KR910020703U - Counter test circuit - Google Patents

Counter test circuit

Info

Publication number
KR910020703U
KR910020703U KR2019900006278U KR900006278U KR910020703U KR 910020703 U KR910020703 U KR 910020703U KR 2019900006278 U KR2019900006278 U KR 2019900006278U KR 900006278 U KR900006278 U KR 900006278U KR 910020703 U KR910020703 U KR 910020703U
Authority
KR
South Korea
Prior art keywords
test circuit
counter test
counter
circuit
test
Prior art date
Application number
KR2019900006278U
Other languages
Korean (ko)
Other versions
KR930002145Y1 (en
Inventor
박창일
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900006278U priority Critical patent/KR930002145Y1/en
Publication of KR910020703U publication Critical patent/KR910020703U/en
Application granted granted Critical
Publication of KR930002145Y1 publication Critical patent/KR930002145Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019900006278U 1990-05-14 1990-05-14 Counter test circuit KR930002145Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900006278U KR930002145Y1 (en) 1990-05-14 1990-05-14 Counter test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900006278U KR930002145Y1 (en) 1990-05-14 1990-05-14 Counter test circuit

Publications (2)

Publication Number Publication Date
KR910020703U true KR910020703U (en) 1991-12-20
KR930002145Y1 KR930002145Y1 (en) 1993-04-26

Family

ID=19298663

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900006278U KR930002145Y1 (en) 1990-05-14 1990-05-14 Counter test circuit

Country Status (1)

Country Link
KR (1) KR930002145Y1 (en)

Also Published As

Publication number Publication date
KR930002145Y1 (en) 1993-04-26

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Payment date: 20030318

Year of fee payment: 11

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