KR920701784A - 평면.입체 시험물의 무접촉시험을 위한 방법 및 장치 - Google Patents

평면.입체 시험물의 무접촉시험을 위한 방법 및 장치

Info

Publication number
KR920701784A
KR920701784A KR1019910701040A KR910701040A KR920701784A KR 920701784 A KR920701784 A KR 920701784A KR 1019910701040 A KR1019910701040 A KR 1019910701040A KR 910701040 A KR910701040 A KR 910701040A KR 920701784 A KR920701784 A KR 920701784A
Authority
KR
South Korea
Prior art keywords
light beam
light
test object
linear
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019910701040A
Other languages
English (en)
Korean (ko)
Inventor
쇼에프스 빌프리트
Original Assignee
원본미기재
옵토콘트롤 악티엔게젤샤프트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 원본미기재, 옵토콘트롤 악티엔게젤샤프트 filed Critical 원본미기재
Publication of KR920701784A publication Critical patent/KR920701784A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1019910701040A 1990-01-06 1991-01-07 평면.입체 시험물의 무접촉시험을 위한 방법 및 장치 Withdrawn KR920701784A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH31/90-7 1990-01-06
CH31/90A CH681112A5 (enrdf_load_stackoverflow) 1990-01-06 1990-01-06
PCT/CH1991/000004 WO1991010891A1 (de) 1990-01-06 1991-01-07 Verfahren und vorrichtung zur berührungslosen prüfung von flächigen und räumlichen prüfgütern

Publications (1)

Publication Number Publication Date
KR920701784A true KR920701784A (ko) 1992-08-12

Family

ID=4177789

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910701040A Withdrawn KR920701784A (ko) 1990-01-06 1991-01-07 평면.입체 시험물의 무접촉시험을 위한 방법 및 장치

Country Status (9)

Country Link
EP (1) EP0462240A1 (enrdf_load_stackoverflow)
JP (1) JPH04506411A (enrdf_load_stackoverflow)
KR (1) KR920701784A (enrdf_load_stackoverflow)
AU (1) AU6911891A (enrdf_load_stackoverflow)
BR (1) BR9103915A (enrdf_load_stackoverflow)
CA (1) CA2050316A1 (enrdf_load_stackoverflow)
CH (1) CH681112A5 (enrdf_load_stackoverflow)
RU (1) RU2058546C1 (enrdf_load_stackoverflow)
WO (1) WO1991010891A1 (enrdf_load_stackoverflow)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH683293A5 (de) * 1991-12-20 1994-02-15 Peyer Ag Siegfried Fremdfasererkennung in Garnen.
AT1797U1 (de) * 1996-07-23 1997-11-25 Mte Messgeraete Entwicklungs U Optoelektronisches messsystem zur vermessung und identifikation von flachglasprodukten
US6100537A (en) * 1997-07-22 2000-08-08 "MTE" Messgerate, Entwicklungs- und Vertriebsgesellschaft mbH Measuring system for recognition of surface features
DE19801140A1 (de) * 1998-01-14 1999-07-15 Voith Sulzer Papiertech Patent Vorrichtung zum direkten oder indirekten Auftrag eines flüssigen bis pastösen Auftragsmediums auf eine laufende Materialbahn sowie Betriebsverfahren für eine solche Vorrichtung
JP2007039335A (ja) * 1998-11-24 2007-02-15 Nippon Electric Glass Co Ltd セラミックス物品の製造方法
EP1050519B1 (en) 1998-11-24 2006-02-22 Nippon Electric Glass Co., Ltd Glass ceramic article
FR2817964B1 (fr) * 2000-12-11 2003-03-14 Usinor Dispositif d'inspection automatique de surface d'une bande en defilement
EP1498723A1 (de) * 2003-07-17 2005-01-19 Hauni Maschinbau AG Verfahren zum Erkennen von Fremdkörpern innerhalb eines kontinuierlich geführten Produktstroms und Vorrichtung zur Durchführung desselben
JP4698140B2 (ja) * 2003-11-12 2011-06-08 ザ・ボーイング・カンパニー 複合構造内の欠陥を識別するためのシステム
US7640073B2 (en) 2005-04-14 2009-12-29 Jeld-Wen, Inc. Systems and methods of identifying and manipulating objects
RU2319117C1 (ru) * 2006-04-21 2008-03-10 Федеральное государственное унитарное предприятие "Центральный институт авиационного моторостроения имени П.И. Баранова" Устройство для определения углового распределения излучения, отраженного от исследуемой поверхности объекта
RU2540939C2 (ru) * 2013-05-24 2015-02-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Сибирская государственная геодезическая академия" (ФГБОУ ВПО "СГГА") Способ определения координат контрольной точки объекта с применением наземного лазерного сканера
DE102013221334A1 (de) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
EP3279716B1 (en) * 2015-03-31 2020-10-14 Hamamatsu Photonics K.K. Projection display device
RU178901U1 (ru) * 2017-10-30 2018-04-23 Олег Александрович Продоус Устройство для бесконтактного измерения шероховатости поверхности

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL240616A (enrdf_load_stackoverflow) * 1958-06-30
US3019346A (en) * 1960-03-28 1962-01-30 Jones & Laughlin Steel Corp Electronic surface inspection system
US3693021A (en) * 1970-06-29 1972-09-19 Eastman Kodak Co Web inspection system using interlaced photocells
US4594001A (en) * 1981-07-07 1986-06-10 Robotic Vision Systems, Inc. Detection of three-dimensional information with a projected plane of light
US4650333A (en) * 1984-04-12 1987-03-17 International Business Machines Corporation System for measuring and detecting printed circuit wiring defects
GB2159271B (en) * 1984-04-27 1988-05-18 Nissan Motor Surface flaw detecting method and apparatus

Also Published As

Publication number Publication date
AU6911891A (en) 1991-08-05
BR9103915A (pt) 1992-03-03
RU2058546C1 (ru) 1996-04-20
CH681112A5 (enrdf_load_stackoverflow) 1993-01-15
CA2050316A1 (en) 1991-07-07
EP0462240A1 (de) 1991-12-27
WO1991010891A1 (de) 1991-07-25
JPH04506411A (ja) 1992-11-05

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19910903

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid