KR920003250A - 나노미터 범위의 정보단위의 저장 - Google Patents

나노미터 범위의 정보단위의 저장 Download PDF

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Publication number
KR920003250A
KR920003250A KR1019910011220A KR910011220A KR920003250A KR 920003250 A KR920003250 A KR 920003250A KR 1019910011220 A KR1019910011220 A KR 1019910011220A KR 910011220 A KR910011220 A KR 910011220A KR 920003250 A KR920003250 A KR 920003250A
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South Korea
Prior art keywords
information units
nanometer range
precious metal
storage
sensitive scanning
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KR1019910011220A
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English (en)
Inventor
라베 위르겐
부흐홀츠 슈테판
푸흐스 하랄트
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라이싱어, 바르츠
바스프 악티엔게젤샤프트
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Publication of KR920003250A publication Critical patent/KR920003250A/ko

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82BNANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
    • B82B3/00Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B11/00Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
    • G11B11/03Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by deforming with non-mechanical means, e.g. laser, beam of particles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B3/00Recording by mechanical cutting, deforming or pressing, e.g. of grooves or pits; Reproducing by mechanical sensing; Record carriers therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1463Record carriers for recording or reproduction involving the use of microscopic probe means
    • G11B9/149Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the memorising material or structure
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00Applications, other than SPM, of scanning-probe techniques
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/84Manufacture, treatment, or detection of nanostructure
    • Y10S977/849Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/855Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
    • Y10S977/856Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including etching/cutting

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Semiconductor Memories (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Chemically Coating (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)

Abstract

내용 없음

Description

나노미터 범위의 정보단위의 저장
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 운석상에 증착된 은 피막의 박막층을 나타내는 현미경사진,
제2도는 측정바늘의 철회 및 전류의 증가로 인하여 은 덩어리의 분리시 금속-금속 점 접촉이 재빨리 발생되는 것을 나타내는 현미경 사진.

Claims (5)

1nm내지 1㎛의 직경 및 1000nm이하의 깊이를 갖는 컵과 같은 구멍이 표면-민감성 주사탐침에 의해 귀금속 표면에서 생성됨을 특징으로 하는, 나노미터 범위의 정보단위의 시간-안정 저장을 위한 방법.
제1항에 있어서, 표면의 변형이 단기간 전기장을 인가하여 표면 민감성 주사탐침에 의해 수행됨을 특징으로 하는 방법.
제1항에 있어서, 표면의 변형이 장 탈착, 점 점촉 및 적층제거에 의해 수행됨을 특징으로 하는 방법.
제1항에 있어서, 귀금속 표면이 은 피막임을 특징으로 하는 방법.
열처리에 의해 변형을 역전시키는 것으로 이루어진, 표면-민감성 주사탐침에 의해 제1항에서 청구한 바와 같은 귀금속 표면에 컴과 같은 구멍을 생성함으로써 생성된 나노미터 범위의 정보단위를 지우기 위한 방법.
※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910011220A 1990-07-03 1991-07-03 나노미터 범위의 정보단위의 저장 KR920003250A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4021075A DE4021075A1 (de) 1990-07-03 1990-07-03 Verfahren zur speicherung von informationseinheiten im nanometerbereich
DEP4021075.8 1990-07-03

Publications (1)

Publication Number Publication Date
KR920003250A true KR920003250A (ko) 1992-02-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910011220A KR920003250A (ko) 1990-07-03 1991-07-03 나노미터 범위의 정보단위의 저장

Country Status (8)

Country Link
US (1) US5262981A (ko)
EP (1) EP0464536B1 (ko)
JP (1) JPH0689472A (ko)
KR (1) KR920003250A (ko)
AT (1) ATE149264T1 (ko)
AU (1) AU7946891A (ko)
CA (1) CA2046063A1 (ko)
DE (2) DE4021075A1 (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010086868A (ko) * 2000-03-03 2001-09-15 김원배 질석 및 진주암 분말을 함유하는 섬유원사
US6692828B2 (en) 2002-04-29 2004-02-17 Hyosung Corporation High chlorine and heat resistant spandex fiber and manufacturing method thereof
WO2011040755A2 (ko) 2009-09-30 2011-04-07 주식회사 효성 내염소성이 우수한 스판덱스 섬유 및 그의 제조방법

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4120365A1 (de) * 1991-06-20 1992-12-24 Basf Ag Verfahren zur gezielten modifikation einzelner nanometer- und subnanometer-strukturen einer festkoerperoberflaeche
JPH05282717A (ja) * 1992-03-31 1993-10-29 Canon Inc 記録媒体の製造方法、及び記録媒体、及び情報処理装置
JPH06187675A (ja) * 1992-09-25 1994-07-08 Canon Inc 情報処理装置、及びそれを用いる情報処理方法
US5308974B1 (en) * 1992-11-30 1998-01-06 Digital Instr Inc Scanning probe microscope using stored data for vertical probe positioning
US5453970A (en) * 1993-07-13 1995-09-26 Rust; Thomas F. Molecular memory medium and molecular memory disk drive for storing information using a tunnelling probe
US5513168A (en) * 1993-10-19 1996-04-30 Seiko Instruments Inc. Optical information read/write apparatus
US7260051B1 (en) 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
DE10118404C1 (de) * 2001-04-12 2002-11-21 Infineon Technologies Ag Speicheranordnung
US8403367B2 (en) * 2001-08-02 2013-03-26 Eastman Kodak Company Authentication using near-field optical imaging
JP2004114273A (ja) * 2002-09-30 2004-04-15 National Institute For Materials Science 走査トンネル顕微鏡による銀ナノ構造の作製方法
US7233517B2 (en) 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
US20040150472A1 (en) * 2002-10-15 2004-08-05 Rust Thomas F. Fault tolerant micro-electro mechanical actuators
US6985377B2 (en) 2002-10-15 2006-01-10 Nanochip, Inc. Phase change media for high density data storage
US6982898B2 (en) * 2002-10-15 2006-01-03 Nanochip, Inc. Molecular memory integrated circuit utilizing non-vibrating cantilevers
US7301887B2 (en) 2004-04-16 2007-11-27 Nanochip, Inc. Methods for erasing bit cells in a high density data storage device
US7379412B2 (en) 2004-04-16 2008-05-27 Nanochip, Inc. Methods for writing and reading highly resolved domains for high density data storage
US20050232061A1 (en) 2004-04-16 2005-10-20 Rust Thomas F Systems for writing and reading highly resolved domains for high density data storage
US7463573B2 (en) 2005-06-24 2008-12-09 Nanochip, Inc. Patterned media for a high density data storage device
US7367119B2 (en) 2005-06-24 2008-05-06 Nanochip, Inc. Method for forming a reinforced tip for a probe storage device
US7309630B2 (en) 2005-07-08 2007-12-18 Nanochip, Inc. Method for forming patterned media for a high density data storage device
DE102009004305A1 (de) * 2008-12-12 2010-06-17 Bpe E.K. Verfahren zur Herstellung von plattenförmigen Körpern mit mikro- und/oder nanostrukturierten Oberflächen oder von mikro- und/oder nanogroß durchbrochenen Folien

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3750117A (en) * 1971-09-30 1973-07-31 Gen Electric Electron beam addressable archival memory
US4287572A (en) * 1979-08-22 1981-09-01 General Electric Company Method for writing on archival target and target produced thereby
JPS5766576A (en) * 1980-10-14 1982-04-22 Toshiba Corp Information recording medium
JPH0648532B2 (ja) * 1984-03-12 1994-06-22 松下電器産業株式会社 磁気記録再生装置
US4829507A (en) * 1984-09-14 1989-05-09 Xerox Corporation Method of and system for atomic scale readout of recorded information
ATE66092T1 (de) * 1986-12-07 1991-08-15 Lasarray Holding Ag Verfahren und vorrichtung zur erzeugung von materialstrukturen im bereich atomarer dimensionen.
US4916688A (en) * 1988-03-31 1990-04-10 International Business Machines Corporation Data storage method using state transformable materials
NL8802335A (nl) * 1988-09-21 1990-04-17 Philips Nv Werkwijze en inrichting voor het op sub-mikron schaal bewerken van een materiaal-oppervlak.
US5015323A (en) * 1989-10-10 1991-05-14 The United States Of America As Represented By The Secretary Of Commerce Multi-tipped field-emission tool for nanostructure fabrication

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010086868A (ko) * 2000-03-03 2001-09-15 김원배 질석 및 진주암 분말을 함유하는 섬유원사
US6692828B2 (en) 2002-04-29 2004-02-17 Hyosung Corporation High chlorine and heat resistant spandex fiber and manufacturing method thereof
WO2011040755A2 (ko) 2009-09-30 2011-04-07 주식회사 효성 내염소성이 우수한 스판덱스 섬유 및 그의 제조방법

Also Published As

Publication number Publication date
DE59108563D1 (de) 1997-04-03
AU7946891A (en) 1992-01-09
DE4021075A1 (de) 1992-01-09
US5262981A (en) 1993-11-16
EP0464536B1 (de) 1997-02-26
EP0464536A2 (de) 1992-01-08
EP0464536A3 (en) 1992-06-03
JPH0689472A (ja) 1994-03-29
ATE149264T1 (de) 1997-03-15
CA2046063A1 (en) 1992-01-04

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