CN101593480A - The inspection method of display panel - Google Patents
The inspection method of display panel Download PDFInfo
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- CN101593480A CN101593480A CNA2009101063007A CN200910106300A CN101593480A CN 101593480 A CN101593480 A CN 101593480A CN A2009101063007 A CNA2009101063007 A CN A2009101063007A CN 200910106300 A CN200910106300 A CN 200910106300A CN 101593480 A CN101593480 A CN 101593480A
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Abstract
The present invention is applicable to the display technique field, a kind of inspection method of display panel is provided, described display panel has a plurality of dot structures, described inspection method comprises the steps: to provide a test panel, and test panel has a plurality of inspection dot structures, and each checks that dot structure has a photosensory assembly; Test panel and display panel are carried out contraposition, make and check dot structure respective pixel structure; Light display panel; And the briliancy of detecting dot structure with the photosensory assembly of test panel.
Description
Technical field
The invention belongs to the display technique field, relate in particular to a kind of inspection method of display panel.
Background technology
Display panels (LCD panel) has been widely used in desktop PC, mobile computer, TV and other the various electronic products.After display panels completed, before root module was done the encapsulation and system's connection of drive IC after delivering to, necessary elder generation was through the processing procedure of one lighting test, to determine the product quality situation.
Usually have a termination environment (terminal) in the marginal portion of display panels, it is by a flexible circuit board (flexible printed circuit; FPC) doing signal with a host computer system circuit is connected.The signal that this host computer system circuit is exported must be done signal Processing through the drive IC that is located on the circuit board earlier, and the signal of treated mistake is output to this termination environment then, to drive the pixel (pixels) on the display panels.
The lighting test of prior art is to use the board of lighting a lamp to provide voltage to tested display panels, utilizes human eye visual then, detects the various display defects of display panels.But because of adopting visual mode, it checks, thus easily cause erroneous judgement, and then increase the inspection cost of display panels.
Summary of the invention
The object of the present invention is to provide a kind of inspection method of display panel, be intended to solve prior art with the problem of the visual cause of human eye to the erroneous judgement of display panel quality.
The present invention is achieved in that a kind of inspection method of display panel, and described display panel has many dot structures, and described inspection method comprises the steps:
One test panel is provided, and described test panel has the dot structures of checking more, and each checks that dot structure has a photosensory assembly;
Described test panel and described display panel are carried out contraposition, make each check corresponding each dot structure of dot structure;
Light described display panel; And
Detect the briliancy of each dot structure with the photosensory assembly of described test panel.
Further, described display panel has at least one first alignment mark, described test panel then has at least one second alignment mark, carry out in the step of contraposition at described test panel and described display panel, described test panel is to see through described second alignment mark to aim at described first alignment mark with the contraposition of described display panel.
Further, described display panel is to couple with a tester table, and in lighting the step of described display panel, described tester table provides the electric power of lighting described display panel.
Further, described photosensory assembly is photoelectric coupling assembly or complementary metal oxide semiconductor.
In the present invention, test panel and display panel are carried out contraposition, after lighting display panel, detect the method for the briliancy of each dot structure in the described display panel by the photosensory assembly of described test panel, this inspection method not only can solve with the erroneous judgement of the visual cause of human eye to the display panel quality, and can promote speed and efficient that display panel is checked, and then the inspection cost can be lowered effectively.
Description of drawings
Fig. 1 is the synoptic diagram of the display panels that provides of preferred embodiment of the present invention;
Fig. 2 is the synoptic diagram of the test panel that provides of preferred embodiment of the present invention;
Fig. 3 is the synoptic diagram of the inspection method of the display panels that provides of preferred embodiment of the present invention;
Fig. 4 is the flow chart of steps of the inspection method of the display panels that provides of preferred embodiment of the present invention;
Fig. 5 is the synoptic diagram of the test panel that provides of another embodiment of the present invention.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
In embodiments of the present invention, proposed a kind of test panel and display panel to be carried out contraposition, after lighting display panel, detect the method for the briliancy of each dot structure in the described display panel by the photosensory assembly of described test panel, this inspection method not only can solve with the erroneous judgement of the visual cause of human eye to the display panel quality, and can promote speed and efficient that display panel is checked, and then the inspection cost can be lowered effectively.
Fig. 1 is the synoptic diagram of the display panels that provides of preferred embodiment of the present invention.Display panels 100 comprises viewing area 109, gate pole driver 103, source electrode driver 105 and alignment mark 107.In the viewing area 109 and include a plurality of dot structures 101.
Figure is the synoptic diagram of the test panel that provides of preferred embodiment of the present invention.Test panel 200 comprises sensing area 209, gate pole driver 203, source electrode driver 205 and alignment mark 207, and sensing area 209 also comprises a plurality of inspection dot structures 201.
Check that dot structure 201 comprises photosensory assembly 201a and thin film transistor (TFT) 201b, wherein photosensory assembly 201a and thin film transistor (TFT) 201b electrically connect, and, provide induction current to make test panel 200 can utilize induction current to come to display panels 100 inspection of lighting a lamp in order to light signal is transformed into electric signal.Wherein photosensory assembly can be a photoelectric coupling assembly (Charge Coupled Device; Or a complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor CCD); CMOS).
Fig. 3 is the synoptic diagram of the inspection method of the display panels that provides of preferred embodiment of the present invention.The inspection method of display panels of the present invention comprises the following step (please merge with reference to Fig. 3 and Fig. 4):
At first, can provide a test panel 200 as described in the step S402, test panel 200 has a plurality of inspection dot structures 201, and each checks that dot structure 201 has a photosensory assembly 201a.Then, test panel 200 and display panels 100 are carried out contraposition, make each check corresponding each dot structure 101 (step S404) of dot structure 201a.It should be noted that, display panels 100 has at least one contraposition mark 107, test panel 200 then has at least one contraposition mark 207, in the step of carrying out contraposition, test panel 200 and the contraposition of display panels 100 are to see through alignment mark 207 to aim at the mode of alignment mark 107 and carry out.The person of connecing as step S406, lights display panels 100.At last, with the photosensory assembly 201a of test panel 200, measure the briliancy (step S408) of dot structure 101.
In the inspection method of above-mentioned display panels, display panels 100 is to couple with a tester table.In the step of lighting display panels 100, tester table provides the electric power of lighting display panel.The embodiment of the invention is to be example with the display panels, other and the display panel that display panels has similar displaying principle, and for example, electric slurry display panel etc. also do not depart from the scope of the present invention.
When lighting a lamp the inspection processing procedure, with test panel 200 and the position and orientation of display panels 100 through alignment mark 207 with alignment mark 107 decision test panels 200 with the display panel 100 of display panels 100 of test panel 200, see through photosensory assembly 201a again and measure the briliancy of pixel, and judge its panel quality.
For example, in the inspection processing procedure of lighting a lamp, the mode switch of will lighting a lamp detects for black picture, if display panels 100 has the bright spot defective, promptly can on the opposite position of test panel 200, produce induction current, the induction current that it produced distinguishes the output scanning signal via gate distribution G*1～G*m and source electrode distribution S*1～S*n and data-signal is given gate pole driver 203 and source electrode driver 205, and by with the electric connection of tester table, can learn bright spot point position and undesirable condition by the software of tester table.
In addition, if display panels 100 has luminance nonuniformity (mura) zone, promptly can sense its magnitude of current of induction current that induction current that this luminance nonuniformity zone produced and test panel 200 other zones are produced and different in the corresponding region on the test panel 200, and can be by its faradic magnitude of current size of definition on the software of tester table, can clearly define the grade of display panels 100 defectives, minimizing is because of the judgement difference of human eye, and produce erroneous judgement product quality phenomenon, and then cause the loss on the panel cost.
In addition, according to the spirit that institute of the present invention desire is set forth, it is not limited to the described mode of the foregoing description.That is to say, under the conception of the inspection method of the above-mentioned display panels of foundation, in another embodiment of the present invention, it can pass through display panels 100 with mirror mode design test panel 500, but the pixel of its test panel 500 sensing areas need be done corresponding modification (as shown in Figure 5), so come the scrutiny program of directly lighting a lamp, can reach the spirit that institute of the present invention desire is set forth equally.
In embodiments of the present invention, by test panel and display panel are carried out contraposition, after lighting display panel, detect the method for the briliancy of each dot structure in the described display panel by the photosensory assembly of described test panel, this inspection method not only can solve with the erroneous judgement of the visual cause of human eye to the display panel quality, and can promote speed and efficient that display panel is checked, and then the inspection cost can be lowered effectively.
The above only is preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of being done within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (5)
1. the inspection method of a display panel, described display panel has many dot structures, it is characterized in that, and described inspection method comprises the steps:
One test panel is provided, and described test panel has the dot structures of checking more, and each checks that dot structure has a photosensory assembly;
Described test panel and described display panel are carried out contraposition, make each check corresponding each dot structure of dot structure;
Light described display panel; And
Detect the briliancy of each dot structure with the photosensory assembly of described test panel.
2. the inspection method of display panel as claimed in claim 1, it is characterized in that, described display panel has at least one first alignment mark, described test panel then has at least one second alignment mark, described described test panel and described display panel are carried out in the step of contraposition, described test panel is to see through described second alignment mark to aim at described first alignment mark with the contraposition of described display panel.
3. the inspection method of display panel as claimed in claim 1 is characterized in that, a described display panel and a tester table couple, and in lighting the step of described display panel, described tester table provides the electric power of lighting described display panel.
4. the inspection method of display panel as claimed in claim 1 is characterized in that, described each photosensory assembly is a photoelectric coupling assembly.
5. the inspection method of display panel as claimed in claim 1 is characterized in that, described each photosensory assembly is a complementary metal oxide semiconductor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2009101063007A CN101593480A (en) | 2009-04-13 | 2009-04-13 | The inspection method of display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2009101063007A CN101593480A (en) | 2009-04-13 | 2009-04-13 | The inspection method of display panel |
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| CN101593480A true CN101593480A (en) | 2009-12-02 |
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| CNA2009101063007A Pending CN101593480A (en) | 2009-04-13 | 2009-04-13 | The inspection method of display panel |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016004037A (en) * | 2014-06-19 | 2016-01-12 | 株式会社イクス | Luminance measurement method, luminance measurement device, and image quality adjustment technology using the same |
| CN105051506B (en) * | 2013-04-08 | 2017-06-23 | 宜客斯股份有限公司 | Brightness measurement method, brightness measuring device for camera and use their image quality adjustment technology |
| CN108303424A (en) * | 2018-01-02 | 2018-07-20 | 京东方科技集团股份有限公司 | Display panel testing and its detection method |
| WO2019019060A1 (en) * | 2017-07-26 | 2019-01-31 | 深圳市柔宇科技有限公司 | Locating method for test element group and test element group |
| CN113066410A (en) * | 2021-03-22 | 2021-07-02 | Tcl华星光电技术有限公司 | Line detection equipment and line detection method thereof |
| WO2021208478A1 (en) * | 2020-04-14 | 2021-10-21 | 深圳市华星光电半导体显示技术有限公司 | Display panel detection method and apparatus |
-
2009
- 2009-04-13 CN CNA2009101063007A patent/CN101593480A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105051506B (en) * | 2013-04-08 | 2017-06-23 | 宜客斯股份有限公司 | Brightness measurement method, brightness measuring device for camera and use their image quality adjustment technology |
| JP2016004037A (en) * | 2014-06-19 | 2016-01-12 | 株式会社イクス | Luminance measurement method, luminance measurement device, and image quality adjustment technology using the same |
| WO2019019060A1 (en) * | 2017-07-26 | 2019-01-31 | 深圳市柔宇科技有限公司 | Locating method for test element group and test element group |
| CN108303424A (en) * | 2018-01-02 | 2018-07-20 | 京东方科技集团股份有限公司 | Display panel testing and its detection method |
| WO2021208478A1 (en) * | 2020-04-14 | 2021-10-21 | 深圳市华星光电半导体显示技术有限公司 | Display panel detection method and apparatus |
| US11841627B2 (en) | 2020-04-14 | 2023-12-12 | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Display panel test method comprising the step of automatically searching for an alignment mark by obtaining position information of the display panel and display panel test device |
| CN113066410A (en) * | 2021-03-22 | 2021-07-02 | Tcl华星光电技术有限公司 | Line detection equipment and line detection method thereof |
| CN113066410B (en) * | 2021-03-22 | 2023-12-22 | Tcl华星光电技术有限公司 | Line detection device and line detection method thereof |
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