KR950012601U - Semiconductor device logic inspection device - Google Patents

Semiconductor device logic inspection device

Info

Publication number
KR950012601U
KR950012601U KR2019930021186U KR930021186U KR950012601U KR 950012601 U KR950012601 U KR 950012601U KR 2019930021186 U KR2019930021186 U KR 2019930021186U KR 930021186 U KR930021186 U KR 930021186U KR 950012601 U KR950012601 U KR 950012601U
Authority
KR
South Korea
Prior art keywords
semiconductor device
logic inspection
inspection device
semiconductor
device logic
Prior art date
Application number
KR2019930021186U
Other languages
Korean (ko)
Other versions
KR200155055Y1 (en
Inventor
윤희용
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019930021186U priority Critical patent/KR200155055Y1/en
Publication of KR950012601U publication Critical patent/KR950012601U/en
Application granted granted Critical
Publication of KR200155055Y1 publication Critical patent/KR200155055Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
KR2019930021186U 1993-10-15 1993-10-15 Logic test circuit of semiconductor device KR200155055Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930021186U KR200155055Y1 (en) 1993-10-15 1993-10-15 Logic test circuit of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930021186U KR200155055Y1 (en) 1993-10-15 1993-10-15 Logic test circuit of semiconductor device

Publications (2)

Publication Number Publication Date
KR950012601U true KR950012601U (en) 1995-05-17
KR200155055Y1 KR200155055Y1 (en) 1999-08-16

Family

ID=19365733

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930021186U KR200155055Y1 (en) 1993-10-15 1993-10-15 Logic test circuit of semiconductor device

Country Status (1)

Country Link
KR (1) KR200155055Y1 (en)

Also Published As

Publication number Publication date
KR200155055Y1 (en) 1999-08-16

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