KR920003076U - 3선식 저항 측정회로 - Google Patents

3선식 저항 측정회로

Info

Publication number
KR920003076U
KR920003076U KR2019900011175U KR900011175U KR920003076U KR 920003076 U KR920003076 U KR 920003076U KR 2019900011175 U KR2019900011175 U KR 2019900011175U KR 900011175 U KR900011175 U KR 900011175U KR 920003076 U KR920003076 U KR 920003076U
Authority
KR
South Korea
Prior art keywords
measurement circuit
resistance measurement
wire resistance
wire
circuit
Prior art date
Application number
KR2019900011175U
Other languages
English (en)
Other versions
KR930005367Y1 (ko
Inventor
송승우
Original Assignee
금성계전 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성계전 주식회사 filed Critical 금성계전 주식회사
Priority to KR2019900011175U priority Critical patent/KR930005367Y1/ko
Publication of KR920003076U publication Critical patent/KR920003076U/ko
Application granted granted Critical
Publication of KR930005367Y1 publication Critical patent/KR930005367Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR2019900011175U 1990-07-28 1990-07-28 3선식 저항 측정회로 KR930005367Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900011175U KR930005367Y1 (ko) 1990-07-28 1990-07-28 3선식 저항 측정회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900011175U KR930005367Y1 (ko) 1990-07-28 1990-07-28 3선식 저항 측정회로

Publications (2)

Publication Number Publication Date
KR920003076U true KR920003076U (ko) 1992-02-25
KR930005367Y1 KR930005367Y1 (ko) 1993-08-16

Family

ID=19301565

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900011175U KR930005367Y1 (ko) 1990-07-28 1990-07-28 3선식 저항 측정회로

Country Status (1)

Country Link
KR (1) KR930005367Y1 (ko)

Also Published As

Publication number Publication date
KR930005367Y1 (ko) 1993-08-16

Similar Documents

Publication Publication Date Title
DE69128592D1 (de) Temperaturfühlschaltung
DE69217548D1 (de) Messfühler
DE69329068T2 (de) Sensorwiderstandmessschaltung
DE69125136D1 (de) Messonde
DE69213668D1 (de) Messprobe
DE69122537D1 (de) EEPROM mit Schwellwertmessschaltung
DE59107958D1 (de) Messvorrichtung
KR910700452A (ko) 램다 프로우브의 내부 저항 측정 회로
DE69128002D1 (de) Detektor-Schaltkreis
DK437387D0 (da) Maalekredsloeb
DE68925616D1 (de) Adressenübergangsabfühlschaltung
DE3219168A1 (de) Messwiderstand fuer rauschthermometer
MX151839A (es) Mejoras en termometro clinico electronico
DE69118239D1 (de) Pegel-Erkennungsschaltung
DE69128837D1 (de) Füllstandsmessung
DE68928600D1 (de) Erweiterte Prüfschaltung
FI912337A0 (fi) Pituudenmittauslaite
MX173887B (es) Dispositivo de medicion
KR920003076U (ko) 3선식 저항 측정회로
DE68919377D1 (de) Wegmessschaltung.
KR910013424U (ko) 감도향상회로
KR920010235U (ko) 롬 테스트회로
KR870018764U (ko) 저항 측정 회로
KR920021897U (ko) 온도측정회로
KR900001186U (ko) Rtd 측정회로

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
AMND Amendment
E601 Decision to refuse application
J2X1 Appeal (before the patent court)

Free format text: APPEAL AGAINST DECISION TO DECLINE REFUSAL

B701 Decision to grant
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 19971227

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee