KR920022016A - 현미경 - Google Patents

현미경 Download PDF

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Publication number
KR920022016A
KR920022016A KR1019920007760A KR920007760A KR920022016A KR 920022016 A KR920022016 A KR 920022016A KR 1019920007760 A KR1019920007760 A KR 1019920007760A KR 920007760 A KR920007760 A KR 920007760A KR 920022016 A KR920022016 A KR 920022016A
Authority
KR
South Korea
Prior art keywords
light emitting
emitting device
infrared light
microscope
visible light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR1019920007760A
Other languages
English (en)
Other versions
KR960014969B1 (ko
Inventor
나오다로 나까다
와다루 구보
Original Assignee
사도 겡이찌로
로무 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사도 겡이찌로, 로무 가부시기가이샤 filed Critical 사도 겡이찌로
Publication of KR920022016A publication Critical patent/KR920022016A/ko
Application granted granted Critical
Publication of KR960014969B1 publication Critical patent/KR960014969B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Optical Filters (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

내용 없음.

Description

현미경
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 실시예의 현미경을 도시한 설명도,
제2도는 본 발명에 따른 실시예의 현미경의 광원을 도시한 설명도,
제3도는 가시광 컷필터의 내부투과지수를 도시한 설명도.

Claims (2)

  1. 현미경본체(1)의 화상면에 텔레비카메라(2)의 수광면(21)을 배치하여 촬영대상물(5)에 대하여 명시야 내지 암시야 조명을 하여 텔레비카메라(2)의 비디오신호를 모니터텔레비로 눈으로 볼 수 있고, 혹은 화상처리하는 현미경에 있어서, 촬영대상물(5)에 대한 조명은 적외발광소자(31)를 광원(3)으로 사용하는 것을 특징으로 하는 현미경.
  2. 제1항에 있어서, 가시발광소자에서의 가시광의 조사위치와 적외발광소자(31)에서의 적외광의 조사위치가 실질적으로 같으며 가시발광소자(32)와 적외발광소자(31)는 직렬로 결선되어서 가시광과 적외광의 조사강도는 비례하고 있는 것을 특징으로 하는 현미경.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019920007760A 1991-05-14 1992-05-08 현미경 Expired - Fee Related KR960014969B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP91-107927 1991-05-14
JP3107927A JP2801974B2 (ja) 1991-05-14 1991-05-14 顕微鏡

Publications (2)

Publication Number Publication Date
KR920022016A true KR920022016A (ko) 1992-12-19
KR960014969B1 KR960014969B1 (ko) 1996-10-23

Family

ID=14471583

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920007760A Expired - Fee Related KR960014969B1 (ko) 1991-05-14 1992-05-08 현미경

Country Status (2)

Country Link
JP (1) JP2801974B2 (ko)
KR (1) KR960014969B1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6108127A (en) * 1997-05-15 2000-08-22 3M Innovative Properties Company High resolution confocal microscope
US6055095A (en) * 1999-07-30 2000-04-25 Intel Corporation Microscope with infrared imaging
US7315414B2 (en) 2004-03-31 2008-01-01 Swift Instruments, Inc. Microscope with adjustable stage
JP4867354B2 (ja) * 2006-01-16 2012-02-01 横河電機株式会社 共焦点顕微鏡
JP2008076489A (ja) * 2006-09-19 2008-04-03 Olympus Corp 照明光学系及びこの照明光学系を有する光学装置
KR100936645B1 (ko) * 2008-05-01 2010-01-14 김영범 라만 현미경
CN104115004B (zh) * 2012-02-10 2016-07-13 株式会社岛津制作所 太阳能电池单体的检查装置以及太阳能电池单体的处理装置
KR101951034B1 (ko) * 2014-05-16 2019-02-22 한국전자통신연구원 순차통계 일정 오경보율 검파의 처리 속도 향상방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62208017A (ja) * 1986-03-10 1987-09-12 Hitachi Ltd 赤外線共焦点顕微鏡
JPS6329537A (ja) * 1986-07-23 1988-02-08 Hitachi Ltd 検査装置
JPH07122694B2 (ja) * 1986-10-16 1995-12-25 オリンパス光学工業株式会社 顕微鏡用照明装置
JPS63237428A (ja) * 1987-03-26 1988-10-03 Oki Electric Ind Co Ltd 半導体素子のパタ−ン認識装置

Also Published As

Publication number Publication date
JPH04336445A (ja) 1992-11-24
KR960014969B1 (ko) 1996-10-23
JP2801974B2 (ja) 1998-09-21

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