KR970067380A - Flash cell memory device - Google Patents
Flash cell memory device Download PDFInfo
- Publication number
- KR970067380A KR970067380A KR1019960009099A KR19960009099A KR970067380A KR 970067380 A KR970067380 A KR 970067380A KR 1019960009099 A KR1019960009099 A KR 1019960009099A KR 19960009099 A KR19960009099 A KR 19960009099A KR 970067380 A KR970067380 A KR 970067380A
- Authority
- KR
- South Korea
- Prior art keywords
- error correction
- data
- flash memory
- correction code
- control unit
- Prior art date
Links
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
Abstract
본 발명은 에어정정코드(ECC:Error Correction Code)를 이용하여 데이타내의 에러를 체크하고, 이를 정정하여 디바이스의 신뢰성을 향상시킬 수 있는 플래쉬 셀 메모리 디바이스장치에 관한 것으로, 이의 구성은 리드모드와 소거모드, 그리고 프로그램모드가 존재하며, 엔코딩된 데이타와 패리티 체크 비트가 저장된 플래쉬 메모리 셀에 있어서, 상기 플래쉬 메모리 셀의 데이타를 입출력시 비트에러를 검출함과 아울러 이에 대한 정정코드를 발생하는 에러정정코드 발생부를 포함하여 구성함으로써 리던던시 메모리 셀 어레이의 크기를 줄일 수 있고, 데이타 저장기간의 연장과, 플래쉬 메모리 셀에 저장된 데이타의 신뢰성을 크게 향상시킬 수 있으며, 에러정정코드장치의 알고리즘을 어떻게 구현하느냐에 따라 에러검출과 정정할 수 있는 여유를 설계자에게 제공함과 아울러 칩의 크기와 에러정정능력 사이의트레이드 오프(trade-off)를 설계자에게 제공하는 효과가 있게 된다.The present invention relates to a flash memory device capable of checking errors in data using an error correction code (ECC) and correcting the errors, thereby improving the reliability of the device. Mode and a program mode. The flash memory cell stores encoded data and parity-check bits. The flash memory cell includes an error correction code for detecting a bit error at the time of inputting and outputting data of the flash memory cell, The size of the redundancy memory cell array can be reduced, the data storage period can be extended, and the reliability of the data stored in the flash memory cell can be greatly improved. According to how the algorithm of the error correction code device is implemented Allows designers the margin of error detection and correction And provides a designer with a trade-off between the chip size and the error correction capability.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is a trivial issue, I did not include the contents of the text.
제1도는 본 발명의 플레쉬 셀 메모리 디바이스 장치의 블럭도, 제2도는 제1도 에러정정코드 발생부의 내부 블럭도, 제3도는 제2도 에러정정코드 제어부의 내부 블럭도.FIG. 1 is a block diagram of a flash cell memory device of the present invention; FIG. 2 is an internal block diagram of an error correcting code generating section of FIG. 1; FIG. 3 is an internal block diagram of an error correcting code control section;
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960009099A KR100202654B1 (en) | 1996-03-29 | 1996-03-29 | Memory cell device apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960009099A KR100202654B1 (en) | 1996-03-29 | 1996-03-29 | Memory cell device apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970067380A true KR970067380A (en) | 1997-10-13 |
KR100202654B1 KR100202654B1 (en) | 1999-06-15 |
Family
ID=19454414
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960009099A KR100202654B1 (en) | 1996-03-29 | 1996-03-29 | Memory cell device apparatus |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100202654B1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100856129B1 (en) | 2006-12-29 | 2008-09-03 | 삼성전자주식회사 | Error correction circuit for reducing miscorrection probability, method there-of and semiconductor memory device including the circuit |
KR101788737B1 (en) | 2011-05-12 | 2017-10-24 | 에스케이하이닉스 주식회사 | Semiconductor System |
-
1996
- 1996-03-29 KR KR1019960009099A patent/KR100202654B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR100202654B1 (en) | 1999-06-15 |
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