KR910017382U - Multibit parallel test circuit - Google Patents

Multibit parallel test circuit

Info

Publication number
KR910017382U
KR910017382U KR2019900002769U KR900002769U KR910017382U KR 910017382 U KR910017382 U KR 910017382U KR 2019900002769 U KR2019900002769 U KR 2019900002769U KR 900002769 U KR900002769 U KR 900002769U KR 910017382 U KR910017382 U KR 910017382U
Authority
KR
South Korea
Prior art keywords
test circuit
parallel test
multibit parallel
multibit
circuit
Prior art date
Application number
KR2019900002769U
Other languages
Korean (ko)
Other versions
KR960007140Y1 (en
Inventor
정원화
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900002769U priority Critical patent/KR960007140Y1/en
Publication of KR910017382U publication Critical patent/KR910017382U/en
Application granted granted Critical
Publication of KR960007140Y1 publication Critical patent/KR960007140Y1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
KR2019900002769U 1990-03-09 1990-03-09 Multibit parallel test circuit KR960007140Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900002769U KR960007140Y1 (en) 1990-03-09 1990-03-09 Multibit parallel test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900002769U KR960007140Y1 (en) 1990-03-09 1990-03-09 Multibit parallel test circuit

Publications (2)

Publication Number Publication Date
KR910017382U true KR910017382U (en) 1991-10-28
KR960007140Y1 KR960007140Y1 (en) 1996-08-22

Family

ID=19296622

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900002769U KR960007140Y1 (en) 1990-03-09 1990-03-09 Multibit parallel test circuit

Country Status (1)

Country Link
KR (1) KR960007140Y1 (en)

Also Published As

Publication number Publication date
KR960007140Y1 (en) 1996-08-22

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