KR920007030U - Wafer burn-in board - Google Patents

Wafer burn-in board

Info

Publication number
KR920007030U
KR920007030U KR2019900013997U KR900013997U KR920007030U KR 920007030 U KR920007030 U KR 920007030U KR 2019900013997 U KR2019900013997 U KR 2019900013997U KR 900013997 U KR900013997 U KR 900013997U KR 920007030 U KR920007030 U KR 920007030U
Authority
KR
South Korea
Prior art keywords
board
wafer burn
burn
wafer
Prior art date
Application number
KR2019900013997U
Other languages
Korean (ko)
Other versions
KR970004769Y1 (en
Inventor
서대우
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900013997U priority Critical patent/KR970004769Y1/en
Publication of KR920007030U publication Critical patent/KR920007030U/en
Application granted granted Critical
Publication of KR970004769Y1 publication Critical patent/KR970004769Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
KR2019900013997U 1990-09-10 1990-09-10 Burn-in mode of a wafer KR970004769Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900013997U KR970004769Y1 (en) 1990-09-10 1990-09-10 Burn-in mode of a wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900013997U KR970004769Y1 (en) 1990-09-10 1990-09-10 Burn-in mode of a wafer

Publications (2)

Publication Number Publication Date
KR920007030U true KR920007030U (en) 1992-04-22
KR970004769Y1 KR970004769Y1 (en) 1997-05-19

Family

ID=19303257

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900013997U KR970004769Y1 (en) 1990-09-10 1990-09-10 Burn-in mode of a wafer

Country Status (1)

Country Link
KR (1) KR970004769Y1 (en)

Also Published As

Publication number Publication date
KR970004769Y1 (en) 1997-05-19

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20040820

Year of fee payment: 8

EXPY Expiration of term