KR950002246A - 전체 코드 테스트 방법 및 장치 - Google Patents

전체 코드 테스트 방법 및 장치 Download PDF

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Publication number
KR950002246A
KR950002246A KR1019940008806A KR19940008806A KR950002246A KR 950002246 A KR950002246 A KR 950002246A KR 1019940008806 A KR1019940008806 A KR 1019940008806A KR 19940008806 A KR19940008806 A KR 19940008806A KR 950002246 A KR950002246 A KR 950002246A
Authority
KR
South Korea
Prior art keywords
counter
voltage
bit
code
coefficient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1019940008806A
Other languages
English (en)
Korean (ko)
Inventor
구진스키 미로슬로우
루이스 리완도우스키 제임스
쥴리안 벨라스코 빅터
우 시안링
Original Assignee
알. 비. 레비
아메리칸 텔리폰 앤드 텔레그라프 캄파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 알. 비. 레비, 아메리칸 텔리폰 앤드 텔레그라프 캄파니 filed Critical 알. 비. 레비
Publication of KR950002246A publication Critical patent/KR950002246A/ko
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for DC performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1019940008806A 1993-06-30 1994-04-26 전체 코드 테스트 방법 및 장치 Ceased KR950002246A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/084,855 US5332996A (en) 1993-06-30 1993-06-30 Method and apparatus for all code testing
US084,855 1993-06-30

Publications (1)

Publication Number Publication Date
KR950002246A true KR950002246A (ko) 1995-01-04

Family

ID=22187649

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940008806A Ceased KR950002246A (ko) 1993-06-30 1994-04-26 전체 코드 테스트 방법 및 장치

Country Status (6)

Country Link
US (1) US5332996A (https=)
EP (1) EP0633666A3 (https=)
JP (1) JPH07154258A (https=)
KR (1) KR950002246A (https=)
CA (1) CA2119507C (https=)
TW (1) TW248623B (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644309A (en) * 1995-04-10 1997-07-01 Harris Corporation Digital comonent testing apparatus and method
KR100489144B1 (ko) * 1996-06-17 2005-09-30 코닌클리케 필립스 일렉트로닉스 엔.브이. 아날로그-디지탈컨버터테스트방법및집적회로
US6320528B1 (en) 1999-10-15 2001-11-20 Koninklijke Philips Electronics Nv Built-in self test for integrated digital-to-analog converters
US6828779B2 (en) 2000-07-24 2004-12-07 Microstrain, Inc. Circuit for compensating for time variation of temperature in an inductive sensor
JP2003338756A (ja) * 2002-05-21 2003-11-28 Mitsubishi Electric Corp 試験方法および試験回路
KR101388477B1 (ko) * 2011-12-30 2014-04-23 한국항공우주연구원 신호 처리 장치 및 방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3154738A (en) * 1961-11-09 1964-10-27 Bell Telephone Labor Inc Automatic encoder test set for pcm encoders
US3603772A (en) * 1969-09-09 1971-09-07 Nasa Analog-to-digital converter analyzing system
US3816813A (en) * 1972-01-24 1974-06-11 Spacetac Inc Automatic converter tester
IT7923478A0 (it) * 1979-06-12 1979-06-12 Sits Soc It Telecom Siemens Disposizione circuitale per il collaudo di un convertitore analogico-digitale di un sistema di telecomunicazioni.
JPS56126319A (en) * 1980-03-10 1981-10-03 Hitachi Ltd Self-correcting analog-digital converter
US4616329A (en) * 1983-08-26 1986-10-07 Bio-Rad Laboratories, Inc. Self-calibrating adaptive ranging apparatus and method
JPS61137429A (ja) * 1984-12-07 1986-06-25 Matsushita Electric Ind Co Ltd Ａｄ変換器試験回路
US4897650A (en) * 1988-04-05 1990-01-30 General Electric Company Self-characterizing analog-to-digital converter
EP0447117B1 (en) * 1990-03-15 1997-02-19 AT&T Corp. Built-in self test for analog to digital converters

Also Published As

Publication number Publication date
TW248623B (https=) 1995-06-01
EP0633666A3 (en) 1995-08-30
CA2119507A1 (en) 1994-12-31
US5332996A (en) 1994-07-26
CA2119507C (en) 1998-10-13
EP0633666A2 (en) 1995-01-11
JPH07154258A (ja) 1995-06-16

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Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19940426

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Patent event code: PE06011S01I