KR920004922B1 - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device Download PDF

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KR920004922B1
KR920004922B1 KR1019920001298A KR920001298A KR920004922B1 KR 920004922 B1 KR920004922 B1 KR 920004922B1 KR 1019920001298 A KR1019920001298 A KR 1019920001298A KR 920001298 A KR920001298 A KR 920001298A KR 920004922 B1 KR920004922 B1 KR 920004922B1
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bipolar transistor
base
npn
nmos
output
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KR1019920001298A
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이꾸로오 마스다
가즈오 가또오
다까오 사사야마
요오지 니시오
시게오 구보끼
마사히로 이와무라
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가부시기가이샤 히다찌 세이사꾸쇼
가나이 쯔도무
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Priority claimed from JP57119815A external-priority patent/JPH0783252B2/en
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/01Modifications for accelerating switching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0611Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
    • H01L27/0617Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
    • H01L27/0623Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with bipolar transistors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/01Modifications for accelerating switching
    • H03K19/017Modifications for accelerating switching in field-effect transistor circuits
    • H03K19/01707Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
    • H03K19/01721Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits by means of a pull-up or down element
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/0944Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET
    • H03K19/09448Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET in combination with bipolar transistors [BIMOS]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Logic Circuits (AREA)

Abstract

내용 없음.No content.

Description

반도체 집적회로장치Semiconductor integrated circuit device

제 1 도 (a) 및 (b)는 종래 기술인 2입력 NOR 회로도.1 (a) and (b) are two input NOR circuit diagrams of the prior art;

제 2 도는 본 발명의 제 1 실시예인 인버터회로도.2 is an inverter circuit diagram according to a first embodiment of the present invention.

제 3 도는 본 발명의 제 2 실시예인 인버터회로도이다.3 is an inverter circuit diagram according to a second embodiment of the present invention.

본 발명은 반도체 집적회로장치에 관한 것으로, 특히, 전계효과 트랜지스터(FET) 및 바이폴라 트랜지스터를 조합한 BiFET 반도체 집적회로장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to semiconductor integrated circuit devices, and more particularly, to a BiFET semiconductor integrated circuit device in which a field effect transistor (FET) and a bipolar transistor are combined.

전계효과 트랜지스터와 바이폴라 트랜지스터를 조합한 게이트회로로서는, 제 1a 도에 나타낸 바와 같은 2입력 NOR 게이트 회로가 알려져 있다(예를들면, IEEE Trans. Electron Devices, Vol. ED-16, No.11, pp945~951, Nov. 1969를 참조).As a gate circuit combining a field effect transistor and a bipolar transistor, a two-input NOR gate circuit as shown in FIG. 1A is known (for example, IEEE Trans. Electron Devices, Vol. ED-16, No. 11, pp945 ~ 951, Nov. 1969).

이것은 제 1b 도에 나타낸 PMOS(200, 201) 및 NMOS(202, 203)로 이루어진 C-MOS 트랜지스터 NOR 게이트 회로에 NPN(301, 302)를 조합한 것이나, 이 2입력 NOR 게이트 회로에서는 NPN(301, 302)이 오프가 될때, 축적된 소수전하를 강제적으로 방출하는 수단이었기 때문에 상기 NPN(301,302)이 오프로 전환되는 시간이 길어진다. 그 때문에 제 1, 제 2 NPN(301, 302)이 모두 온이 되는 상태가 길게 지속되어 소비전력이 증가할 뿐아니라 스위칭 시간도 늦어진다.This is a combination of NPNs 301 and 302 in a C-MOS transistor NOR gate circuit composed of PMOSs 200 and 201 and NMOSs 202 and 203 shown in FIG. 1B. However, in this two-input NOR gate circuit, NPN 301 is used. , 302 is a means for forcibly releasing the accumulated small charges, so that the time for the NPNs 301, 302 to be turned off becomes long. As a result, the state in which both the first and second NPNs 301 and 302 are turned on lasts for a long time, thereby increasing power consumption and delaying switching time.

본 발명의 목적은 상술한 BiCMOS 복합회로의 결점을 보완하고, 전계효과 트랜지스터 및 바이폴라 트랜지스터로 이루어진 고속이고 저소비전력의 반도체 집적회로장치를 제공하는데 있다.SUMMARY OF THE INVENTION An object of the present invention is to provide a high speed and low power consumption semiconductor integrated circuit device, which is made up of the above-described BiCMOS composite circuit and is composed of a field effect transistor and a bipolar transistor.

상기 목적을 달성하기 위하여 본 발명의 반도체 집적회로장치는 콜렉터가 전원측에 접속되고 에미터가 출력단자측에 접속되는 제 1 바이폴라 트랜지스터와 콜렉터가 출력 단자측에 접속되고 에미터가 기준전위측에 접속되는 제 2 바이폴라 트랜지스터를 포함하는 출력회로부와, 입력단자에 입력되는 입력신호에 응답하여 출력이 제 1 바이폴라 트랜지스터의 베이스에 접속되는 논리반전수단과, 드레인이 상기 출력단자에 접속되고 소오스가 제 2 바이폴라 트랜지스터의 베이스에 접속되며 게이트가 상기 입력단자에 접속되는 제 1 전계효과 트랜지스터와, 제 2 바이폴라 트랜지스터의 베이스와 기준전위 사이에 설치되고 게이트가 상기 논리반전수단의 출력에 접속되는 제 2 전계효과 트랜지스터를 포함하는 제 2 바이폴라 트랜지스터의 베이스 전하방출수단을 구비하고 있다.In order to achieve the above object, in the semiconductor integrated circuit device of the present invention, the first bipolar transistor and the collector are connected to the output terminal side and the emitter is connected to the reference potential side, with the collector connected to the power supply side and the emitter connected to the output terminal side. An output circuit section including a second bipolar transistor, a logic inverting means having an output connected to a base of the first bipolar transistor in response to an input signal input to an input terminal, a drain connected to the output terminal, and a source connected to the second output terminal; A first field effect transistor connected to the base of the bipolar transistor and having a gate connected to the input terminal, and a second field effect disposed between the base and the reference potential of the second bipolar transistor and having a gate connected to the output of the logic inverting means. Base charge chamber of a second bipolar transistor comprising a transistor And means.

바이폴라 트랜지스터로 출력단을 구성하고, MOS 트랜지스터로 논리를 채택함과 동시에 바이폴라 트랜지스터를 구동하는 회로를 구성한 바이폴라 MOS 복합회로에 있어서, 바이폴라 트랜지스터가 오프가 될 때, 트랜지스터로부터 축적전하를 방출하는 요소를 설치함으로써 바이폴라 트랜지스터가 신속하게 오프상태가 되어 관통전류를 적게 할 수 있으므로, 고속이며 저소비전력의 바이폴라 MOS 복합회로를 얻을 수 있다.In a bipolar MOS composite circuit in which an output stage is constituted by a bipolar transistor, a logic is adopted as a MOS transistor, and a circuit for driving a bipolar transistor is provided, an element for releasing accumulated charge from the transistor when the bipolar transistor is turned off is provided. As a result, the bipolar transistor can be turned off quickly and the through current can be reduced, so that a high speed, low power consumption bipolar MOS composite circuit can be obtained.

본 발명의 다른 목적 및 특징은 이하에 설명하는 실시예의 설명으로부터 명백해질 것이다.Other objects and features of the present invention will become apparent from the following description of the embodiments.

다음에 본 발명을 실시예에 의거하여 구체적으로 설명한다.Next, this invention is demonstrated concretely based on an Example.

제 2 도는 본 발명의 제 1 실시예인 인버터회로를 나타내고 있다.2 shows an inverter circuit as a first embodiment of the present invention.

제 2 도에 있어서 14는 콜렉터(C)가 제 1 고정전위인 전워단자(1)에 접속되고 에미터(E)가 출력단자(17)에 접속되는 제 1 NPN 바이폴라 트랜지스터(이하 제 1 NPN이라 칭함), 15는 콜렉터(C)가 출력단자(17)에 접속되고 에미터(E)가 제 2 고정전위인 접지전위(GND)에 접속되어 있는 제 2 NPN 바이폴라 트랜지스터(이하 제 2 NPN이라 칭함), 10은 게이트(G)가 입력단자(16)에 접속되고 소오스(5) 및 드레인(D)이 각각 제 1 NPN의 콜렉터(C)와 베이스(B)에 접속되어 있는 P형 절연 게이트 전계효과 트랜지스터(이하 PMOS라 칭함), 11은 게이트(G)가 입력단자(16)에 접속되고 드레인(D) 및 소오스(S)가 제 2 NPN의 콜렉터(C)와 베이스(B)에 접속되어 있는 N형 절연게이트 전계효과 트랜지스터(이하 NMOS라 칭함)이다. 또한 90은 제 2N 형 절연 게이트 전계효과 트랜지스터(이하 제 2 NMOS라 칭함)이고, 이 제 2 NMOS(90)의 게이트(G)는 입력단자(16)에 접속되고 드레인(D) 및 소오스(S)는 각각 PMOS(10)의 드레인(D) 및 NPN(15)의 베이스(B)에 접속되어 있다. 110은 제 N 형 절연게이트 전계효과 트랜지스터(이하 제3NMOS라 칭함)이고, 이 제 3 NMOS(110)의 게이트(G)는 제 1 NPN(14)의 베이스(B)에 접속되고 드레인(D) 및 소오스(S)는 제 2 NPN(15)의 베이스(B) 및 에미터(E)에 접속되어 있다. PMOS(10)와 NMOS(90)로 입력단자(16)에 입력되는 입력신호의 논리반전수단을 구성하고 있다.In FIG. 2, reference numeral 14 denotes a first NPN bipolar transistor (hereinafter referred to as first NPN) in which collector C is connected to power terminal 1 having a first fixed potential and emitter E is connected to output terminal 17. In FIG. 15 is a second NPN bipolar transistor (hereinafter referred to as a second NPN) in which the collector C is connected to the output terminal 17 and the emitter E is connected to the ground potential GND, which is the second fixed potential. ), 10 is a P-type insulated gate electric field in which the gate G is connected to the input terminal 16 and the source 5 and the drain D are connected to the collector C and the base B of the first NPN, respectively. In the effect transistor (hereinafter referred to as PMOS), 11, the gate G is connected to the input terminal 16, and the drain D and the source S are connected to the collector C and the base B of the second NPN. N-type insulated gate field effect transistor (hereinafter referred to as NMOS). In addition, 90 is a 2N type insulated gate field effect transistor (hereinafter referred to as a second NMOS), and the gate G of the second NMOS 90 is connected to the input terminal 16 and has a drain D and a source S. Are connected to the drain D of the PMOS 10 and the base B of the NPN 15, respectively. 110 is an N-type insulated gate field effect transistor (hereinafter referred to as a third NMOS), and the gate G of the third NMOS 110 is connected to the base B of the first NPN 14 and to the drain D. And the source S is connected to the base B and the emitter E of the second NPN 15. The PMOS 10 and the NMOS 90 constitute a logic inverting means of the input signal input to the input terminal 16.

표 1은 본 실시예의 제 2 논리동작을 나타낸 것이다.Table 1 shows the second logical operation of this embodiment.

[표 1]TABLE 1

입력(16)이 "0"레벨일 때, PMOS(10)가 온이 되고 NMOS(90,11)가 오프가 된다. 따라서 제 1 NPN(14)은 온이 된다. 이때, NMOS(11)오프가 되기 때문에 제 2 NPN(15)에의 전류의 공급이 정지됨과 동시에, 제 2 NPN(15)의 베이스(B) 및 NMOS(11)에 축적된 축적전하가 온이 되는 NMOS(110)를 거쳐 방출되므로 제 2 NPN(15)은 급속하게 오프가 된다. 따라서, 제 1NPN(14)의 에미터 전류는 전하를 충전하여 출력(17)은 급속하게 "1"레벨이 된다.When input 16 is at " 0 " level, PMOS 10 is on and NMOS 90, 11 is off. Therefore, the first NPN 14 is turned on. At this time, since the NMOS 11 is turned off, the supply of current to the second NPN 15 is stopped and the accumulated charge accumulated in the base B and the NMOS 11 of the second NPN 15 is turned on. The second NPN 15 is rapidly turned off because it is emitted via the NMOS 110. Therefore, the emitter current of the first NPN 14 charges the electric charge so that the output 17 rapidly reaches the " 1 " level.

입력(16)이 "1"레벨이 될 때, PMOS(10)는 오프가 되고, 제 1 NMOS(11) 및 제 2 NMOS(90)는 온이 된다.이때, PMOS(10)가 오프가 되기 때문에 제 1 NPN(14)에의 전류의 공급이 정지됨과 동시에, 제 1 NPN(14)의 베이스(B) 및 PMOS(10)에 축적된 축전 전하가 온이 되는 제 2 NMOS(90)를 거쳐 방출되므로 제 1 NPN(14)은 급속하게 오프가 된다. 또, NMOS(11)가 온이 되어 드레인(D)과 소오스(S) 사이가 단락되기 때문에 제 2 NPN(15)의 베이스(B)에는 출력(17)으로부터의 전류와, 상기한 바와 같은 제 1 NPN(14)의 베이스(B) 및 PMOS(10)에 축적된 축전전하의 전류가 모두 공급되어 제 2 NPN(15)은 급속하게 온이 된다. 따라서, 출력(17)은 급속하게 "0"레벨이 된다.When the input 16 is at the " 1 " level, the PMOS 10 is turned off, and the first NMOS 11 and the second NMOS 90 are turned on. At this time, the PMOS 10 is turned off. As a result, the supply of current to the first NPN 14 is stopped and discharged via the second NMOS 90 at which the storage charge accumulated in the base B of the first NPN 14 and the PMOS 10 is turned on. Therefore, the first NPN 14 is rapidly turned off. In addition, since the NMOS 11 is turned on and the drain D and the source S are short-circuited, the base B of the second NPN 15 has a current from the output 17 and the above-mentioned All of the electric charges stored in the base B and the PMOS 10 of the first NPN 14 are supplied, so that the second NPN 15 is rapidly turned on. Therefore, the output 17 rapidly goes to the "0" level.

다음에 제 3 NMOS(110)의 작용에 대하여 상세하게 설명한다. NMOS(11) 및 제 2 NPN(15)이 온에서 오프로 전환될 때, 즉 입력(16)이 "1"에서 "0"레벨이 될 때, 제 2 NMOS(11) 및 제 2 NPN(15)의 베이스(B)에 축적된 축적전하가 온이 되는 제 3 NMOS(110)를 서쳐 방출된다. 입력(16)이 "0"레벨일 때는 제 1 NPN(14)의 높은 베이스전위(전원 전위와 동일함)가 제 3 NMOS(110)의 게이트에 더해져 제 3 NMOS( 110)가 온이 되어 제 2 NPN(15)의 베이스와 에미터 사이를 단락하므로 축적전하를 고속으로 방출한다.Next, the operation of the third NMOS 110 will be described in detail. When the NMOS 11 and the second NPN 15 are switched from on to off, that is, when the input 16 goes from "1" to "0" level, the second NMOS 11 and the second NPN 15 The accumulated charge accumulated in the base B of the C) is discharged through the third NMOS 110 which is turned on. When the input 16 is at the " 0 " level, the high base potential of the first NPN 14 (same as the power supply potential) is added to the gate of the third NMOS 110 so that the third NMOS 110 is turned on so that the third NMOS 110 is turned on. 2 Short-circuits between the base and the emitter of the NPN 15 releases accumulated charge at high speed.

한편, 입력(16)이 "0"에서 "1"레벨이 될 때는 제 1 NPN(14)의 낮은 베이스 전위가 제3 NMOS(110)의 게이트에 더해져 제 3 NMOS(110)가 오프가 된다. 따라서, 제 2 NPN(15)의 베이스(B)에 공급되는 전류가 NMOS(110)쪽으로 흐르지 않게 되어 제 2 NPN(15)에 충분한 베이스 전류가 공급되므로 제 2 NPN(15)은 급속하게 온이 된다.On the other hand, when the input 16 goes from "0" to "1" level, the low base potential of the first NPN 14 is added to the gate of the third NMOS 110 so that the third NMOS 110 is turned off. Therefore, since the current supplied to the base B of the second NPN 15 does not flow toward the NMOS 110, sufficient base current is supplied to the second NPN 15 so that the second NPN 15 is rapidly turned on. do.

따라서 NMOS(110)에 의해, NPN(15)이 입력신호에 따라 급속히 온, 오프되기 때문에 고속, 저소비전력의 BiCMOS회로를 얻을 수가 있다.Therefore, the NMOS 110 rapidly turns on and off the NPN 15 in response to an input signal, thereby obtaining a BiCMOS circuit of high speed and low power consumption.

제 3 도는 본 발명의 제 2 실시예인 인버터회로를 나타내고 있다. 이 회로는 제2 도에 나타낸 실시예의 회로와 거의 동일한 구성을 가지고 있고 동작적으로도 유사하다.3 shows an inverter circuit as a second embodiment of the present invention. This circuit has a configuration substantially the same as that of the embodiment shown in FIG. 2 and is similar in operation.

제 3 도에 있어서, 제 2 도와 동일한 부호는 동일물 및 상당물을 나타내고 있다. 제 2 도의 회로와 다른점은 제 2 도의 제 1 및 제 2 NPN(14,15)이 각각 숏트키 베리어 다이오드 부착 트랜지스터(125,126)로 치환되어 있는 것과, 제 2 NPN(126)의 베이스 전류 공급용으로서 제 4 NMOS(123)가 설치되어 있는 것이다.In FIG. 3, the same code | symbol as 2nd degree has shown the same and equivalent. Unlike the circuit of FIG. 2, the first and second NPNs 14 and 15 of FIG. 2 are replaced with the transistors 125 and 126 with Schottky barrier diodes, respectively, and the base current supply of the second NPN 126 is performed. As a result, the fourth NMOS 123 is provided.

본 실시예에 의하면, 제 1 실시예보다도 더욱 고속인 인버터 회로를 실현할 수 있다.According to this embodiment, an inverter circuit which is higher speed than that of the first embodiment can be realized.

이상 설명한 바와 같이, 본 발명에 의하면, 전계효과 트랜지스터와 바이폴라 트랜지스터를 조합한 고속이고, 저소비전력의 반도체 집적회로장치를 얻을 수가 있다.As described above, according to the present invention, a high speed, low power consumption semiconductor integrated circuit device combining a field effect transistor and a bipolar transistor can be obtained.

Claims (1)

콜렉터가 전원측에 접속되고 에미터가 출력단자측에 접속되는 제1 바이폴라 트랜지스터와, 콜렉터가 출력단자측에 접속되고 에미턱 기준 전위측에 접속되는 제 2 바이폴라 트랜지스터를 포함하는 출력회로부와 ; 입력단자에 입력되는 입력신호에 응답하여 출력이 제 1 바이폴라 트랜지스터의 베이스에 접속되는 논리 반전수단과; 드레인이 상기 출력 단자에 접속되고 소오스가 제 2 바이폴라 트랜지스터의 베이스에 접속되며 게이트가 상기 입력단자에 접속되는 제 1 전계효과 트랜지스터와 ; 제 2 바이폴라 트랜지스터의 베이스와 기준전위 사이에 설치되고, 게이트가 상기 논리반전수단의 출력에 접속되는 제 2 전계효과 트랜지스터를 포함하는 제 2 바이폴라 트랜지스터의 베이스 전하 방출수단을 구비하고 있는 것을 특징으로 하는 반도체 집적회로장치.An output circuit section including a first bipolar transistor having a collector connected to a power supply side and an emitter connected to an output terminal side, and a second bipolar transistor connected to an output terminal side and a collector connected to an emission reference potential side; Logic inverting means, the output of which is connected to the base of the first bipolar transistor in response to an input signal input to the input terminal; A first field effect transistor having a drain connected to the output terminal, a source connected to a base of a second bipolar transistor, and a gate connected to the input terminal; And a base charge emitting means of a second bipolar transistor, which is provided between the base of the second bipolar transistor and the reference potential, and includes a second field effect transistor whose gate is connected to the output of the logic inverting means. Semiconductor integrated circuit device.
KR1019920001298A 1982-07-12 1992-01-29 Semiconductor integrated circuit device KR920004922B1 (en)

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JP57119815A JPH0783252B2 (en) 1982-07-12 1982-07-12 Semiconductor integrated circuit device
JP82-119815 1982-07-12
KR1019830003180A KR920004919B1 (en) 1982-07-12 1983-07-12 Semiconductor integrated circuit device
KR1019920001298A KR920004922B1 (en) 1982-07-12 1992-01-29 Semiconductor integrated circuit device

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7292803B2 (en) 2004-08-28 2007-11-06 Samsung Electronics Co., Ltd. Developing unit having foldable handle and image forming apparatus having the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7292803B2 (en) 2004-08-28 2007-11-06 Samsung Electronics Co., Ltd. Developing unit having foldable handle and image forming apparatus having the same
US7761030B2 (en) 2004-08-28 2010-07-20 Samsung Electronics Co., Ltd. Developing unit having foldable handle and image forming apparatus having the same

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