KR940023212U - 아이씨티(ict)의 패턴신호 발생회로 - Google Patents

아이씨티(ict)의 패턴신호 발생회로

Info

Publication number
KR940023212U
KR940023212U KR2019930005160U KR930005160U KR940023212U KR 940023212 U KR940023212 U KR 940023212U KR 2019930005160 U KR2019930005160 U KR 2019930005160U KR 930005160 U KR930005160 U KR 930005160U KR 940023212 U KR940023212 U KR 940023212U
Authority
KR
South Korea
Prior art keywords
ict
generation circuit
signal generation
pattern signal
pattern
Prior art date
Application number
KR2019930005160U
Other languages
English (en)
Other versions
KR950006933Y1 (ko
Inventor
전영준
Original Assignee
엘지산전 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지산전 주식회사 filed Critical 엘지산전 주식회사
Priority to KR2019930005160U priority Critical patent/KR950006933Y1/ko
Publication of KR940023212U publication Critical patent/KR940023212U/ko
Application granted granted Critical
Publication of KR950006933Y1 publication Critical patent/KR950006933Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019930005160U 1993-03-31 1993-03-31 아이씨티(ict)의 패턴신호 발생회로 KR950006933Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930005160U KR950006933Y1 (ko) 1993-03-31 1993-03-31 아이씨티(ict)의 패턴신호 발생회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930005160U KR950006933Y1 (ko) 1993-03-31 1993-03-31 아이씨티(ict)의 패턴신호 발생회로

Publications (2)

Publication Number Publication Date
KR940023212U true KR940023212U (ko) 1994-10-22
KR950006933Y1 KR950006933Y1 (ko) 1995-08-23

Family

ID=19353104

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930005160U KR950006933Y1 (ko) 1993-03-31 1993-03-31 아이씨티(ict)의 패턴신호 발생회로

Country Status (1)

Country Link
KR (1) KR950006933Y1 (ko)

Also Published As

Publication number Publication date
KR950006933Y1 (ko) 1995-08-23

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