KR920010235U - ROM test circuit - Google Patents

ROM test circuit

Info

Publication number
KR920010235U
KR920010235U KR2019900017616U KR900017616U KR920010235U KR 920010235 U KR920010235 U KR 920010235U KR 2019900017616 U KR2019900017616 U KR 2019900017616U KR 900017616 U KR900017616 U KR 900017616U KR 920010235 U KR920010235 U KR 920010235U
Authority
KR
South Korea
Prior art keywords
test circuit
rom test
rom
circuit
test
Prior art date
Application number
KR2019900017616U
Other languages
Korean (ko)
Other versions
KR940003389Y1 (en
Inventor
권병조
김화중
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900017616U priority Critical patent/KR940003389Y1/en
Publication of KR920010235U publication Critical patent/KR920010235U/en
Application granted granted Critical
Publication of KR940003389Y1 publication Critical patent/KR940003389Y1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5604—Display of error information
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
KR2019900017616U 1990-11-16 1990-11-16 Rom test circuit KR940003389Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900017616U KR940003389Y1 (en) 1990-11-16 1990-11-16 Rom test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900017616U KR940003389Y1 (en) 1990-11-16 1990-11-16 Rom test circuit

Publications (2)

Publication Number Publication Date
KR920010235U true KR920010235U (en) 1992-06-17
KR940003389Y1 KR940003389Y1 (en) 1994-05-23

Family

ID=19305502

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900017616U KR940003389Y1 (en) 1990-11-16 1990-11-16 Rom test circuit

Country Status (1)

Country Link
KR (1) KR940003389Y1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100384783B1 (en) * 2001-06-27 2003-05-23 주식회사 하이닉스반도체 Test mode enable signal generator for micom
KR100422946B1 (en) * 2001-06-29 2004-03-12 주식회사 하이닉스반도체 ROM having error detection fuction and method for transferring data thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100384783B1 (en) * 2001-06-27 2003-05-23 주식회사 하이닉스반도체 Test mode enable signal generator for micom
KR100422946B1 (en) * 2001-06-29 2004-03-12 주식회사 하이닉스반도체 ROM having error detection fuction and method for transferring data thereof

Also Published As

Publication number Publication date
KR940003389Y1 (en) 1994-05-23

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Legal Events

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