KR960008418Y1 - Ic socket - Google Patents

Ic socket Download PDF

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Publication number
KR960008418Y1
KR960008418Y1 KR2019910002124U KR910002124U KR960008418Y1 KR 960008418 Y1 KR960008418 Y1 KR 960008418Y1 KR 2019910002124 U KR2019910002124 U KR 2019910002124U KR 910002124 U KR910002124 U KR 910002124U KR 960008418 Y1 KR960008418 Y1 KR 960008418Y1
Authority
KR
South Korea
Prior art keywords
semiconductor
socket
present
perth
main body
Prior art date
Application number
KR2019910002124U
Other languages
Korean (ko)
Other versions
KR920017236U (en
Inventor
안종기
Original Assignee
금성일렉트론 주식회사
문정환
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사, 문정환 filed Critical 금성일렉트론 주식회사
Priority to KR2019910002124U priority Critical patent/KR960008418Y1/en
Publication of KR920017236U publication Critical patent/KR920017236U/en
Application granted granted Critical
Publication of KR960008418Y1 publication Critical patent/KR960008418Y1/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

내용 없음.No content.

Description

반도체용 소켓의 구조Structure of Socket for Semiconductor

제1도는 본 고안의 일부를 단면으로 나타낸 정면도.1 is a front view showing a part of the present invention in cross section.

제2도는 본고안을 이용하여 반도체 소자를 테스트하는 상태도.2 is a state diagram for testing a semiconductor device using the present design.

제3도는 종래의 소켓을 일부단면으로 나타낸 정면도.3 is a front view showing a conventional socket in a partial cross section.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

1 : 본체 2 : 퍼스단1: body 2: Perth end

3 : 쎈스단3: Higgs end

본 고안은 반도체용 소켓의 구조에 관한것으로서, 특히 캘빈(Kalvin)회로 구성에 적합하도록 한것이다.The present invention relates to a structure of a socket for a semiconductor, and is particularly suitable for Kalvin circuit configuration.

종래의 반도체를 검사하기 위한 소켓은 제3도에 도시한 바와같이 본체(11)에 반도체(12)의 리드(12a)가 접속되는 절곡된 접속편(13)이 양측에 각각 설치되어 있다.In the conventional socket for inspecting semiconductors, as shown in FIG. 3, the bent connecting pieces 13 to which the leads 12a of the semiconductor 12 are connected to the main body 11 are respectively provided on both sides.

따라서 반도체의 성능검사를 위해 반도체(12)의 리드(12a)를 접속편(13)에 삽입하면 리드(12a)가 각 접속편(13)의 절곡부 사이에 접속된다.Therefore, when the lead 12a of the semiconductor 12 is inserted into the connecting piece 13 for the performance test of the semiconductor, the lead 12a is connected between the bent portions of the connecting pieces 13.

그러나 이러한 종래의 소켓은 반도체(12)의 리드(12a)가 접속되는 접속편(13)이 일체로 절곡형성되어 있어 테스트시에 전압원의 퍼스단과 쎈스단이 분리되지 않기때문에, 고전류, 고전압의 인가시 에러가 발생되는 결점이 있었다.However, in the conventional socket, since the connecting piece 13 to which the lead 12a of the semiconductor 12 is connected is integrally formed and bent, the perth end and the fence end of the voltage source are not separated at the time of testing, so that high current and high voltage are applied. There was a flaw that caused an error.

본 고안은 종래의 이와같은 결점을 감안하여 안출한 것으로서, 접속편을 퍼스단과 쎈스단으로 분할 형성하여 인가 전압이 변동되지 않은 상태에서 반도체를 테스트할 수 있도록 하는데 그 목적이 있다.The present invention has been made in view of the above-described drawbacks in the prior art, and its purpose is to enable the semiconductor to be tested in a state in which the applied voltage is not changed by dividing the connecting pieces into a perth end and a pulse end.

상기 목적을 달성하기 위해 본고안은 어플리케이션 보오드에 설치되는 본체에 퍼스단과 쎈스단으로 각각 분리된 접속편을 설치하여서 된 반도체용 소켓의 구조가 제공된다.In order to achieve the above object, the present invention provides a structure of a socket for a semiconductor, which is provided with a connecting piece separated into a perth end and a fence end respectively in a main body installed in an application board.

이하, 본고안을 일실시예로 도시한 첨부된 도면에 의해 더욱 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings showing an embodiment.

첨부도면 제1도는 본고안의 일부를 단면으로 나타낸 정면도이고, 제2도는 본고안을 이용하여 반도체 소자를 테스트하는 상태도로서, 어플리케이션보오드(Application Board)에 설치된 소켓본체(1)에 한쌍의 퍼스(Force)단(2)과 쎈스(Sense)단(3)이 각각 분리 형성되어 있다.1 is a front view showing a part of the present invention in cross section, and FIG. 2 is a state diagram for testing a semiconductor device using the present invention. FIG. A stage 2 and a sense stage 3 are separately formed.

따라서 제2도와 같이 전원을 인가시키면 본체(1)의 접속편이 퍼스단(2)과 쎈스단(3)으로 분리형성되어 있어 핸들러 콘택트(도시는 생략함)에서 퍼스단과 쎈스단이 만나게 되므로 핸들러 콘택트에 정확한 전압을 인가시킬 수 있게된다.Therefore, when the power is applied as shown in FIG. 2, the connecting piece of the main body 1 is formed into the first end 2 and the top end 3 so that the first end meets the first end and the end of the fence at the handler contact (not shown). It is possible to apply the correct voltage.

이상에서와 같이 본고안은 어플리케이션 보오드에서 핸들러 콘택트까지의 라인(통상 5~3cm)저항으로 인해 생기는 전압감쇄를 방지할 수 있게되어 있으므로 반도체의 테스트시 에러가 발생되는 것을 미연에 방지할 수 있게되는 효과가 있다.As described above, the present proposal can prevent voltage attenuation caused by the resistance of the line (typically 5 to 3 cm) from the application board to the handler contact, thus preventing the occurrence of an error during the test of the semiconductor. It works.

Claims (1)

본체(1)에 설치되는 한쌍의 접속편이 퍼스단(2)과 센스단(3)으로 분리형성 되도록 함을 특징으로 하는 반도체용 소켓의 구조.A structure of a socket for a semiconductor, characterized in that a pair of connecting pieces provided in the main body (1) are separated into a perth end (2) and a sense end (3).
KR2019910002124U 1991-02-12 1991-02-12 Ic socket KR960008418Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910002124U KR960008418Y1 (en) 1991-02-12 1991-02-12 Ic socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910002124U KR960008418Y1 (en) 1991-02-12 1991-02-12 Ic socket

Publications (2)

Publication Number Publication Date
KR920017236U KR920017236U (en) 1992-09-17
KR960008418Y1 true KR960008418Y1 (en) 1996-09-30

Family

ID=19310872

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910002124U KR960008418Y1 (en) 1991-02-12 1991-02-12 Ic socket

Country Status (1)

Country Link
KR (1) KR960008418Y1 (en)

Also Published As

Publication number Publication date
KR920017236U (en) 1992-09-17

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