KR890700822A - 원통형 물체 표면 균열의 광학적 조사장치 - Google Patents

원통형 물체 표면 균열의 광학적 조사장치

Info

Publication number
KR890700822A
KR890700822A KR1019880701427A KR880701427A KR890700822A KR 890700822 A KR890700822 A KR 890700822A KR 1019880701427 A KR1019880701427 A KR 1019880701427A KR 880701427 A KR880701427 A KR 880701427A KR 890700822 A KR890700822 A KR 890700822A
Authority
KR
South Korea
Prior art keywords
irradiation device
surface cracks
cylindrical objects
optical irradiation
optical
Prior art date
Application number
KR1019880701427A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR890700822A publication Critical patent/KR890700822A/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1019880701427A 1987-03-09 1988-11-09 원통형 물체 표면 균열의 광학적 조사장치 KR890700822A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US2332487A 1987-03-09 1987-03-09
PCT/US1988/000660 WO1988007190A1 (en) 1987-03-09 1988-03-07 Optical inspection system for cylindrical objects

Publications (1)

Publication Number Publication Date
KR890700822A true KR890700822A (ko) 1989-04-27

Family

ID=21814425

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880701427A KR890700822A (ko) 1987-03-09 1988-11-09 원통형 물체 표면 균열의 광학적 조사장치

Country Status (5)

Country Link
EP (1) EP0304477A1 (ko)
JP (1) JPH01502535A (ko)
KR (1) KR890700822A (ko)
AU (1) AU606679B2 (ko)
WO (1) WO1988007190A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230009641A (ko) * 2021-07-09 2023-01-17 한국전력공사 구조물의 균열 탐지 방법

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2088081A1 (en) * 1992-02-13 1993-08-14 Ralph Edward Frazee Jr. Out-of-pattern coating defect detection system
JP2985160B2 (ja) * 1995-03-01 1999-11-29 三菱電線工業株式会社 Ｏリング検査装置
US7317992B2 (en) 2004-06-16 2008-01-08 General Electric Company Method and apparatus for inspecting dovetail edgebreak contour

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5734403A (en) * 1980-08-09 1982-02-24 Hitachi Cable Ltd Inspecting device for shape and defect of linear object
US4532723A (en) * 1982-03-25 1985-08-06 General Electric Company Optical inspection system
DE3338802A1 (de) * 1983-10-26 1985-05-09 Feldmühle AG, 4000 Düsseldorf Vorrichtung und verfahren zum pruefen von materialbahnen
GB8424084D0 (en) * 1984-09-24 1984-10-31 Sira Ltd Inspection apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230009641A (ko) * 2021-07-09 2023-01-17 한국전력공사 구조물의 균열 탐지 방법

Also Published As

Publication number Publication date
AU606679B2 (en) 1991-02-14
JPH01502535A (ja) 1989-08-31
EP0304477A1 (en) 1989-03-01
AU1499188A (en) 1988-10-10
WO1988007190A1 (en) 1988-09-22

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Legal Events

Date Code Title Description
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid