KR960012448A - 구면형 범프의 접촉 구조 - Google Patents
구면형 범프의 접촉 구조 Download PDFInfo
- Publication number
- KR960012448A KR960012448A KR1019950029064A KR19950029064A KR960012448A KR 960012448 A KR960012448 A KR 960012448A KR 1019950029064 A KR1019950029064 A KR 1019950029064A KR 19950029064 A KR19950029064 A KR 19950029064A KR 960012448 A KR960012448 A KR 960012448A
- Authority
- KR
- South Korea
- Prior art keywords
- spherical
- contact
- bump
- contact structure
- bumps
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/10—Sockets for co-operation with pins or blades
- H01R13/11—Resilient sockets
- H01R13/112—Resilient sockets forked sockets having two legs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
- H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
본 발명은 다수의 구면형 범프를 갖는 IC 팩키지와 소켓의 접촉핀의 접촉 구조에 있어서, 고신뢰의 접촉을 확보하면서 구면형 범프의 손상을 최소한으로 억제하고 동 범프의 품질과 실장 성능을 보증하도록 접촉 구조를 제공하는 것이 목적이다.
구면형 범프(2)와 접촉핀(3)의 접촉 구조로서, 접촉핀(3)이 탄성지편(4a,4b)으로 지지되는 접촉부(5)를 갖고, 이 접촉부(5)가 구면형 범프(2)의 하사점부를 제외하는 구면(球面)과 마주 보도록 배치되는 접촉 구조에 있어서, 상기 접촉부(5)가 구면형 범프(2)의 구면을 파고 들어가는 돌기(5e,5f)를 갖고 있음과 아울러, 이 돌기(5e,5f)가 파고 들어가는 양을 설정하는 수압면(受壓面)(5c,5d)을 갖는 구면형 범프의 접촉 구조이다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제4도는 동 접촉핀을 소켓 본체에 끼우고 구면형 범프와 접촉하고 있는 상태의 한 핀을 확대한 단면도.
Claims (4)
- 구면형 범프와 접촉핀의 접촉 구조로서, 접촉핀의 탄성지편으로 지지되는 접촉부를 갖고, 이 접촉부가 구면형 범프의 하사점부를 제외하는 구면(球面)과 마주 보도록 배치되는 접촉 구조에 있어서, 상기 접촉부가 구면형 범프의 구면을 파고 들어가는 돌기를 갖고 있음과 아울러, 이 돌기가 파고 들어가는 양을 설정하는 수압면(受壓面)을 갖고 있는 것을 특징으로 하는 구면형 범프의 접촉 구조.
- 제1항에 있어서, 상기 돌기는 산마루(ridge)이고, 이 산마루가 구면형 범프의 대략 하사점부를 통과하는 경선(經線)방향으로 연장하고, 이 산마루의 연장 도중에서 구면형 범프의 구면을 파고 들어가는 것을 특징으로 하는 구면형 범프의 접촉 구조.
- 구면형 범프와 접촉핀의 접촉 구조로서, 접촉핀이 탄성지편에 지지되는 여러개의 접촉부를 갖고, 이 각 접촉부가 구면형 범프의 하사접부를 제외하는 구면(球面)과 마주 보고 간격을 두고 배치되는 접촉 구조에 있어서, 상기 각 접촉부가 구면형 범프의 구면을 파고 들어가는 돌기를 갖고 있음과 아울러, 이 돌기는 파고 들어가는 양을 설정하는 수압면(受壓面)을 갖고 있는 것을 특징으로 하는 구면형 범프의 접촉 구조.
- 제3항에 있어서, 상기 각 돌기가 구면형 범프의 구면을 파고 들어가도록 대략 등간격(等間隔)으로 배치되어 있는 것을 특징으로 하는 구면형 범프의 접촉 구조※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6240601A JP2620525B2 (ja) | 1994-09-08 | 1994-09-08 | 球面形バンプとの接触構造 |
JP6-240601 | 1994-09-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960012448A true KR960012448A (ko) | 1996-04-20 |
KR100341033B1 KR100341033B1 (ko) | 2002-11-29 |
Family
ID=17061924
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950029064A KR100341033B1 (ko) | 1994-09-08 | 1995-09-06 | 구면형범프의접촉구조 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5641945A (ko) |
JP (1) | JP2620525B2 (ko) |
KR (1) | KR100341033B1 (ko) |
DE (1) | DE19533272A1 (ko) |
MY (1) | MY118485A (ko) |
TW (1) | TW275157B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100398025B1 (ko) * | 2001-07-23 | 2003-09-19 | 변홍식 | 수용성 폴리우레탄이 코팅된 폴리우레탄 장갑의 건식제조방법 |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0945805A (ja) * | 1995-07-31 | 1997-02-14 | Fujitsu Ltd | 配線基板、半導体装置及び半導体装置を配線基板から取り外す方法並びに半導体装置の製造方法 |
US6045416A (en) * | 1996-04-02 | 2000-04-04 | Aries Electronics, Inc. | Universal production ball grid array socket |
JP2980235B2 (ja) * | 1997-04-17 | 1999-11-22 | 山一電機株式会社 | Icパッケージ用icソケット |
US5880590A (en) * | 1997-05-07 | 1999-03-09 | International Business Machines Corporation | Apparatus and method for burn-in and testing of devices with solder bumps or preforms |
JP3270716B2 (ja) * | 1997-07-04 | 2002-04-02 | 日本テキサス・インスツルメンツ株式会社 | ソケット及び半導体装置の取付方法 |
US5877554A (en) * | 1997-11-03 | 1999-03-02 | Advanced Interconnections Corp. | Converter socket terminal |
JPH11162601A (ja) * | 1997-11-27 | 1999-06-18 | Texas Instr Japan Ltd | ソケット |
DE19820285C2 (de) * | 1998-02-19 | 2000-05-18 | Siemens Ag | Vorrichtung zum Prüfen von mit Ball-Grid-Arrays bestückten Platinen |
US6272741B1 (en) * | 1998-07-24 | 2001-08-14 | Autosplice, Inc. | Hybrid solder ball and pin grid array circuit board interconnect system and method |
TW383955U (en) * | 1998-08-31 | 2000-03-01 | Hon Hai Prec Ind Co Ltd | Module apparatus for slot connector |
TW465060B (en) * | 1998-12-23 | 2001-11-21 | Mirae Corp | Wafer formed with CSP device and test socket of BGA device |
TW385092U (en) * | 1998-12-28 | 2000-03-11 | Hon Hai Prec Ind Co Ltd | Electrical connectors |
JP4414017B2 (ja) | 1999-05-25 | 2010-02-10 | モレックス インコーポレイテド | Icソケット |
US6303991B1 (en) | 1999-05-27 | 2001-10-16 | Fci Americas Technology, Inc. | Electronic package and contact therefor |
JP4087012B2 (ja) * | 1999-05-31 | 2008-05-14 | 株式会社エンプラス | 電気部品用ソケット |
DE10161755B4 (de) * | 2001-12-15 | 2005-12-15 | Infineon Technologies Ag | Kontaktstift zum Testen mikroelektronischer Bauteile mit kugelförmigen Kontakten |
US6590772B1 (en) * | 2002-04-17 | 2003-07-08 | Ted Ju | CPU and circuit board mounting arrangement |
US6769924B1 (en) * | 2003-05-13 | 2004-08-03 | Hon Hai Precision Ind. Co., Ltd. | Electrical connector having a releasable cover |
US7292055B2 (en) * | 2005-04-21 | 2007-11-06 | Endicott Interconnect Technologies, Inc. | Interposer for use with test apparatus |
US7501839B2 (en) * | 2005-04-21 | 2009-03-10 | Endicott Interconnect Technologies, Inc. | Interposer and test assembly for testing electronic devices |
US7271606B1 (en) | 2005-08-04 | 2007-09-18 | National Semiconductor Corporation | Spring-based probe pin that allows kelvin testing |
JP4749359B2 (ja) * | 2007-02-28 | 2011-08-17 | スリーエム カンパニー | コンタクト及びそれを用いた集積回路用ソケット |
JP4313827B2 (ja) * | 2007-05-25 | 2009-08-12 | 東光株式会社 | 球状外部電極を有する半導体装置の検査方法 |
TWM344660U (en) * | 2008-03-31 | 2008-11-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
TWM439923U (en) * | 2012-04-09 | 2012-10-21 | Hon Hai Prec Ind Co Ltd | Electrical connector |
EP2725363B9 (de) | 2012-10-24 | 2015-03-25 | Multitest elektronische Systeme GmbH | Kontaktfeder für einen Prüfsockel für die Hochstrom-Prüfung eines elektronischen Bauteils |
EP2770332A1 (en) * | 2013-02-20 | 2014-08-27 | Team Nanotec GmbH | Contact probe |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3530422A (en) * | 1968-03-25 | 1970-09-22 | Elco Corp | Connector and method for attaching same to printed circuit board |
US5349495A (en) * | 1989-06-23 | 1994-09-20 | Vlsi Technology, Inc. | System for securing and electrically connecting a semiconductor chip to a substrate |
US5227812A (en) * | 1990-02-26 | 1993-07-13 | Canon Kabushiki Kaisha | Liquid jet recording head with bump connector wiring |
US5338208A (en) * | 1992-02-04 | 1994-08-16 | International Business Machines Corporation | High density electronic connector and method of assembly |
US5386344A (en) * | 1993-01-26 | 1995-01-31 | International Business Machines Corporation | Flex circuit card elastomeric cable connector assembly |
US5489750A (en) * | 1993-03-11 | 1996-02-06 | Matsushita Electric Industrial Co., Ltd. | Method of mounting an electronic part with bumps on a circuit board |
JP2586098Y2 (ja) * | 1993-05-24 | 1998-12-02 | 株式会社村田製作所 | 電子部品およびその実装構造 |
US5484964A (en) * | 1995-02-06 | 1996-01-16 | Dawson, Deceased; Peter F. | Surface mounting pin grid arrays |
-
1994
- 1994-09-08 JP JP6240601A patent/JP2620525B2/ja not_active Expired - Lifetime
-
1995
- 1995-09-06 KR KR1019950029064A patent/KR100341033B1/ko not_active IP Right Cessation
- 1995-09-06 TW TW084109322A patent/TW275157B/zh not_active IP Right Cessation
- 1995-09-07 US US08/524,825 patent/US5641945A/en not_active Expired - Lifetime
- 1995-09-07 MY MYPI95002661A patent/MY118485A/en unknown
- 1995-09-08 DE DE19533272A patent/DE19533272A1/de not_active Ceased
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100398025B1 (ko) * | 2001-07-23 | 2003-09-19 | 변홍식 | 수용성 폴리우레탄이 코팅된 폴리우레탄 장갑의 건식제조방법 |
Also Published As
Publication number | Publication date |
---|---|
TW275157B (ko) | 1996-05-01 |
MY118485A (en) | 2004-11-30 |
DE19533272A1 (de) | 1996-03-14 |
JP2620525B2 (ja) | 1997-06-18 |
US5641945A (en) | 1997-06-24 |
KR100341033B1 (ko) | 2002-11-29 |
JPH0878123A (ja) | 1996-03-22 |
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