KR960008506B1 - Fabricating method of composite semiconductor - Google Patents
Fabricating method of composite semiconductor Download PDFInfo
- Publication number
- KR960008506B1 KR960008506B1 KR93004820A KR930004820A KR960008506B1 KR 960008506 B1 KR960008506 B1 KR 960008506B1 KR 93004820 A KR93004820 A KR 93004820A KR 930004820 A KR930004820 A KR 930004820A KR 960008506 B1 KR960008506 B1 KR 960008506B1
- Authority
- KR
- South Korea
- Prior art keywords
- fabricating method
- composite semiconductor
- ratio
- etching solution
- protection film
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
Abstract
The compound semiconductor is etched by the etching solution to which is added 9-11 mole (NH4)2Sx, the acidic mixture of NH4OH, H2O2 and H1O in the ratio of 10:0.5:400, or alkaline etching solution, of H3PO4, H2O2 and H1O in the ratio of 1:1:400, and regulating pH. The compound semiconducor is manufactured by the process of ethching, forming sulfur protection film and removing the sulfur protection film by heat treating or keeping semiconductor for 4-6hrs under 10-8-10-7torr vaccum.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93004820A KR960008506B1 (en) | 1993-03-26 | 1993-03-26 | Fabricating method of composite semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93004820A KR960008506B1 (en) | 1993-03-26 | 1993-03-26 | Fabricating method of composite semiconductor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940022193A KR940022193A (en) | 1994-10-20 |
KR960008506B1 true KR960008506B1 (en) | 1996-06-26 |
Family
ID=19352848
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR93004820A KR960008506B1 (en) | 1993-03-26 | 1993-03-26 | Fabricating method of composite semiconductor |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960008506B1 (en) |
-
1993
- 1993-03-26 KR KR93004820A patent/KR960008506B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR940022193A (en) | 1994-10-20 |
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G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20070418 Year of fee payment: 12 |
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LAPS | Lapse due to unpaid annual fee |