KR920022016A - 현미경 - Google Patents

현미경 Download PDF

Info

Publication number
KR920022016A
KR920022016A KR1019920007760A KR920007760A KR920022016A KR 920022016 A KR920022016 A KR 920022016A KR 1019920007760 A KR1019920007760 A KR 1019920007760A KR 920007760 A KR920007760 A KR 920007760A KR 920022016 A KR920022016 A KR 920022016A
Authority
KR
South Korea
Prior art keywords
light emitting
emitting device
infrared light
microscope
visible light
Prior art date
Application number
KR1019920007760A
Other languages
English (en)
Other versions
KR960014969B1 (ko
Inventor
나오다로 나까다
와다루 구보
Original Assignee
사도 겡이찌로
로무 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사도 겡이찌로, 로무 가부시기가이샤 filed Critical 사도 겡이찌로
Publication of KR920022016A publication Critical patent/KR920022016A/ko
Application granted granted Critical
Publication of KR960014969B1 publication Critical patent/KR960014969B1/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Microscoopes, Condenser (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Filters (AREA)

Abstract

내용 없음.

Description

현미경
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 실시예의 현미경을 도시한 설명도,
제2도는 본 발명에 따른 실시예의 현미경의 광원을 도시한 설명도,
제3도는 가시광 컷필터의 내부투과지수를 도시한 설명도.

Claims (2)

  1. 현미경본체(1)의 화상면에 텔레비카메라(2)의 수광면(21)을 배치하여 촬영대상물(5)에 대하여 명시야 내지 암시야 조명을 하여 텔레비카메라(2)의 비디오신호를 모니터텔레비로 눈으로 볼 수 있고, 혹은 화상처리하는 현미경에 있어서, 촬영대상물(5)에 대한 조명은 적외발광소자(31)를 광원(3)으로 사용하는 것을 특징으로 하는 현미경.
  2. 제1항에 있어서, 가시발광소자에서의 가시광의 조사위치와 적외발광소자(31)에서의 적외광의 조사위치가 실질적으로 같으며 가시발광소자(32)와 적외발광소자(31)는 직렬로 결선되어서 가시광과 적외광의 조사강도는 비례하고 있는 것을 특징으로 하는 현미경.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019920007760A 1991-05-14 1992-05-08 현미경 KR960014969B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP3107927A JP2801974B2 (ja) 1991-05-14 1991-05-14 顕微鏡
JP91-107927 1991-05-14

Publications (2)

Publication Number Publication Date
KR920022016A true KR920022016A (ko) 1992-12-19
KR960014969B1 KR960014969B1 (ko) 1996-10-23

Family

ID=14471583

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920007760A KR960014969B1 (ko) 1991-05-14 1992-05-08 현미경

Country Status (2)

Country Link
JP (1) JP2801974B2 (ko)
KR (1) KR960014969B1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6108127A (en) * 1997-05-15 2000-08-22 3M Innovative Properties Company High resolution confocal microscope
US6055095A (en) * 1999-07-30 2000-04-25 Intel Corporation Microscope with infrared imaging
US7315414B2 (en) 2004-03-31 2008-01-01 Swift Instruments, Inc. Microscope with adjustable stage
JP4867354B2 (ja) * 2006-01-16 2012-02-01 横河電機株式会社 共焦点顕微鏡
JP2008076489A (ja) * 2006-09-19 2008-04-03 Olympus Corp 照明光学系及びこの照明光学系を有する光学装置
KR100936645B1 (ko) * 2008-05-01 2010-01-14 김영범 라만 현미경
US9322786B2 (en) * 2012-02-10 2016-04-26 Shimadzu Corporation Solar cell inspection apparatus and solar cell processing apparatus
KR101951034B1 (ko) * 2014-05-16 2019-02-22 한국전자통신연구원 순차통계 일정 오경보율 검파의 처리 속도 향상방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62208017A (ja) * 1986-03-10 1987-09-12 Hitachi Ltd 赤外線共焦点顕微鏡
JPS6329537A (ja) * 1986-07-23 1988-02-08 Hitachi Ltd 検査装置
JPH07122694B2 (ja) * 1986-10-16 1995-12-25 オリンパス光学工業株式会社 顕微鏡用照明装置
JPS63237428A (ja) * 1987-03-26 1988-10-03 Oki Electric Ind Co Ltd 半導体素子のパタ−ン認識装置

Also Published As

Publication number Publication date
JP2801974B2 (ja) 1998-09-21
KR960014969B1 (ko) 1996-10-23
JPH04336445A (ja) 1992-11-24

Similar Documents

Publication Publication Date Title
ATE140576T1 (de) Anzeigevorrichtungen mit erhöhtem kontrast
EP0049477A3 (en) Endoscope system
DE69418598D1 (de) Verfahren und vorrichtung zur beleuchtung und abbildung einer oberflaeche
DE69128979T2 (de) Vorrichtung zur Änderung der Polarisationsrichtung und Beleuchtungssystem mit polarisiertem Licht mit dieser Vorrichtung und Bildanzeigeeinheit mit dieser Vorrichtung
KR910014740A (ko) 카메라 조명장치
KR920022016A (ko) 현미경
ATE119288T1 (de) Elektroforetisches kapillar mit eingebauter optischer vorrichtung.
EP0547232A4 (en) Magnifying observation apparatus
DK0429086T3 (da) Kontrolapparat på basis af mørkefeltbelysning
KR860002024A (ko) 투과물체 2방향동시관찰장치
ATE241178T1 (de) Verfahren und einrichtung zur feststellung von pfandwertanzeigen
DE69207787D1 (de) Augenbeobachtungsgerät
KR920022015A (ko) 현미경
DE59302242D1 (de) Optoelektronisches Bauelement
SE7904919L (sv) Anordning for visuell undersokning
US3079503A (en) Negative to positive microscope
KR880003210A (ko) 액정 영상 투사광학계(液晶映像投射光學係)
RU1807582C (ru) Телевизионна камера
KR880003517A (ko) 비디오 카메라의 광학장치
ES2148273T3 (es) Fuente de ruido optico.
JPS645185A (en) Image-split camera device
AU7952591A (en) Device for improving the optical contrast of a holographic image
JPS5795767A (en) Blooming preventing device for image pickup device
KR920016813A (ko) 자동사격장치
KR950014921A (ko) 어두운 곳에서 사용할 수 있는 적외선 안경

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20011017

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee