KR950004430U - Integrated Circuit Package Inspection Device - Google Patents

Integrated Circuit Package Inspection Device

Info

Publication number
KR950004430U
KR950004430U KR2019930013931U KR930013931U KR950004430U KR 950004430 U KR950004430 U KR 950004430U KR 2019930013931 U KR2019930013931 U KR 2019930013931U KR 930013931 U KR930013931 U KR 930013931U KR 950004430 U KR950004430 U KR 950004430U
Authority
KR
South Korea
Prior art keywords
integrated circuit
inspection device
circuit package
package inspection
integrated
Prior art date
Application number
KR2019930013931U
Other languages
Korean (ko)
Other versions
KR950008678Y1 (en
Inventor
안해면
이만성
이종민
Original Assignee
아남산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아남산업 주식회사 filed Critical 아남산업 주식회사
Priority to KR2019930013931U priority Critical patent/KR950008678Y1/en
Publication of KR950004430U publication Critical patent/KR950004430U/en
Application granted granted Critical
Publication of KR950008678Y1 publication Critical patent/KR950008678Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019930013931U 1993-07-26 1993-07-26 I.c package checking device KR950008678Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930013931U KR950008678Y1 (en) 1993-07-26 1993-07-26 I.c package checking device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930013931U KR950008678Y1 (en) 1993-07-26 1993-07-26 I.c package checking device

Publications (2)

Publication Number Publication Date
KR950004430U true KR950004430U (en) 1995-02-17
KR950008678Y1 KR950008678Y1 (en) 1995-10-12

Family

ID=19359820

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930013931U KR950008678Y1 (en) 1993-07-26 1993-07-26 I.c package checking device

Country Status (1)

Country Link
KR (1) KR950008678Y1 (en)

Also Published As

Publication number Publication date
KR950008678Y1 (en) 1995-10-12

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
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FPAY Annual fee payment

Payment date: 20001013

Year of fee payment: 6

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