KR970003245U - Socket for semiconductor device testing - Google Patents

Socket for semiconductor device testing

Info

Publication number
KR970003245U
KR970003245U KR2019950012992U KR19950012992U KR970003245U KR 970003245 U KR970003245 U KR 970003245U KR 2019950012992 U KR2019950012992 U KR 2019950012992U KR 19950012992 U KR19950012992 U KR 19950012992U KR 970003245 U KR970003245 U KR 970003245U
Authority
KR
South Korea
Prior art keywords
socket
semiconductor device
device testing
testing
semiconductor
Prior art date
Application number
KR2019950012992U
Other languages
Korean (ko)
Other versions
KR200181396Y1 (en
Inventor
김동열
Original Assignee
현대전자산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업주식회사 filed Critical 현대전자산업주식회사
Priority to KR2019950012992U priority Critical patent/KR200181396Y1/en
Publication of KR970003245U publication Critical patent/KR970003245U/en
Application granted granted Critical
Publication of KR200181396Y1 publication Critical patent/KR200181396Y1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019950012992U 1995-06-09 1995-06-09 The socket for semiconductor device test KR200181396Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950012992U KR200181396Y1 (en) 1995-06-09 1995-06-09 The socket for semiconductor device test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950012992U KR200181396Y1 (en) 1995-06-09 1995-06-09 The socket for semiconductor device test

Publications (2)

Publication Number Publication Date
KR970003245U true KR970003245U (en) 1997-01-24
KR200181396Y1 KR200181396Y1 (en) 2000-05-15

Family

ID=19415219

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950012992U KR200181396Y1 (en) 1995-06-09 1995-06-09 The socket for semiconductor device test

Country Status (1)

Country Link
KR (1) KR200181396Y1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040003937A (en) * 2002-07-05 2004-01-13 (주)티에스이 Carrier module for a semiconductor device test apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040003937A (en) * 2002-07-05 2004-01-13 (주)티에스이 Carrier module for a semiconductor device test apparatus

Also Published As

Publication number Publication date
KR200181396Y1 (en) 2000-05-15

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Legal Events

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E701 Decision to grant or registration of patent right
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Payment date: 20050120

Year of fee payment: 6

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