KR960035610U - 반도체테스트용 컨넥터 - Google Patents

반도체테스트용 컨넥터

Info

Publication number
KR960035610U
KR960035610U KR2019950006657U KR19950006657U KR960035610U KR 960035610 U KR960035610 U KR 960035610U KR 2019950006657 U KR2019950006657 U KR 2019950006657U KR 19950006657 U KR19950006657 U KR 19950006657U KR 960035610 U KR960035610 U KR 960035610U
Authority
KR
South Korea
Prior art keywords
semiconductor test
test connector
connector
semiconductor
test
Prior art date
Application number
KR2019950006657U
Other languages
English (en)
Other versions
KR0122165Y1 (ko
Inventor
이채윤
Original Assignee
이채윤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이채윤 filed Critical 이채윤
Priority to KR2019950006657U priority Critical patent/KR0122165Y1/ko
Publication of KR960035610U publication Critical patent/KR960035610U/ko
Application granted granted Critical
Publication of KR0122165Y1 publication Critical patent/KR0122165Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019950006657U 1995-04-04 1995-04-04 반도체테스트용 컨넥터 KR0122165Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950006657U KR0122165Y1 (ko) 1995-04-04 1995-04-04 반도체테스트용 컨넥터

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950006657U KR0122165Y1 (ko) 1995-04-04 1995-04-04 반도체테스트용 컨넥터

Publications (2)

Publication Number Publication Date
KR960035610U true KR960035610U (ko) 1996-11-21
KR0122165Y1 KR0122165Y1 (ko) 1998-08-17

Family

ID=19410677

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950006657U KR0122165Y1 (ko) 1995-04-04 1995-04-04 반도체테스트용 컨넥터

Country Status (1)

Country Link
KR (1) KR0122165Y1 (ko)

Also Published As

Publication number Publication date
KR0122165Y1 (ko) 1998-08-17

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