KR960012306A - 집적회로의 제조에서 알루미늄을 포함한 층의 스퍼터링 증착을 평탄화 하기위한 방법 - Google Patents
집적회로의 제조에서 알루미늄을 포함한 층의 스퍼터링 증착을 평탄화 하기위한 방법 Download PDFInfo
- Publication number
- KR960012306A KR960012306A KR1019950030579A KR19950030579A KR960012306A KR 960012306 A KR960012306 A KR 960012306A KR 1019950030579 A KR1019950030579 A KR 1019950030579A KR 19950030579 A KR19950030579 A KR 19950030579A KR 960012306 A KR960012306 A KR 960012306A
- Authority
- KR
- South Korea
- Prior art keywords
- planarizing
- manufacture
- integrated circuits
- containing aluminum
- layers containing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/18—Metallic material, boron or silicon on other inorganic substrates
- C23C14/185—Metallic material, boron or silicon on other inorganic substrates by cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/412—Deposition of metallic or metal-silicide materials
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4433326A DE4433326A1 (de) | 1994-09-19 | 1994-09-19 | Verfahren zur planarisierenden Sputterabscheidung einer aluminiumhaltigen Schicht bei der Herstellung integrierter Schaltungen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR960012306A true KR960012306A (ko) | 1996-04-20 |
Family
ID=6528580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950030579A Ceased KR960012306A (ko) | 1994-09-19 | 1995-09-19 | 집적회로의 제조에서 알루미늄을 포함한 층의 스퍼터링 증착을 평탄화 하기위한 방법 |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP0706205A3 (enExample) |
| JP (1) | JPH0897148A (enExample) |
| KR (1) | KR960012306A (enExample) |
| DE (1) | DE4433326A1 (enExample) |
| TW (1) | TW276351B (enExample) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5658828A (en) * | 1989-11-30 | 1997-08-19 | Sgs-Thomson Microelectronics, Inc. | Method for forming an aluminum contact through an insulating layer |
| JPH04363024A (ja) * | 1990-11-30 | 1992-12-15 | Toshiba Corp | 半導体装置の製造方法 |
| KR920010620A (ko) * | 1990-11-30 | 1992-06-26 | 원본미기재 | 다층 상호접속선을 위한 알루미늄 적층 접점/통로 형성방법 |
| JPH07109030B2 (ja) * | 1991-02-12 | 1995-11-22 | アプライド マテリアルズ インコーポレイテッド | 半導体ウェーハ上にアルミニウム層をスパッタする方法 |
| DE69319993T2 (de) * | 1992-09-22 | 1998-12-10 | Sgs-Thomson Microelectronics, Inc., Carrollton, Tex. | Methode zur Herstellung eines Metallkontaktes |
-
1994
- 1994-09-19 DE DE4433326A patent/DE4433326A1/de not_active Withdrawn
-
1995
- 1995-08-11 TW TW084108373A patent/TW276351B/zh not_active IP Right Cessation
- 1995-09-18 EP EP95114656A patent/EP0706205A3/de not_active Withdrawn
- 1995-09-19 KR KR1019950030579A patent/KR960012306A/ko not_active Ceased
- 1995-09-19 JP JP7264748A patent/JPH0897148A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP0706205A3 (de) | 1997-10-22 |
| JPH0897148A (ja) | 1996-04-12 |
| EP0706205A2 (de) | 1996-04-10 |
| DE4433326A1 (de) | 1996-03-21 |
| TW276351B (enExample) | 1996-05-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0451571A3 (en) | Sputtering process for forming aluminum layer over stepped semiconductor wafer | |
| DE69729177D1 (de) | Dekorative schicht | |
| SG60012A1 (en) | Semiconductor substrate and fabrication method for the same | |
| FI972721A0 (fi) | Sulkukerros käytettäväksi jääkaappien koteloissa | |
| DE69722377D1 (de) | Äussere schicht in einem absorbierenden artikel | |
| DE69617147D1 (de) | Verfahren zur Herstellung dünner Halbleiterschichten | |
| AU6512400A (en) | Methods of forming an interlevel dielectric layer between different levels of metal layers in the fabrication of integrated circuit | |
| EP1109208A3 (en) | Method for the formation of semiconductor layer | |
| DE59410009D1 (de) | Mehrlagige Beschichtung | |
| NO951852L (no) | Fremgangsmåte for bestemmelse av tykkelsen av foringsrör i borehull | |
| DE69709042D1 (de) | Halbleiterbauelemente mit Beschichtung aus Tantalum-Aluminiumoxid | |
| GB2266787B (en) | Thin film reinforcing structure and method for manufacturing the same | |
| EP0661364A3 (en) | Surface protection film. | |
| EP0448471A3 (en) | Method of planarizing metal layer | |
| GB9724009D0 (en) | Device for measuring the thickness of thin layers | |
| GB2314942B (en) | Photomask for use in semiconductor manufacture | |
| KR960012306A (ko) | 집적회로의 제조에서 알루미늄을 포함한 층의 스퍼터링 증착을 평탄화 하기위한 방법 | |
| GB9417460D0 (en) | Method for evaluating semiconductor layer | |
| EP0709879A4 (en) | PROCESS FOR MANUFACTURING SEMICONDUCTORS | |
| DE59309525D1 (de) | Verfahren zur globalen Planarisierung von Oberflächen integrierter Halbleiterchaltungen | |
| SG79282A1 (en) | The complex for the high dielectric film deposition and the method of deposition | |
| EP0481343A3 (en) | Method for the manufacture of films of small thickness | |
| DE69412855D1 (de) | Folien für hochleistungskondensatoren | |
| GB9801066D0 (en) | Methods for manufacturing semiconductor thin films | |
| FR2674548B1 (fr) | Enrobe drainant pour couches de roulement de chaussee. |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |