DE9319199U1 - Test circuit - Google Patents
Test circuitInfo
- Publication number
- DE9319199U1 DE9319199U1 DE9319199U DE9319199U DE9319199U1 DE 9319199 U1 DE9319199 U1 DE 9319199U1 DE 9319199 U DE9319199 U DE 9319199U DE 9319199 U DE9319199 U DE 9319199U DE 9319199 U1 DE9319199 U1 DE 9319199U1
- Authority
- DE
- Germany
- Prior art keywords
- test circuit
- test
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9319199U DE9319199U1 (en) | 1993-12-14 | 1993-12-14 | Test circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9319199U DE9319199U1 (en) | 1993-12-14 | 1993-12-14 | Test circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
DE9319199U1 true DE9319199U1 (en) | 1994-02-17 |
Family
ID=6901983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE9319199U Expired - Lifetime DE9319199U1 (en) | 1993-12-14 | 1993-12-14 | Test circuit |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE9319199U1 (en) |
-
1993
- 1993-12-14 DE DE9319199U patent/DE9319199U1/en not_active Expired - Lifetime
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