KR900010048A - 스퍼터링 장치 - Google Patents
스퍼터링 장치Info
- Publication number
- KR900010048A KR900010048A KR1019890018307A KR890018307A KR900010048A KR 900010048 A KR900010048 A KR 900010048A KR 1019890018307 A KR1019890018307 A KR 1019890018307A KR 890018307 A KR890018307 A KR 890018307A KR 900010048 A KR900010048 A KR 900010048A
- Authority
- KR
- South Korea
- Prior art keywords
- sputtering device
- sputtering
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3421—Cathode assembly for sputtering apparatus, e.g. Target using heated targets
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
- H01J37/3497—Temperature of target
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-317477 | 1988-12-15 | ||
JP63317477A JPH02163368A (ja) | 1988-12-15 | 1988-12-15 | スパッタリング装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900010048A true KR900010048A (ko) | 1990-07-06 |
KR940001677B1 KR940001677B1 (ko) | 1994-03-05 |
Family
ID=18088666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890018307A KR940001677B1 (ko) | 1988-12-15 | 1989-12-11 | 스퍼터링 장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5082545A (ko) |
JP (1) | JPH02163368A (ko) |
KR (1) | KR940001677B1 (ko) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05331632A (ja) * | 1992-06-01 | 1993-12-14 | Matsushita Electric Ind Co Ltd | レーザーアブレーション装置と薄膜形成方法 |
US5510088A (en) * | 1992-06-11 | 1996-04-23 | The United States Of America As Represented By The Secretary Of The Navy | Low temperature plasma film deposition using dielectric chamber as source material |
US5444302A (en) * | 1992-12-25 | 1995-08-22 | Hitachi, Ltd. | Semiconductor device including multi-layer conductive thin film of polycrystalline material |
US5429732A (en) * | 1994-02-14 | 1995-07-04 | Hughes Aircraft Company | High rate ion beam sputtering process |
US5490912A (en) * | 1994-05-31 | 1996-02-13 | The Regents Of The University Of California | Apparatus for laser assisted thin film deposition |
JP2882572B2 (ja) * | 1994-08-31 | 1999-04-12 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 金属薄膜をレーザで平坦化する方法 |
US5628889A (en) * | 1994-09-06 | 1997-05-13 | International Business Machines Corporation | High power capacity magnetron cathode |
FR2744462B1 (fr) * | 1996-02-02 | 1998-02-27 | Commissariat Energie Atomique | Procede et dispositif pour realiser un depot par pulverisation cathodique a partir d'une cible portee a haute temperature |
JP3429957B2 (ja) * | 1996-08-28 | 2003-07-28 | 松下電器産業株式会社 | スパッタリング方法及び装置 |
JP3680029B2 (ja) * | 2001-08-08 | 2005-08-10 | 三菱重工業株式会社 | 金属薄膜の気相成長方法およびその気相成長装置 |
DE10142831A1 (de) * | 2001-08-21 | 2003-03-13 | Siemens Ag | Verfahren zur Konditionierung einer Targetoberfläche bei einem Sputterbeschichtungsprozess eines Substrats und entsprechende Sputteranlage |
US7431807B2 (en) * | 2005-01-07 | 2008-10-07 | Universal Display Corporation | Evaporation method using infrared guiding heater |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3472751A (en) * | 1965-06-16 | 1969-10-14 | Ion Physics Corp | Method and apparatus for forming deposits on a substrate by cathode sputtering using a focussed ion beam |
FR1534917A (fr) * | 1967-06-22 | 1968-08-02 | Alcatel Sa | Perfectionnements à l'obtention de dépôts par pulvérisation cathodique |
US4046666A (en) * | 1976-05-07 | 1977-09-06 | The United States Of America As Represented By The United States Energy Research And Development Administration | Device for providing high-intensity ion or electron beam |
US4033843A (en) * | 1976-05-27 | 1977-07-05 | General Dynamics Corporation | Simple method of preparing structurally high quality PbSnTe films |
JPS5644770A (en) * | 1979-09-17 | 1981-04-24 | Matsushita Electric Ind Co Ltd | Preparation of thin film |
JPS6040082B2 (ja) * | 1979-09-20 | 1985-09-09 | 松下電器産業株式会社 | ト−ンア−ム駆動装置 |
US4407708A (en) * | 1981-08-06 | 1983-10-04 | Eaton Corporation | Method for operating a magnetron sputtering apparatus |
US4487675A (en) * | 1983-01-31 | 1984-12-11 | Meckel Benjamin B | Magnetically-assisted sputtering method for producing vertical recording media |
US4664769A (en) * | 1985-10-28 | 1987-05-12 | International Business Machines Corporation | Photoelectric enhanced plasma glow discharge system and method including radiation means |
JPH086177B2 (ja) * | 1986-12-26 | 1996-01-24 | 松下電器産業株式会社 | 反応性スパッタリング方法 |
JP2555045B2 (ja) * | 1987-01-19 | 1996-11-20 | 株式会社日立製作所 | 薄膜形成方法及びその装置 |
JPH01152271A (ja) * | 1987-12-09 | 1989-06-14 | Toshiba Corp | スパッタ装置 |
DE3834318A1 (de) * | 1988-10-08 | 1990-04-12 | Leybold Ag | Vorrichtung zum aufbringen dielektrischer oder metallischer werkstoffe |
US4923585A (en) * | 1988-11-02 | 1990-05-08 | Arch Development Corporation | Sputter deposition for multi-component thin films |
-
1988
- 1988-12-15 JP JP63317477A patent/JPH02163368A/ja active Pending
-
1989
- 1989-12-11 KR KR1019890018307A patent/KR940001677B1/ko not_active IP Right Cessation
- 1989-12-14 US US07/450,920 patent/US5082545A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH02163368A (ja) | 1990-06-22 |
US5082545A (en) | 1992-01-21 |
KR940001677B1 (ko) | 1994-03-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20030224 Year of fee payment: 10 |
|
LAPS | Lapse due to unpaid annual fee |