KR960027792U - Centering measurement device for semiconductor devices - Google Patents
Centering measurement device for semiconductor devicesInfo
- Publication number
- KR960027792U KR960027792U KR2019950000540U KR19950000540U KR960027792U KR 960027792 U KR960027792 U KR 960027792U KR 2019950000540 U KR2019950000540 U KR 2019950000540U KR 19950000540 U KR19950000540 U KR 19950000540U KR 960027792 U KR960027792 U KR 960027792U
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor devices
- measurement device
- centering measurement
- centering
- semiconductor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950000540U KR0121148Y1 (en) | 1995-01-14 | 1995-01-14 | Centering measurement apparatus for semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950000540U KR0121148Y1 (en) | 1995-01-14 | 1995-01-14 | Centering measurement apparatus for semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960027792U true KR960027792U (en) | 1996-08-17 |
KR0121148Y1 KR0121148Y1 (en) | 1998-08-01 |
Family
ID=19406720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019950000540U KR0121148Y1 (en) | 1995-01-14 | 1995-01-14 | Centering measurement apparatus for semiconductor device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0121148Y1 (en) |
-
1995
- 1995-01-14 KR KR2019950000540U patent/KR0121148Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0121148Y1 (en) | 1998-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20090327 Year of fee payment: 12 |
|
EXPY | Expiration of term |