for achieving the purpose. Because the liquid crystal display panel has factors such as process deviation, characteristic difference between liquid crystal molecules and the like in the production process, the liquid crystal display panel can show that the brightness of each region position has difference under a pure color fixed gray scale picture, and the phenomenon of uneven brightness (Mura) of the display panel is formed. At present, this problem is generally solved by improving the manufacturing process, and some of the problems that cannot be completely improved are solved by the Demura (brightness and dark unevenness compensation) technique.
For the display Panel (Panel) which is already manufactured, the physical characteristics are already shaped, and in order to compensate the Mura phenomenon generated by the flaws in the manufacturing process, the brightness of the pixel points can be corrected by a gray scale compensation mode, so that the Mura phenomenon is improved. The gray scale compensation is to change the gray scale of the pixel to realize the improvement of the brightness uniformity: the Mura condition of a gray scale picture is shot by a camera, when an input image is a single gray scale picture (theoretically, the transmitted brightness of all pixels is the same), a certain gray scale compensation value is added to the pixels in a dark area (brightness is improved) and a certain gray scale compensation value is reduced to the pixels in a bright area (brightness is reduced) according to the brightness of the central area of a panel; namely, for the pixel with higher display brightness, the original gray scale is reduced by a certain compensation value, and for the pixel with lower display brightness, the original gray scale is increased by a certain compensation value, so that the brightness of each pixel after gray scale compensation is close to the same, and the Mura phenomenon is improved.
The Mura repairing method of the liquid crystal display panel in the related technology mainly comprises the steps of matching a camera with a corresponding algorithm, shooting the gray-scale Mura condition of the liquid crystal display panel by the camera, carrying out image processing calculation by the algorithm, comparing the brightness difference between the peripheral area and the central area based on the brightness of the central area of the panel, converting compensation gray scale value (gray scale value of dark area needs to be improved, Mura compensation data is positive number, gray scale value of bright area needs to be reduced, Mura compensation data is negative number) required by Mura position brightness adjustment under current gray scale according to panel gamma curve (one-to-one corresponding relation curve of brightness and gray scale), finally storing the Mura compensation data of fixed position pixel in flash according to format required by screen driving board chip (TCON), when the TCON starts to work, Mura compensation data can be read from the flash, and the Mura compensation data is brought into the panel, and then the panel is tested.
However, after the Mura compensation data is brought into the panel, in the process of testing the display screen by the lighting test device, the lighting test cannot detect the Mura compensation data, and it is considered that the Mura compensation data is not brought into the screen by the TCON, but the Mura compensation data is brought into the screen by the actual TCON.
Disclosure of Invention
In order to solve the above problems in the prior art, the present invention provides a Mura repair test method for a display panel. The technical problem to be solved by the invention is realized by the following technical scheme:
the embodiment of the invention provides a Mura repair test method of a display panel, which comprises the following steps:
acquiring Mura compensation data of a panel to be tested;
bringing the Mura compensation data into the panel to be tested;
and judging whether the Mura compensation data is brought into the panel to be tested.
In one embodiment of the present invention, acquiring Mura compensation data of a panel to be tested comprises:
acquiring an original picture image;
and extracting the Mura shape in the original picture image to form Mura image data.
And acquiring mirror compensation data of the Mura image data according to the Mura image data to form the Mura compensation data.
In one embodiment of the present invention, bringing the Mura compensation data to the panel under test comprises:
burning the Mura compensation data to the TCON;
and utilizing the TCON to bring the Mura compensation data into the panel to be tested.
In one embodiment of the present invention, the determining whether the Mura compensation data is brought into the panel to be tested comprises:
installing an automatic detection circuit on the lighting machine;
judging whether the lighting machine and the automatic detection circuit are conducted or not and outputting a judgment result;
and judging whether the Mura compensation data is brought into the panel to be tested according to the judgment result.
In one embodiment of the present invention, the auto-detection circuit includes:
the circuit comprises a resistor R1, a resistor R2, an indicator lamp L1, an interface X1 and an interface X2;
one end of the resistor R1 is connected with the indicator light L1, and the other end is grounded;
one end of the resistor R2 is connected with the interface X1, and the other end of the resistor R2 is connected with the interface X2;
one end of the indicator light L1 is connected with the interface X1, and the other end of the indicator light L1 is connected with the resistor R1;
one end of the interface X2 is connected with the resistor R2, and the other end is connected with a power supply.
In an embodiment of the present invention, the determination result includes a normal lighting or abnormal lighting.
Another embodiment of the present invention provides a display panel manufactured by the testing method of any one of the above embodiments.
Another embodiment of the present invention is a display device including the display panel according to the above embodiment.
Compared with the prior art, the invention has the beneficial effects that:
the method provided by the invention utilizes an automatic detection circuit to judge whether Mura compensation data is led in by TCON or not when a lighting machine tests the display panel in advance, and outputs a judgment result that the lighting is normal when the Mura compensation data is brought into the panel; when the Mura compensation data is not brought into the panel, the judgment result of abnormal light-out is output, the probability of judgment error during the light-on test is reduced, unnecessary follow-up work and unnecessary cost are avoided, the delivery efficiency is improved, and the loss is reduced.
Drawings
Fig. 1 is a schematic flow chart of a Mura repair testing method for a display panel according to an embodiment of the present invention.
Fig. 2 is a circuit diagram showing a disconnection of an auto-detection circuit in a Mura repair test method for a display panel according to an embodiment of the present invention;
fig. 3 is a conducting circuit diagram of an automatic detection circuit in a Mura repairing test method for a display panel according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to specific examples, but the embodiments of the present invention are not limited thereto.
Example one
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
Referring to fig. 1, fig. 1 is a schematic flow chart illustrating a Mura repair testing method for a display panel according to an embodiment of the present invention.
The embodiment of the invention provides a Mura repair test method of a display panel, which comprises the following steps:
acquiring Mura compensation data of a panel to be tested;
introducing Mura compensation data into a panel to be tested;
and judging whether the Mura compensation data is brought into the panel to be tested.
Specifically, because the liquid crystal display panel has factors such as process deviation and characteristic difference among liquid crystal molecules in the production process, the liquid crystal display panel can show the difference of brightness of each region position under a pure color fixed gray scale picture, and the phenomenon of uneven brightness (Mura) of the display panel is formed.
The existing Mura repairing method mainly comprises a camera matching with a corresponding algorithm, wherein the camera shoots the condition of the Mura gray scale of the liquid crystal display panel, the algorithm carries out image processing calculation, the brightness of the central area of the panel is taken as a reference, the brightness difference between the peripheral area and the central area is compared, the compensation gray scale value required by the adjustment of the Mura position brightness under the current gray scale is converted according to a gamma curve of the panel, finally, the Mura compensation data of pixels with fixed positions are stored in a flash according to the format required by TCON, the Mura compensation data are read from the flash when the TCON starts to work, are brought into the panel, and then the panel is tested.
According to the invention, by judging whether the Mura compensation data is brought into the panel to be tested, the problem that the Mura compensation data cannot be detected because the Mura compensation data is brought into the panel to be tested due to wire damage, poor wire contact or poor wire jig is detected in advance, the probability of judgment errors during lighting test is reduced, unnecessary subsequent work and unnecessary cost are avoided, the delivery efficiency is improved, and the loss is reduced.
In particular, in an embodiment of the present invention, acquiring Mura compensation data of a panel to be tested includes:
acquiring an original picture image;
extracting a Mura shape in an original picture image to form Mura image data;
and acquiring mirror compensation data of the Mura image data according to the Mura image data to form compensation data.
Specifically, an original picture image is obtained by taking a picture through a CCD camera, and a display panel electrically connected with the panel is controlled. Before detection, a driver is required to light up the display panel, and the display panel can be driven to a specific gray level, for example, a full bright, 50% gray level or full dark state. In the embodiment of the present invention, the photographing is performed in a 50% gray scale state.
And then, under the conditions of meeting certain environmental temperature, humidity, brightness, shooting distance, visual angle and the like, acquiring the original picture data of the Mura area in the display panel by using a CCD camera. And then sending the collected original picture data to a control panel for image processing to obtain Mura image data.
And acquiring mirror compensation data of the Mura image data according to a mirror reflection principle to form compensation data, storing the compensation data into the TCON, and performing Mura compensation on the panel to be tested by calling the Mura compensation data in the TCON when the lighting machine is started to test the display panel each time.
In particular, in an embodiment of the present invention, bringing Mura compensation data into a panel under test comprises:
burning the Mura compensation data to the TCON;
and carrying the Mura compensation data into the panel to be tested by using the TCON.
Specifically, a display panel to be tested is placed on a test fixture, a light shield is covered, and a power supply of the test fixture is opened to start testing; the driving control circuit and the backlight control circuit on the singlechip respectively send a driving control signal and a backlight control signal to the backlight circuit in the driving circuit on the driving circuit board of the display panel to be tested, so that the display panel to be tested displays a test picture with black top and white bottom.
The two photoreceptors of the photoreceptor circuit respectively sense the brightness of the upper half screen and the lower half screen of the display panel and output two paths of voltage values to the ADC circuit, and the ADC circuit converts the two paths of voltage values into two paths of digital signals and transmits the two paths of digital signals to the singlechip; the singlechip restores the two paths of received digital signals into two paths of voltage values, converts the two paths of voltage values into two paths of brightness values, calculates the ratio of the two paths of brightness values, namely calculates the contrast of the current display panel to be tested, and stores the contrast in a register in the singlechip; the driving control circuit of the singlechip outputs driving voltage compensation data to the driving circuit; the driving circuit adjusts the output driving voltage (increases or decreases the driving voltage) according to the driving voltage compensation data, so that the display panel to be tested displays black-on-black and white-off test pictures according to the adjusted driving voltage; the two photoreceptors of the photoreceptor circuit respectively sense the brightness of the upper half screen and the lower half screen of the display panel to be tested again, and output two paths of voltage values to the ADC circuit; the ADC circuit converts the two voltage values into two digital signals again and transmits the two digital signals to the single chip microcomputer; the singlechip calculates the contrast of the display panel to be tested according to the received two paths of digital signals again, and stores the contrast in a register in the singlechip; judging whether a register in the singlechip registers a preset number of contrasts or not; the singlechip outputs driving voltage compensation data corresponding to the maximum contrast to the driving circuit, and meanwhile, a DC boost control circuit of the singlechip sends a control signal to a DC-DC boost circuit of the driving circuit board to enable the DC-DC boost circuit to provide a burning voltage VPP to the driving circuit, so that the driving circuit 111 burns the driving voltage compensation data corresponding to the maximum contrast in a register of the driving circuit; and after the burning is finished, closing the power supply of the test fixture, taking out the display panel to be tested, and putting the next display panel to be tested in.
Specifically, in an embodiment of the present invention, the determining whether the Mura compensation data is brought into the panel to be tested includes:
installing an automatic detection circuit on the lighting machine;
judging whether the lighting machine and the automatic detection circuit are conducted or not and outputting a judgment result;
and judging whether the Mura compensation data is brought into the panel to be tested according to the judgment result.
Particularly, in an embodiment of the present invention, the determination result includes one of a normal lighting and an abnormal lighting.
Specifically, after the compensation data acquisition and burning are completed, it is necessary to detect whether the Mura compensation data is brought into the panel to be tested. Firstly, adding an automatic detection circuit on a CB of a lighting machine; judging whether the CB and the PCBA of the lighting machine are conducted after passing through the automatic detection circuit to judge whether the compensation data in the TCON are led into a panel to be tested; if the test circuit is conducted, the compensation data is brought into the picture of the panel to be tested normally, the indication lamp in the automatic detection circuit is lightened to indicate the normal state, and the next panel to be tested is switched. If the indicator light is not on, the Mura compensation data can be judged to be brought in and can not be detected due to wire damage, poor wire contact or poor wire jig, and the machine needs to be stopped for troubleshooting and timely treatment. And when the fault is eliminated, the test is carried out again until the indicator lamp is lightened again, and the condition that the panel to be tested is tested by the lighting machine is recovered to be normal is shown.
In particular, in one embodiment of the present invention, the auto-detection circuit comprises:
the circuit comprises a resistor R1, a resistor R2, an indicator lamp L1, an interface X1 and an interface X2;
one end of the resistor R1 is connected with the indicator light L1, and the other end is grounded;
one end of the resistor R2 is connected with the interface X1, and the other end is connected with the interface X2;
one end of an indicator lamp L1 is connected with the interface X1, and the other end is connected with the resistor R1;
one end of the interface X2 is connected with the resistor R2, and the other end is connected with a power supply.
Particularly, in the embodiment of the present invention, the determination result includes a normal lighting or abnormal lighting.
Specifically, as shown in fig. 2 and fig. 3, the auto-detection circuit is disposed in a control box of the lighting machine, and includes an indicator light L1, a resistor R1, a resistor R2, an interface X1, and an interface X2, wherein a working power supply is connected to the interface X2 through a wire, a resistor R2 is connected between the interface X2 and the interface X1 through a wire, and the indicator light L1 and the resistor R1 are connected in series, and during detection, when the indicator light is turned on, it can be determined that a line is turned on, indicating that Mura compensation data has been normally brought into a picture of a panel to be tested, and the Mura compensation of the panel to be tested is completed and switched to a next panel to be tested. If the indicator light is not on, the Mura compensation data can be judged to be brought in and can not be detected due to wire damage, poor wire contact or poor wire jig, and the machine needs to be stopped for troubleshooting and timely treatment. When the fault is checked out, the test is carried out again until the indicator light is lightened again.
Particularly, whether the Mura compensation data are brought into the panel to be tested or not is judged, the indication lamp can be replaced by a sound alarm without being limited to the indication lamp, and whether the Mura compensation data are brought into the panel to be tested or not is judged through sound. Or through color, light, number, pattern, etc.
The method provided by the invention judges whether Mura compensation data is brought into a panel to be tested by using an automatic detection circuit, judges whether the TCON introduces the Mura compensation data in advance, and outputs a judgment result that a lamp is normally turned on when the Mura compensation data is brought into the panel; when the Mura compensation data is not brought into the panel, the judgment result of abnormal light-out is output, the probability of judgment errors during the lighting test is reduced, the delivery efficiency is improved, unnecessary follow-up work and unnecessary cost are avoided, and the loss is reduced.
The method provided by the invention can also judge whether the Mura supplementary data is brought into the panel to be tested through sound, judge whether the Mura compensation data is brought into the panel to be tested by utilizing an automatic detection circuit, judge whether the TCON introduces the Mura compensation data or not, carry out pre-judgment, and output a normal judgment result when the Mura compensation data is brought into the panel; when the Mura compensation data is not brought into the panel, the abnormal sound signal for alarming is output, the judgment result is output, the probability of judgment error in lighting test is reduced, the delivery efficiency is improved, unnecessary follow-up work and unnecessary cost are avoided, and the loss is reduced.
The invention provides a display panel on the basis of the above embodiments, which is manufactured by the Mura repair test method mentioned in the above embodiments.
In addition, the embodiment of the invention also provides a display device, and the display device can comprise the display panel prepared by the method provided by the embodiment. The display device may be: any product or component with a display function, such as an LTPO display device, a Micro LED display device, a liquid crystal panel, electronic paper, an OLED panel, an AMOLED panel, a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, and the like.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (8)
1. A Mura repair test method of a display panel is characterized by comprising the following steps:
acquiring Mura compensation data of a panel to be tested;
bringing the Mura compensation data into the panel to be tested;
and judging whether the Mura compensation data is brought into the panel to be tested.
2. The method of claim 1, wherein obtaining Mura compensation data for a panel under test comprises:
acquiring an original picture image;
and extracting the Mura shape in the original picture image to form Mura image data.
And acquiring mirror compensation data of the Mura image data according to the Mura image data to form the Mura compensation data.
3. The method of claim 1, wherein bringing the Mura compensation data to the panel under test comprises:
burning the Mura compensation data to the TCON;
and utilizing the TCON to bring the Mura compensation data into the panel to be tested.
4. The method of claim 1, wherein determining whether the Mura compensation data is brought into the panel under test comprises:
installing an automatic detection circuit on the lighting machine;
judging whether the lighting machine and the automatic detection circuit are conducted or not and outputting a judgment result;
and judging whether the Mura compensation data is brought into the panel to be tested according to the judgment result.
5. The method of claim 4, wherein the auto-detection circuit comprises:
the circuit comprises a resistor R1, a resistor R2, an indicator lamp L1, an interface X1 and an interface X2;
one end of the resistor R1 is connected with the indicator light L1, and the other end is grounded;
one end of the resistor R2 is connected with the interface X1, and the other end of the resistor R2 is connected with the interface X2;
one end of the indicator light L1 is connected with the interface X1, and the other end of the indicator light L1 is connected with the resistor R1;
one end of the interface X2 is connected with the resistor R2, and the other end is connected with a power supply.
6. The method of claim 4, wherein the determination result comprises normal lighting or abnormal lighting.
7. A display panel manufactured by the test method according to any one of claims 1 to 6.
8. A display device characterized by comprising the display panel according to claim 7.
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| CN201910134233.3A CN111613157A (en) | 2019-02-22 | 2019-02-22 | Mura repair test method of display panel, display panel and display device |
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