KR900002177A - 기호압축회로 - Google Patents

기호압축회로 Download PDF

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Publication number
KR900002177A
KR900002177A KR1019890009922A KR890009922A KR900002177A KR 900002177 A KR900002177 A KR 900002177A KR 1019890009922 A KR1019890009922 A KR 1019890009922A KR 890009922 A KR890009922 A KR 890009922A KR 900002177 A KR900002177 A KR 900002177A
Authority
KR
South Korea
Prior art keywords
test
circuit
compression circuit
perform
output register
Prior art date
Application number
KR1019890009922A
Other languages
English (en)
Other versions
KR920004278B1 (ko
Inventor
야스유키 노즈야마
Original Assignee
아오이 죠이치
가부시키가이샤 도시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아오이 죠이치, 가부시키가이샤 도시바 filed Critical 아오이 죠이치
Publication of KR900002177A publication Critical patent/KR900002177A/ko
Application granted granted Critical
Publication of KR920004278B1 publication Critical patent/KR920004278B1/ko

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/40—Response verification devices using compression techniques

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

내용 없음.

Description

기호압축회로
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1 도는 본 발명의 제 1 실시예에 따른 구성을 나타낸 도면.
제 2 도는 본 발명의 제 2 실시예에 따른 구성을 나타낸 도면.
제 3 도는 출력레지스터를 이용한 조합회로의 테스트에 대한 개략구성을 나타낸 도면.

Claims (1)

  1. 해석대상으로 되는 피테스트회로(21)로부터 복수의 테스트출력을 취입하는 출력레지스터(31)가 병렬기호압축동작을 수행할 수 있도록 된 기호압축회로에 있어서, 상기 출력레지스터(31)가 스캔동작을 수행하도록 공통의 제어신호(A, B)를 인가받아 상기 피테스트회로(21)의 테스트출력을 소정의 논리레벨로 설정하는 트랜지스터(37)를 갖추어 구성된 것을 특징으로 하는 기호압축회로.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890009922A 1988-07-12 1989-07-12 기호압축회로 KR920004278B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP88-171906 1988-07-12
JP63-171906 1988-07-12
JP63171906A JPH0776782B2 (ja) 1988-07-12 1988-07-12 シグネチャ圧縮回路

Publications (2)

Publication Number Publication Date
KR900002177A true KR900002177A (ko) 1990-02-28
KR920004278B1 KR920004278B1 (ko) 1992-06-01

Family

ID=15932020

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890009922A KR920004278B1 (ko) 1988-07-12 1989-07-12 기호압축회로

Country Status (4)

Country Link
EP (1) EP0350888B1 (ko)
JP (1) JPH0776782B2 (ko)
KR (1) KR920004278B1 (ko)
DE (1) DE68927207T2 (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975640A (en) * 1990-02-20 1990-12-04 Crosscheck Technology, Inc. Method for operating a linear feedback shift register as a serial shift register with a crosscheck grid structure
JPH0469580A (ja) * 1990-07-10 1992-03-04 Nec Corp 並列パタン圧縮器
GB9911043D0 (en) * 1999-05-12 1999-07-14 Sgs Thomson Microelectronics Memory circuit
JP2002100738A (ja) 2000-09-25 2002-04-05 Toshiba Corp 半導体集積回路及びテスト容易化回路の自動挿入方法
CA2348799A1 (fr) * 2001-05-22 2002-11-22 Marcel Blais Appareil d'essai de composants electroniques
KR100825790B1 (ko) * 2006-11-07 2008-04-29 삼성전자주식회사 데이터를 압축시키는 테스트 콘트롤러를 채용한 테스트시스템, 데이터 압축 회로 및 테스트 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4377757A (en) * 1980-02-11 1983-03-22 Siemens Aktiengesellschaft Logic module for integrated digital circuits
DE3215671C2 (de) * 1982-04-27 1984-05-03 Siemens AG, 1000 Berlin und 8000 München Programmierbare Logikanordnung
JPS59200456A (ja) * 1983-04-27 1984-11-13 Hitachi Ltd 半導体集積回路装置
US4680539A (en) * 1983-12-30 1987-07-14 International Business Machines Corp. General linear shift register
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
US4768196A (en) * 1986-10-28 1988-08-30 Silc Technologies, Inc. Programmable logic array

Also Published As

Publication number Publication date
EP0350888A2 (en) 1990-01-17
JPH0222579A (ja) 1990-01-25
KR920004278B1 (ko) 1992-06-01
EP0350888A3 (en) 1991-08-21
DE68927207D1 (de) 1996-10-24
JPH0776782B2 (ja) 1995-08-16
DE68927207T2 (de) 1997-03-06
EP0350888B1 (en) 1996-09-18

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